Article cité par

La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).

Article cité :

Glancing‐incidence x‐ray analysis of thin‐layered materials: A review

D. K. G. de Boer, A. J. G. Leenaers and W. W. van den Hoogenhof
X-Ray Spectrometry 24 (3) 91 (1995)
https://doi.org/10.1002/xrs.1300240304

An investigation of X-ray reflectivity and diffraction from electroluminescent short-period Si-Ge superlattice structures

W M Plotz, E Koppensteiner, H Kibbel, H Presting, G Bauer and K Lischka
Semiconductor Science and Technology 10 (12) 1614 (1995)
https://doi.org/10.1088/0268-1242/10/12/009

Quartz crystal microbalance and synchrotron X-ray reflectivity study of water and liquid xenon adsorbed on gold and quartz

R.P. Chiarello, J. Krim and C. Thompson
Surface Science 306 (3) 359 (1994)
https://doi.org/10.1016/0039-6028(94)90077-9

Scanning tunneling microscopy characterization of the morphology of Fe/C multilayers grown on silicon substrates

L. Vázquez, J. M. Vara and E. Ziegler
Journal of Applied Physics 75 (1) 248 (1994)
https://doi.org/10.1063/1.355891

Physical characterization of ultrathin anodic silicon oxide films

K. B. Clark, J. A. Bardwell and J.-M. Baribeau
Journal of Applied Physics 76 (5) 3114 (1994)
https://doi.org/10.1063/1.357493

Surface scattering of x rays from InP (001) wafers

J. H. Li, S. F. Cui, M. Li, C. R. Li, Z. H. Mai, Y. T. Wang and Y. Zhuang
Applied Physics Letters 65 (26) 3317 (1994)
https://doi.org/10.1063/1.112446

Characterization of thin films and multilayers by specular X-ray reflectivity

W. M. Plotz and K. Lischka
Journal de Physique III 4 (9) 1503 (1994)
https://doi.org/10.1051/jp3:1994303

Interface formation between compatible polymers as determined by neutron reflectometry: PMMA and PVC

Klaus Kunz and Manfred Stamm
Macromolecular Symposia 78 (1) 105 (1994)
https://doi.org/10.1002/masy.19940780111

Influence of crystal structure on the magnetoresistance of Co/Cr multilayers

Y. Liou, J. C. A. Huang, Y. D. Yao, C. H. Lee, K. T. Wu, C. L. Lu, S. Y. Liao, Y. Y. Chen, N. T. Liang, W. T. Yang, C. Y. Chen and B. C. Hu
Journal of Applied Physics 76 (10) 6516 (1994)
https://doi.org/10.1063/1.358247

Oxidation of epitaxial Fe films monitored by x-ray reflectivity

A. Stierle, T. Mühge and H. Zabel
Journal of Materials Research 9 (4) 884 (1994)
https://doi.org/10.1557/JMR.1994.0884

Real-structure effects in the dynamical theory of grazing incidence x-ray diffraction

S. A. Stepanov and R. Köhler
Journal of Applied Physics 76 (12) 7809 (1994)
https://doi.org/10.1063/1.357913

Magnetic-induction profile in a type-I superconductor by polarized-neutron reflectometry

M. P. Nutley, A. T. Boothroyd, C. R. Staddon, D. MK. Paul and J. Penfold
Physical Review B 49 (22) 15789 (1994)
https://doi.org/10.1103/PhysRevB.49.15789

X-ray and neutron reflectivity analysis of thin films and superlattices

H. Zabel
Applied Physics A Solids and Surfaces 58 (3) 159 (1994)
https://doi.org/10.1007/BF00324371

The profile of layered materials reflected by glancing-incidence X-ray analysis

D. K. G. Boer, A. J. G. Leenaers and W. W. Hoogenhof
Applied Physics A Solids and Surfaces 58 (3) 169 (1994)
https://doi.org/10.1007/BF00324372

Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence

D.K.G. de Boer, A. J.G. Leenaers and W.W. van den Hoogenhof
Journal de Physique III 4 (9) 1559 (1994)
https://doi.org/10.1051/jp3:1994222

Growth and x-ray characterization of thin epitaxial Cr(110) films on Nb(110)

P. Sonntag, W. Donner, N. Metoki and H. Zabel
Physical Review B 49 (4) 2869 (1994)
https://doi.org/10.1103/PhysRevB.49.2869

X-ray reflectivity study of an oil-water interface in equilibrium with a middle-phase microemulsion

B. R. McClain, D. D. Lee, B. L. Carvalho, et al.
Physical Review Letters 72 (2) 246 (1994)
https://doi.org/10.1103/PhysRevLett.72.246

The molecular structure of autophobed monolayers and precursing films of a cationic surfactant on the silicon oxide/silicon surface

W.R. Birch, M.A. Knewtson, S. Garoff, R.M. Suter and S. Satija
Colloids and Surfaces A: Physicochemical and Engineering Aspects 89 (2-3) 145 (1994)
https://doi.org/10.1016/0927-7757(94)80114-2

Surface analysis of floatglass by means of x-ray absorption, reflection, and fluorescence analysis

Martin Hüppauff and Bruno Lengeler
Journal of Applied Physics 75 (2) 785 (1994)
https://doi.org/10.1063/1.356430

X-ray characterization of semiconductor surfaces and interfaces

W. Plotz, V. Holy, W. V. D. Hoogenhof and K. Lischka
Journal de Physique III 4 (9) 1565 (1994)
https://doi.org/10.1051/jp3:1994223

Near surface modification of silica structure induced by chemical/mechanical polishing

J. A. Trogolo and K. Rajan
Journal of Materials Science 29 (17) 4554 (1994)
https://doi.org/10.1007/BF00376278

X-ray reflectivity and diffuse-scattering study ofCoSi2layers in Si produced by ion-beam synthesis

D. Bahr, W. Press, R. Jebasinski and S. Mantl
Physical Review B 47 (8) 4385 (1993)
https://doi.org/10.1103/PhysRevB.47.4385

Surface roughness and the scattering of glancing-angle x rays: Application to x-ray lenses

J. C. Kimball and D. Bittel
Journal of Applied Physics 74 (2) 877 (1993)
https://doi.org/10.1063/1.354881

Density, thickness and interface roughness of SiO2, TiO2 and Ta2O5 films on BK-7 glasses analyzed by x-ray reflection

Martin Hüppauff, Klaus Bange and Bruno Lengeler
Thin Solid Films 230 (2) 191 (1993)
https://doi.org/10.1016/0040-6090(93)90514-P

Density of as-deposited and annealed thin silicon nitride films

J C Bruyere, C Savall, B Reynes, M Brunel and L Ortega
Journal of Physics D: Applied Physics 26 (4) 713 (1993)
https://doi.org/10.1088/0022-3727/26/4/029

Nuclear diffraction experiments with grazing incidence antireflection films

R. R�hlsberger, E. Gerdau, E. L�ken, H. D. R�ter, J. Metge and O. Leupold
Zeitschrift f�r Physik B Condensed Matter 92 (4) 489 (1993)
https://doi.org/10.1007/BF01320512

REX — a least-squares fitting program for the simulation and analysis of X-ray reflectivity data

T.A. Crabb, P.N. Gibson and K.J. Roberts
Computer Physics Communications 77 (3) 441 (1993)
https://doi.org/10.1016/0010-4655(93)90188-I

Polarised neutron reflection as a probe of in-plane magnetisation vector rotation in magnetic multilayers

S.J. Blundell and J.A.C. Bland
Journal of Magnetism and Magnetic Materials 121 (1-3) 185 (1993)
https://doi.org/10.1016/0304-8853(93)91181-6

Effect of mechanical polishing on the surface structure of glasses studied by grazing angle neutron reflectometry

M. Maaza, B. Farnoux, F. Samuel, C. Sella and P. Trocellier
Optics Communications 100 (1-4) 220 (1993)
https://doi.org/10.1016/0030-4018(93)90584-R

Diffuse polarised neutron reflection studies of ultrathin bcc Fe(001) epitaxial films

R.D. Bateson, G.W. Ford, J.A.C. Bland, H.J. Lauter, B. Heinrich and Z. Celinski
Journal of Magnetism and Magnetic Materials 121 (1-3) 189 (1993)
https://doi.org/10.1016/0304-8853(93)91182-7

High resolution x-ray characterization of Co films on Al2O3

A. Stierle, A. Abromeit, N. Metoki and H. Zabel
Journal of Applied Physics 73 (10) 4808 (1993)
https://doi.org/10.1063/1.353846

Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray Reflectivity

M. K Sanyal, S. K Sinha, A Gibaud, et al.
Europhysics Letters (EPL) 21 (6) 691 (1993)
https://doi.org/10.1209/0295-5075/21/6/010

Observation of nuclear diffraction from multilayers with a Fe/57Fe superstructure

R. Röhlsberger, E. Witthoff, E. Gerdau and E. Lüken
Journal of Applied Physics 74 (3) 1933 (1993)
https://doi.org/10.1063/1.354776

Effect of structural incoherence on the low-angle diffraction pattern of synthetic multilayer materials

Zengli Xu, Zizhou Tang, S. D. Kevan, Thomas Novet and David C. Johnson
Journal of Applied Physics 74 (2) 905 (1993)
https://doi.org/10.1063/1.354857

Annealing of silicon implanted by a high dose of cobalt ions investigated by in situ x-ray diffraction

M. Müller, D. Bahr, W. Press, R. Jebasinski and S. Mantl
Journal of Applied Physics 74 (3) 1590 (1993)
https://doi.org/10.1063/1.354832

Surface analysis by means of reflection, fluorescence and diffuse scattering of hard X-ray

B. Lengeler and M. H�ppauff
Fresenius' Journal of Analytical Chemistry 346 (1-3) 155 (1993)
https://doi.org/10.1007/BF00321403

Interfacial roughness of [001] twist grain boundaries characterized with x-ray reflection

M. R. Fitzsimmons and E. Burkel
Physical Review B 47 (14) 8436 (1993)
https://doi.org/10.1103/PhysRevB.47.8436

Surface X-Ray and Neutron Scattering

V. I. Mikerov, A. V. Vinogradov, I. V. Kozhevnikov, et al.
Springer Proceedings in Physics, Surface X-Ray and Neutron Scattering 61 227 (1992)
https://doi.org/10.1007/978-3-642-77144-6_44

Surface X-Ray and Neutron Scattering

A. Stierle, A. Abromeit, K. Bröhl, N. Metoki and H. Zabel
Springer Proceedings in Physics, Surface X-Ray and Neutron Scattering 61 233 (1992)
https://doi.org/10.1007/978-3-642-77144-6_45

Interface Roughness Determined by Diffuse Scattering and by Reflectivity of Hard X-Rays

B. Lengeler and M. Hüppauff
MRS Proceedings 280 245 (1992)
https://doi.org/10.1557/PROC-280-245

X-Ray Diffraction from Laterally Structured Surfaces: Total External Reflection and Grating Truncation Rods

M Tolan, G König, L Brügemann, W Press, F Brinkop and J. P Kotthaus
Europhysics Letters (EPL) 20 (3) 223 (1992)
https://doi.org/10.1209/0295-5075/20/3/006

Surface scattering of x rays in thin films. Part I. Theoretical treatment

J. Daillant and O. Bélorgey
The Journal of Chemical Physics 97 (8) 5824 (1992)
https://doi.org/10.1063/1.463741

Detection of Surface Response to Chemical/Mechanical Planarization of Silica Films

Jeffrey A. Trogolo and Krishna Rajan
MRS Proceedings 260 (1992)
https://doi.org/10.1557/PROC-260-869

X-ray diffraction and reflectivity characterization of SiGe superlattice structures

A R Powell, D K Bowen, M Wormington, R A Kubiak, E H C Parker, J Hudson and P D Augustus
Semiconductor Science and Technology 7 (5) 627 (1992)
https://doi.org/10.1088/0268-1242/7/5/001

SnO2 grazing-incidence antireflection films for monochromatization of synchrotron radiation: Design, preparation, and characterization

H. Homma, M. Kentjana, E. E. Alp, T. M. Mooney, E. Witthoff and T. Toellner
Journal of Applied Physics 72 (12) 5668 (1992)
https://doi.org/10.1063/1.351916

Macromolecules: Synthesis, Order and Advanced Properties

Manfred Stamm
Advances in Polymer Science, Macromolecules: Synthesis, Order and Advanced Properties 100/1 357 (1992)
https://doi.org/10.1007/BFb0051640

X-ray reflectivity analysis of giant-magnetoresistance spin-valve layered structures

T. C. Huang, J.-P. Nozieres, V. S. Speriosu, H. Lefakis and B. A. Gurney
Applied Physics Letters 60 (13) 1573 (1992)
https://doi.org/10.1063/1.107255

Total reflection of x-rays from vacuum-evaporated platinum mirrors in photon energy from 1.8–8 keV

S. Goto, T. Taguchi, S. Okamura, T. Hisatsugu and T. Kimura
Review of Scientific Instruments 63 (1) 1160 (1992)
https://doi.org/10.1063/1.1143122

Carbon/tungsten multilayers for X-ray-UV optics deposited by laser evaporation: Preparation and interface characterization

Ph. Macquart, F. Bridou and B. Pardo
Thin Solid Films 203 (1) 77 (1991)
https://doi.org/10.1016/0040-6090(91)90518-3

X-ray reflectivity measurements of the expansion of carbon films upon annealing

C. A. Lucas, T. D. Nguyen and J. B. Kortright
Applied Physics Letters 59 (17) 2100 (1991)
https://doi.org/10.1063/1.106093

Neutron and X-ray reflectivity measurements of polystyrene/polybromostyrene (PS/PBrS) interfaces

W. Zhao, X. Zhao, M.H. Rafailovich, J. Sokolov, T. Mansfield, R.S. Stein, R.C. Composto, E.J. Kramer, R.A.L. Jones, M. Sansone and M. Nelson
Physica B: Condensed Matter 173 (1-2) 43 (1991)
https://doi.org/10.1016/0921-4526(91)90033-B

Investigation of interfaces with grazing incidence neutron radiation

V.I. Mikerov, A.V. Vinogradov, I.V. Kozhevnikov, et al.
Physica B: Condensed Matter 174 (1-4) 174 (1991)
https://doi.org/10.1016/0921-4526(91)90601-A

Characterization of SiO2/Si heterostructures by soft x-ray reflection

S. C. Woronick, W. Ng, A. Król, Y. H. Kao and E. Arnold
Journal of Applied Physics 69 (3) 1631 (1991)
https://doi.org/10.1063/1.347260

Investigation of interfacial roughness of InxGa1−xAs epitaxial layers on GaAs and InP substrates by soft x-ray reflectivity

A. Krol, H. Resat, C. J. Sher, S. C. Woronick, W. Ng, Y. H. Kao, T. L. Cole, A. K. Green, C. K. Lowe-Ma, T.-W. Nee and Victor Rehn
Journal of Applied Physics 69 (2) 949 (1991)
https://doi.org/10.1063/1.347338

Polarized neutron reflection used to characterize cobalt/copper multilayers

W. Schwarzacher, W. Allison, J. Penfold, C. Shackleton, C. D. England, W. R. Bennett, J. R. Dutcher and C. M. Falco
Journal of Applied Physics 69 (7) 4040 (1991)
https://doi.org/10.1063/1.348413

Thermal Degradation of SiGe Interfaces Studied by X-Ray Reflectivity and Diffraction

J. M. Hudson, A. R. Powell, D. K. Bowen, M. Wormington, B. K. Tanner, R. A. Kubiak and E.H.C. Parker
MRS Proceedings 239 (1991)
https://doi.org/10.1557/PROC-239-455

Grazing Incidence X-Ray Reflectometry Studies of Cadmium Arachidate Langmuir-Blodgett Films

B. K. Tanner, D. K Bowen, M. C Petty, S. Swaminathan and F. Granfeld
MRS Proceedings 237 (1991)
https://doi.org/10.1557/PROC-237-281

Direct measurements of polymer depletion layers by neutron reflectivity

L. Lee, O. Guiselin, A. Lapp, B. Farnoux and J. Penfold
Physical Review Letters 67 (20) 2838 (1991)
https://doi.org/10.1103/PhysRevLett.67.2838

Total reflection X-ray fluorescence of single and multiple thin-layer samples

D.K.G. De Boer and W.W. Van Den Hoogenhof
Spectrochimica Acta Part B: Atomic Spectroscopy 46 (10) 1323 (1991)
https://doi.org/10.1016/0584-8547(91)80181-2