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Comprehensive Analytical Chemistry, Non-Destructive Microanalysis of Cultural Heritage Materials 42 397 (2004)
https://doi.org/10.1016/S0166-526X(04)80013-8

Energy distributions of secondary ions sputtered from aluminium and magnesium by Ne+, Ar+ and O2+: a comprehensive study

A Tolstogouzov, S Daolio, C Pagura and C.L Greenwood
International Journal of Mass Spectrometry 214 (3) 327 (2002)
https://doi.org/10.1016/S1387-3806(02)00523-7

Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment

A. Delcorte and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 115 (1-4) 246 (1996)
https://doi.org/10.1016/0168-583X(95)01563-9

Reduction of secondary ion mass spectrometry matrix effect for high dose chromium and cobalt implanted silicon

Chunsheng. Tian, Gerhard. Stingeder and Henning. Bubert
Analytical Chemistry 65 (8) 1035 (1993)
https://doi.org/10.1021/ac00056a015

Influence of secondary ion energy distributions on SIMS matrix ion intensities and relative sensitivity factors in the system GaAs/GaAlAs

C-E Richter, M Trapp and M Gericke
Vacuum 40 (6) 499 (1990)
https://doi.org/10.1016/0042-207X(90)90004-I

Energy distributions and emission coefficients of secondary ions ejected from AIIIBV group semiconductors

A. G. Koval', B. M. Fizgeer and V. A. Litvinov
Soviet Physics Journal 33 (11) 973 (1990)
https://doi.org/10.1007/BF00895639

Bombardment-induced Gibbsian segregation and its role in secondary ion formation

Roger Kelly
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 14 (4-6) 421 (1986)
https://doi.org/10.1016/0168-583X(86)90137-0

Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

C.-E. Richter and M. Trapp
International Journal of Mass Spectrometry and Ion Physics 38 (1) 21 (1981)
https://doi.org/10.1016/0020-7381(81)80016-2

On the kinetic energies of sputtered excited particles, I. Atoms sputtered from Li, LiF, and NaCl

Steven Dzioba, Orlando Auciello and Roger Kelly
Radiation Effects 45 (3-4) 235 (1980)
https://doi.org/10.1080/00337578008208435

Détermination comparative du profil de concentration en oxygène dissous dans le zirconium après oxydation à 800°c par émission ionique secondaire et par la réaction nucléaire 16O(d, p)17O

C. Ducrocq, C. Roques-Carmes and G. Béranger
Journal of Nuclear Materials 95 (1-2) 201 (1980)
https://doi.org/10.1016/0022-3115(80)90095-1

A study of the energy spectra of secondary ions from metal matrices

M.A. Rudat and G.H. Morrison
International Journal of Mass Spectrometry and Ion Physics 30 (3-4) 197 (1979)
https://doi.org/10.1016/0020-7381(79)83001-6

Clustering distances critical to metal dimer formation in the secondary ion mass spectra (SIMS) of cesium chloride

Fumihiro Honda, Yasuo Fukuda and J. Wayne Rabalais
The Journal of Chemical Physics 70 (11) 4834 (1979)
https://doi.org/10.1063/1.437373

Discrimination effects in SIMS. Part III. Ion optical and energy discrimination

M.A. Rudat and G.H. Morrison
International Journal of Mass Spectrometry and Ion Physics 32 (1) 53 (1979)
https://doi.org/10.1016/0020-7381(79)80082-0

SIMS study of the mechanism of cluster formation during ion bombardment of alkali halides

Fumihiro Honda, Gerald M. Lancaster, Yasuo Fukuda and J. Wayne Rabalais
The Journal of Chemical Physics 69 (11) 4931 (1978)
https://doi.org/10.1063/1.436480

Secondary ion energy spectra of polycrystalline transition metals and aluminium

K.J. Snowdon and R.J. MacDonald
International Journal of Mass Spectrometry and Ion Physics 28 (3) 233 (1978)
https://doi.org/10.1016/0020-7381(78)80089-8

Effect of energy selection on quantitative analysis in secondary ion microanalysis

Ian M. Steele, Ian D. Hutcheon, Todd N. Solberg, Joseph V. Smith and Robert N. Clayton
International Journal of Mass Spectrometry and Ion Physics 23 (4) 293 (1977)
https://doi.org/10.1016/0020-7381(77)87005-8

Évolution des rendements de l'émission ionique des alliages avec la nature du soluté. Deuxième partie : interprétation

G. Blaise and G. Slodzian
Journal de Physique 35 (3) 243 (1974)
https://doi.org/10.1051/jphys:01974003503024300

Évolution des rendements de l'émission ionique des alliages avec la nature du soluté - Première partie : Résultats expérimentaux

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Journal de Physique 35 (3) 237 (1974)
https://doi.org/10.1051/jphys:01974003503023700

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M. Bernheim and G. Slodzian
Surface Science 40 (1) 169 (1973)
https://doi.org/10.1016/0039-6028(73)90060-5