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Influence of the interfacial layer on the properties of the Au/ZnSe Schottky barrier

L. Tarricone

Rev. Phys. Appl. (Paris), 15 12 (1980) 1617-1623

DOI: https://doi.org/10.1051/rphysap:0198000150120161700

Citations de cet article :

Study of Au, Ni-(n)ZnSe Thin Film Schottky Barrier Junctions

Sumbit Chaliha, Mothura Nath Borah, P. C. Sarmah and A. Rahman
International Journal of Thermophysics 31 (10) 2030 (2010)
https://doi.org/10.1007/s10765-009-0555-9

Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy

A. Chahboun, R. Coratger, F. Ajustron, J. Beauvillain, I. M. Dharmadasa and A. P. Samantilleke
Journal of Applied Physics 87 (5) 2422 (2000)
https://doi.org/10.1063/1.372195

Schottky barrier formation at metal/n-ZnSe interfaces and characterization of Au/n-ZnSe by ballistic electron emission microscopy

R. Coratger, C. Girardin, J. Beauvillain, I. M. Dharmadasa, A. P. Samanthilake, J. E. F. Frost, K. A. Prior and B. C. Cavenett
Journal of Applied Physics 81 (12) 7870 (1997)
https://doi.org/10.1063/1.365395

Au/ZnSe contacts characterized by ballistic electron emission microscopy

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https://doi.org/10.1063/1.360996

Microscopic and macroscopic investigation of electrical contacts to n type and p type ZnSe

I. M. Dharmadasa, C. J. Blomfield, R. Coratger, et al.
Materials Science and Technology 12 (1) 86 (1996)
https://doi.org/10.1179/mst.1996.12.1.86

Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy

R. Coratger, F. Ajustron, J. Beauvillain, et al.
Physical Review B 51 (4) 2357 (1995)
https://doi.org/10.1103/PhysRevB.51.2357

Microscopic and macroscopic investigation of electrical contacts to n‐ZnSe

I. M. Dharmadasa, C. J. Blomfield, G. E. Gregory, et al.
Surface and Interface Analysis 21 (10) 718 (1994)
https://doi.org/10.1002/sia.740211007