Revue de Physique Appliquée

Vol. 22 No. 7 (juillet 1987)

• Etude de l'influence de l'épaisseur de la région n pour l'optimisation de la tenue en tension des structures p-n-n+     p. 473
  V. Boisson, M. Le Helley and J.P. Chante
  Abstract | PDF file (627.1 KB) | References



• Recent developments of the two-dimensional technological process simulator OSIRIS     p. 477
  N. Guillemot, G. Pananakakis and P. Chenevier
  Abstract | PDF file (986.2 KB) | References



• Etude expérimentale et modélisation d'un stockage thermique de longue durée en lit de cailloux enterré, couplé à des capteurs solaires à air     p. 487
  C. Dang Vu and B. Delcambre
  Abstract | PDF file (2.637 MB) | References



• Static response of miniature capacitive pressure sensors with square or rectangular silicon diaphragm     p. 505
  G. Blasquez, Y. Naciri, P. Blondel, N. Ben Moussa and P. Pons
  Abstract | PDF file (748.6 KB) | References



• Silicium polycristallin     p. 511
  Bernard Equer, Pierre Pinard, André Rocher and Michel Rodot
  PDF file (166.5 KB)



• Polycrystalline silicon     p. 513
  Bernard Equer, Pierre Pinard, André Rocher and Michel Rodot
  PDF file (136.9 KB)



• Czochralski growth of silicon bicrystals     p. 515
  J.J. Aubert and J.J. Bacmann
  Abstract | PDF file (760.9 KB) | References



• Etude de la solidification directionnelle en creuset du silicium en vue d'un usage solaire     p. 519
  G. Revel, J.-L. Pastol, D. Hania and Nguyen Dinh Huynh
  Abstract | PDF file (1.723 MB) | References



• The Polyx photovoltaic technology: progress and prospects     p. 529
  J. Fally, E. Fabre and B. Chabot
  Abstract | PDF file (817.4 KB)



• Le silicium polycristallin Polix : élaboration, propriétés et performances     p. 535
  G. Nouet, P. Lay and J.L. Chermant
  Abstract | PDF file (2.061 MB) | References



• Solidification of polycrystalline silicon ingots : simulation and characterization of the microstructure     p. 549
  P. Lay, G. Nouet, M. Coster, L. Chermant and J.L. Chermant
  Abstract | PDF file (1.012 MB) | References



• Le ruban de silicium E.P.R.: élaboration et mise au point d'un dispositif d'analyse des contraintes résiduelles     p. 557
  D. Chambonnet, R. Gauthier, R. M'Ghaieth and P. Pinard
  Abstract | PDF file (954.6 KB) | References



• Atomic structure of grain boundaries in semiconductors     p. 563
  A. Bourret and J.J. Bacmann
  Abstract | PDF file (1.051 MB) | References



• Deformation mechanisms of Σ = 9 bicrystals of silicon     p. 569
  M. El Kajbaji, J. Thibault-Desseaux, M. Martinez-Hernandez, A. Jacques and A. George
  Abstract | PDF file (1.644 MB) | References



• Electronic properties of grain boundaries in semiconductors     p. 579
  J.C. Bourgoin, A. Mauger and M. Lannoo
  Abstract | PDF file (870.0 KB) | References



• Les propriétés électriques de la macle Σ = 25 du silicium et leur évolution en fonction de traitements de recuit     p. 585
  A. Broniatowski
  Abstract | PDF file (936.0 KB) | References



• Origine structurale et chimique de l'activité électrique des joints de grains dans le silicium     p. 591
  A. Rocher
  Abstract | PDF file (1.071 MB) | References



• EBIC and conductance measurements in poly- and bicrystalline silicon     p. 597
  A. Bary, B. Mercey, G. Poullain, J.L. Chermant and G. Nouet
  Abstract | PDF file (953.7 KB) | References



• Texture analysis of silicon with an heterogeneous morphology used for the photovoltaic conversion by neutron diffraction     p. 603
  P. Andonov, P. Dervin and C. Esling
  Abstract | PDF file (1.427 MB) | References



• On the origin of the electrical activity in silicon grain boundaries     p. 613
  J.-L. Maurice
  Abstract | PDF file (1.821 MB) | References



• Impurity-induced microstructure of grain boundaries in cast silicon. Incidence on electrical properties     p. 623
  J.Y. Laval, J.L. Maurice and C. Cabanel
  Abstract | PDF file (1.178 MB) | References



• Recombination effects and impurity segregation at grain boundaries in polycrystalline silicon     p. 631
  S. Pizzini, A. Sandrinelli, M. Beghi, D. Narducci and P.L. Fabbri
  Abstract | PDF file (933.9 KB) | References



• Influence and passivation of extended crystallographic defects in polycrystalline silicon     p. 637
  S. Martinuzzi
  Abstract | PDF file (1.387 MB) | References



• Improvement of electron diffusion lengths in polycrystalline silicon wafers by aluminium     p. 645
  S. Martinuzzi, H. Poitevin, M. Zehaf and C. Zurletto
  Abstract | PDF file (728.4 KB) | References



• Hydrogen ion passivation of multicrystalline silicon solar cells     p. 649
  J.C. Muller, A. Barhdadi, Y. Ababou and P. Siffert
  Abstract | PDF file (937.8 KB) | References



• Impurity-defect interaction in polycrystalline silicon for photovoltaic applications. The role of hydrogen     p. 655
  A. Chari, P. de Mierry, A. Menikh and M. Aucouturier
  Abstract | PDF file (1.132 MB) | References



• Role of oxygen in surface segregation of metal impurities in silicon poly-and bicrystals     p. 663
  E. Amarray and J.P. Deville
  Abstract | PDF file (1.065 MB) | References



• Microstructure effect on the HNO3-HF etching of LPCVD boron-doped polycrystalline silicon     p. 671
  F. Mansour-Bahloul, D. Bielle-Daspet and A. Peyrelavigne
  Abstract | PDF file (993.7 KB) | References



• 3D-Modelling of polycrystalline silicon solar cells     p. 677
  J. Dugas and J. Oualid
  Abstract | PDF file (1.273 MB) | References



• Thin film solar cells using impure polycrystalline silicon     p. 687
  M. Rodot, M. Barbe, J.E. Bouree, V. Perraki, G. Revel, R. Kishore, J.L. Pastol, R. Mertens, M. Caymax and M. Eyckmans
  Abstract | PDF file (1.302 MB) | References



• Polyx multicrystalline silicon solar cells processed by PF+ 5 unanalysed ion implantation and rapid thermal annealing     p. 695
  W.O. Adekoya, Li Jin Chai, M. Ajaka, J.C. Muller and P. Siffert
  Abstract | PDF file (913.8 KB) | References



• Revue de livres     p. 705
  
  PDF file (262.8 KB)