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Article cité :
C. Tellier , A. Tosser
Rev. Phys. Appl. (Paris), 13 9 (1978) 441-447
Citations de cet article :
11 articles
Simple calculation of the Hall coefficient of thin metal films
A. J. Tosser, C. R. Pichard, M. Lahrichi and M. Bedda Journal of Materials Science Letters 4 (5) 585 (1985) https://doi.org/10.1007/BF00720039
Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient
C. R. Pichard, A. Khalid-Naciri and A. J. Tosser Journal of Materials Science Letters 3 (5) 455 (1984) https://doi.org/10.1007/BF00724391
Paramt̀res de conduction électrique dans des couches minces de NiP obtenues par dépôt chimique
C.R. Pichard, A.R. El Slassi, A.J. Tosser and F. Machizaud Thin Solid Films 112 (4) 289 (1984) https://doi.org/10.1016/0040-6090(84)90456-5
Expression of Hall coefficient of thin metal films in the presence of impurity effects
C. R. Pichard, C. R. Tellier and A. J. Tosser Journal of Materials Science Letters 1 (10) 423 (1982) https://doi.org/10.1007/BF00724860
Size Effects in Thin Films
C.R. TELLIER and A.J. TOSSER Size Effects in Thin Films 152 (1982) https://doi.org/10.1016/B978-0-444-42106-7.50006-1
General expression for the Hall coefficient of thin metal films
C. R. Pichard, A. J. Tosser and C. R. Tellier Journal of Materials Science Letters 1 (6) 260 (1982) https://doi.org/10.1007/BF00727851
Dependence of the resistivity and hall coefficient in thin metallic films on the thickness and the transverse magnetic field
C.R. Pichard, A.J. Tosser and C.R. Tellier Thin Solid Films 81 (2) 169 (1981) https://doi.org/10.1016/0040-6090(81)90304-7
Simple analytical expression for the hall coefficient of polycrystalline metal films at low magnetic field
C. R. Pichard, C. R. Tellier and A. J. Tosser Physica Status Solidi (a) 68 (2) K171 (1981) https://doi.org/10.1002/pssa.2210680256
About the origin of magnetoresistance in relatively thin metal films
C. R. Tellier, A. J. Tosser and C. R. Pichard Journal of Materials Science 16 (4) 1118 (1981) https://doi.org/10.1007/BF00542763
Thickness variations in extraordinary and spontaneous Hall coefficients of iron films
C.R. Pichard, C.R. Tellier, A.J. Tosser and C. Vautier Revue de Physique Appliquée 15 (8) 1303 (1980) https://doi.org/10.1051/rphysap:019800015080130300
Thermoelectric power of thin polycrystalline metal films in an effective mean free path model
C R Pichard, C R Tellier and A J Tosser Journal of Physics F: Metal Physics 10 (9) 2009 (1980) https://doi.org/10.1088/0305-4608/10/9/016