Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
Rev. Phys. Appl. (Paris), 15 3 (1980) 761-779
Article cité par
La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
Citations de cet article :
Operando Research in Heterogeneous Catalysis
Andreas Stierle, Johan Gustafson and Edvin LundgrenSpringer Series in Chemical Physics, Operando Research in Heterogeneous Catalysis 114 59 (2017)
https://doi.org/10.1007/978-3-319-44439-0_3
X-Ray Reflectometry of DMPS Monolayers on a Water Substrate
A. M. Tikhonov, V. E. Asadchikov, Yu. O. Volkov, B. S. Roshchin and Yu. A. ErmakovJournal of Experimental and Theoretical Physics 125 (6) 1051 (2017)
https://doi.org/10.1134/S1063776117120093
Ta2N3 nanocrystals grown in Al2O3 thin layers
Krešimir Salamon, Maja Buljan, Iva Šarić, Mladen Petravić and Sigrid BernstorffBeilstein Journal of Nanotechnology 8 2162 (2017)
https://doi.org/10.3762/bjnano.8.215
Memory Effect of Self‐Assembled PS‐b‐PEO Block Copolymer Films with Selectively Embedded Functionalized TiO2 Nanoparticles
Johannes Kirschner, Johannes Will, Tobias J. Rejek, et al.Advanced Materials Interfaces 4 (17) (2017)
https://doi.org/10.1002/admi.201700230
The Atomic Scale Electrochemical Lithiation and Delithiation Process of Silicon
Chuntian Cao, Hans‐Georg Steinrück, Badri Shyam and Michael F. ToneyAdvanced Materials Interfaces 4 (22) (2017)
https://doi.org/10.1002/admi.201700771
25 (2017)
https://doi.org/10.1117/12.2275605
Structural, optical and electrical properties of crystalline V2O5 films deposited by thermal evaporation and effects of temperature on UV–vis and Raman spectra
Ravish K. Jain and Atul KhannaOptik 144 271 (2017)
https://doi.org/10.1016/j.ijleo.2017.06.104
Probing nanostructured materials using X‐ray fluorescence analysis
Gangadhar Das, Ajay Khooha, A.K. Singh and M.K. TiwariX-Ray Spectrometry 46 (5) 448 (2017)
https://doi.org/10.1002/xrs.2777
Studies on structural and optical properties of pulsed laser deposited NiO thin films under varying deposition parameters
S.D. Singh, Arijeet Das, R.S. Ajimsha, M.N. Singh, Anuj Upadhyay, Rajiv Kamparath, C. Mukherjee, P. Misra, S.K. Rai, A.K. Sinha and Tapas GanguliMaterials Science in Semiconductor Processing 66 186 (2017)
https://doi.org/10.1016/j.mssp.2017.04.025
Anodization of Al(100), Al(111) and Al Alloy 6063 studied in situ with X-ray reflectivity and electrochemical impedance spectroscopy
Jonas Evertsson, Florian Bertram, Lisa Rullik, Gary Harlow and Edvin LundgrenJournal of Electroanalytical Chemistry 799 556 (2017)
https://doi.org/10.1016/j.jelechem.2017.07.010
Roughness replication in neutron supermirrors
Tamás Veres, Szilárd Sajti, László Cser, Szabolcs Bálint and László BottyánJournal of Applied Crystallography 50 (1) 184 (2017)
https://doi.org/10.1107/S1600576716019385
Determination of Interfacial Mixing in Tapered Block Polymer Thin Films: Experimental and Theoretical Investigations
Ming Luo, Jonathan R. Brown, Roddel A. Remy, et al.Macromolecules 49 (14) 5213 (2016)
https://doi.org/10.1021/acs.macromol.6b00946
1731 080001 (2016)
https://doi.org/10.1063/1.4947879
Room-temperature deposition of HfNx barrier by radical-assisted surface reaction for through-silicon-via in three-dimensional LSI
Masaru Sato, Mayumi B. Takeyama and Atsushi NoyaJapanese Journal of Applied Physics 55 (2S) 02BC21 (2016)
https://doi.org/10.7567/JJAP.55.02BC21
1731 080066 (2016)
https://doi.org/10.1063/1.4947944
Optical constants of off-stoichiometric aluminum oxide thin film in 6–20 nm soft-X-ray/extreme ultraviolet region
Mangalika Sinha, Saurabh Sharma, Amol Singh and Mohammed H. ModiJapanese Journal of Applied Physics 55 (10) 101101 (2016)
https://doi.org/10.7567/JJAP.55.101101
Optical constants of e-beam-deposited zirconium dioxide measured in the 55–150 Å wavelength region using the reflectivity technique
Amol Singh, Mangalika Sinha, R. K. Gupta and Mohammed H. ModiApplied Optics 55 (12) 3170 (2016)
https://doi.org/10.1364/AO.55.003170
Single orientation graphene synthesized on iridium thin films grown by molecular beam epitaxy
A. Dangwal Pandey, K. Krausert, D. Franz, et al.Journal of Applied Physics 120 (7) (2016)
https://doi.org/10.1063/1.4960804
Analysis of the applicability of the modified kinematic approximation to describe the off-specular neutron scattering from the surface of micro- and nanostructured objects
A. V. Belushkin, S. A. Manoshin and V. S. RikhvitskiyCrystallography Reports 61 (5) 760 (2016)
https://doi.org/10.1134/S1063774516050035
Atomic scattering factor of the ASTRO-H (Hitomi) SXT reflector around the gold’s L edges
Naomichi Kikuchi, Sho Kurashima, Manabu Ishida, Ryo Iizuka, Yoshitomo Maeda, Takayuki Hayashi, Takashi Okajima, Hironori Matsumoto, Ikuyuki Mitsuishi, Shigetaka Saji, Toshiki Sato, Sasagu Tachibana, Hideyuki Mori, Finn Christensen, Nicolai Brejnholt, Kiyofumi Nitta and Tomoya UrugaOptics Express 24 (22) 25548 (2016)
https://doi.org/10.1364/OE.24.025548
Intelligent Nanosystems for Energy, Information and Biological Technologies
Jitsuo Ohta, Kohei Ueno, Atsushi Kobayashi and Hiroshi FujiokaIntelligent Nanosystems for Energy, Information and Biological Technologies 249 (2016)
https://doi.org/10.1007/978-4-431-56429-4_13
Analysis of surface roughness correlation function by X‐ray reflectivity
Yoshikazu FujiiSurface and Interface Analysis 48 (11) 1136 (2016)
https://doi.org/10.1002/sia.6110
9905 99053Z (2016)
https://doi.org/10.1117/12.2232727
917 413 (2016)
https://doi.org/10.1007/978-3-319-24502-7_12
Quantitative Chemically Specific Coherent Diffractive Imaging of Reactions at Buried Interfaces with Few Nanometer Precision
Elisabeth R. Shanblatt, Christina L. Porter, Dennis F. Gardner, et al.Nano Letters 16 (9) 5444 (2016)
https://doi.org/10.1021/acs.nanolett.6b01864
Optical constants of e-beam evaporated titanium dioxide thin films in the 25.5- to 612-eV energy region
Antonela Comisso, Marco Nardello, Angelo Giglia and Piergiorgio NicolosiOptical Engineering 55 (9) 095102 (2016)
https://doi.org/10.1117/1.OE.55.9.095102
Nanostructural determination of a lipid bilayer tethered to a gold substrate
Marco Maccarini, Erik B. Watkins, Barry Stidder, Jean-Pierre Alcaraz, Bruce A. Cornell and Donald K. MartinThe European Physical Journal E 39 (12) (2016)
https://doi.org/10.1140/epje/i2016-16123-5
In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering
R. Coloma Ribera, R. W. E. van de Kruijs, J. M. Sturm, A. E. Yakshin and F. BijkerkJournal of Applied Physics 120 (6) (2016)
https://doi.org/10.1063/1.4960577
Influence of RF excitation during pulsed laser deposition in oxygen atmosphere on the structural properties and luminescence of nanocrystalline ZnO:Al thin films
Daniel Meljanac, Krunoslav Juraić, Milivoj Plodinec, et al.Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 34 (2) (2016)
https://doi.org/10.1116/1.4941197
In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity
Chuntian Cao, Hans-Georg Steinrück, Badri Shyam, Kevin H. Stone and Michael F. ToneyNano Letters 16 (12) 7394 (2016)
https://doi.org/10.1021/acs.nanolett.6b02926
Systematic determination of the thickness of a thin oxide layer on a multilayered structure by using an X-ray reflectivity analysis
Jisung Lee and Sungkyun ParkJournal of the Korean Physical Society 69 (5) 789 (2016)
https://doi.org/10.3938/jkps.69.789
Static magnetic proximity effect inPt/Ni1−xFexbilayers investigated by x-ray resonant magnetic reflectivity
C. Klewe, T. Kuschel, J.-M. Schmalhorst, F. Bertram, O. Kuschel, J. Wollschläger, J. Strempfer, M. Meinert and G. ReissPhysical Review B 93 (21) (2016)
https://doi.org/10.1103/PhysRevB.93.214440
Physical mechanisms responsible for the water‐induced degradation of PC61BM P3HT photovoltaic thin films
Andrew J. Parnell, Ashley J. Cadby, Alan D. F. Dunbar, et al.Journal of Polymer Science Part B: Polymer Physics 54 (2) 141 (2016)
https://doi.org/10.1002/polb.23902
Formation of He-Rich Layers Observed by Neutron Reflectometry in the He-Ion-Irradiated Cr/W Multilayers: Effects of Cr/W Interfaces on the He-Trapping Behavior
Feida Chen, Xiaobin Tang, Hai Huang, et al.ACS Applied Materials & Interfaces 8 (37) 24300 (2016)
https://doi.org/10.1021/acsami.6b07419
Reference Module in Materials Science and Materials Engineering
P.N. GibsonReference Module in Materials Science and Materials Engineering (2016)
https://doi.org/10.1016/B978-0-12-803581-8.03318-X
FromFe3O4/NiO bilayers toNiFe2O4-like thin films through Ni interdiffusion
O. Kuschel, R. Buß, W. Spiess, et al.Physical Review B 94 (9) (2016)
https://doi.org/10.1103/PhysRevB.94.094423
An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces
M. K. Tiwari and Gangadhar DasX-Ray Spectrometry 45 (4) 212 (2016)
https://doi.org/10.1002/xrs.2692
Scaling Behavior and Segment Concentration Profile of Densely Grafted Polymer Brushes Swollen in Vapor
Liang Sun, Bulent Akgun, Renfeng Hu, et al.Langmuir 32 (22) 5623 (2016)
https://doi.org/10.1021/acs.langmuir.6b00845
Ray-tracing simulations for the ultra-lightweight X-ray optics toward a future jupiter exploration mission
I. Mitsuishi, Y. Ezoe, T. Ogawa, et al.Advances in Space Research 57 (1) 320 (2016)
https://doi.org/10.1016/j.asr.2015.08.022
Crystallization of Tyrian purple (6,6′-dibromoindigo) thin films: The impact of substrate surface modifications
Magdalena Truger, Andrew O.F. Jones, Anna Maria Coclite, Stefan Pachmajer, Dominik Kriegner, Christian Röthel, Josef Simbrunner, Ingo Salzmann and Roland ReselJournal of Crystal Growth 447 73 (2016)
https://doi.org/10.1016/j.jcrysgro.2016.05.001
Reference Module in Materials Science and Materials Engineering
V. Lauter, H.J.C. Lauter, A. Glavic and B.P. TopervergReference Module in Materials Science and Materials Engineering (2016)
https://doi.org/10.1016/B978-0-12-803581-8.01324-2
Tuning Fullerene Intercalation in a Poly (thiophene) derivative by Controlling the Polymer Degree of Self-Organisation
G. M. Paternò, M. W. A. Skoda, Robert Dalgliesh, F. Cacialli and V. García SakaiScientific Reports 6 (1) (2016)
https://doi.org/10.1038/srep34609
Combined Coarse-Grained Molecular Dynamics and Neutron Reflectivity Characterization of Supported Lipid Membranes
Alexandros KoutsioubasThe Journal of Physical Chemistry B 120 (44) 11474 (2016)
https://doi.org/10.1021/acs.jpcb.6b05433
Molecular Dynamics Simulations and Neutron Reflectivity as an Effective Approach To Characterize Biological Membranes and Related Macromolecular Assemblies
L. Darré, J. Iglesias-Fernandez, A. Kohlmeyer, H. Wacklin and C. DomeneJournal of Chemical Theory and Computation 11 (10) 4875 (2015)
https://doi.org/10.1021/acs.jctc.5b00635
Effect of Divalent Cation Removal on the Structure of Gram-Negative Bacterial Outer Membrane Models
Luke A. Clifton, Maximilian W. A. Skoda, Anton P. Le Brun, et al.Langmuir 31 (1) 404 (2015)
https://doi.org/10.1021/la504407v
9510 95100Z (2015)
https://doi.org/10.1117/12.2178142
Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications
Amol Singh, Mohammed H. Modi, A.K. Sinha, Rajnish Dhawan and G.S. LodhaSurface and Coatings Technology 272 409 (2015)
https://doi.org/10.1016/j.surfcoat.2015.03.033
Analysis of Stacks Structure of Magnetic Multilayer Films by X-ray Reflectivity
Kazuhiro UEDAJournal of the Surface Finishing Society of Japan 66 (12) 642 (2015)
https://doi.org/10.4139/sfj.66.642
Optical and Structural Properties of Ultra‐thin Gold Films
Anna Kossoy, Virginia Merk, Denis Simakov, et al.Advanced Optical Materials 3 (1) 71 (2015)
https://doi.org/10.1002/adom.201400345
Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2
Gangadhar Das, S. R. Kane, Ajay Khooha, A. K. Singh and M. K. TiwariReview of Scientific Instruments 86 (5) (2015)
https://doi.org/10.1063/1.4919557
Chromium/scandium multilayer mirrors for isolated attosecond pulses at 145 eV
Alexander Guggenmos, Michael Jobst, Marcus Ossiander, et al.Optics Letters 40 (12) 2846 (2015)
https://doi.org/10.1364/OL.40.002846
Grazing-incidence small-angle X-ray scattering in a twofold rough-interface medium: a new theoretical approach using theq-eigenwave formalism
F. N. Chukhovskii and B. S. RoshchinActa Crystallographica Section A Foundations and Advances 71 (6) 612 (2015)
https://doi.org/10.1107/S2053273315016666
Structural reliability evaluation of low-k nanoporous dielectric interlayers integrated into microelectronic devices
Kyuyoung Heo, Brian J. Ree, Kyeung-Keun Choi and Moonhor ReeRSC Advances 5 (106) 87084 (2015)
https://doi.org/10.1039/C5RA16983F
Static Magnetic Proximity Effect inPt/NiFe2O4andPt/FeBilayers Investigated by X-Ray Resonant Magnetic Reflectivity
T. Kuschel, C. Klewe, J.-M. Schmalhorst, F. Bertram, O. Kuschel, T. Schemme, J. Wollschläger, S. Francoual, J. Strempfer, A. Gupta, M. Meinert, G. Götz, D. Meier and G. ReissPhysical Review Letters 115 (9) (2015)
https://doi.org/10.1103/PhysRevLett.115.097401
Reflection of X-rays from a rough surface at extremely small grazing angles
Mingwu Wen, Igor V. Kozhevnikov and Zhanshan WangOptics Express 23 (19) 24220 (2015)
https://doi.org/10.1364/OE.23.024220
48 339 (2015)
https://doi.org/10.1016/B978-0-12-802049-4.00006-3
Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers
V. A. Yuryev, K. V. Chizh, V. A. Chapnin, et al.Journal of Applied Physics 117 (20) (2015)
https://doi.org/10.1063/1.4921595
Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources
Charles Bourassin-Bouchet, Sébastien de Rossi and Franck DelmotteSpringer Series in Optical Sciences, Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources 197 151 (2015)
https://doi.org/10.1007/978-3-662-47443-3_8
Chemistry and Formation of the Beilby Layer During Polishing of Fused Silica Glass
Tayyab Suratwala, William Steele, Lana Wong, et al.Journal of the American Ceramic Society 98 (8) 2395 (2015)
https://doi.org/10.1111/jace.13659
Polymorphism of dioctyl-terthiophene within thin films: The role of the first monolayer
Christoph Lercher, Christian Röthel, Otello Maria Roscioni, et al.Chemical Physics Letters 630 12 (2015)
https://doi.org/10.1016/j.cplett.2015.04.027
Thermoresponsive PNIPAM Coatings on Nanostructured Gratings for Cell Alignment and Release
Mikhail Zhernenkov, Rana Ashkar, Hao Feng, et al.ACS Applied Materials & Interfaces 7 (22) 11857 (2015)
https://doi.org/10.1021/acsami.5b01453
Polarized neutron reflectivity from monolayers of self-assembled magnetic nanoparticles
D Mishra, O Petracic, A Devishvili, et al.Journal of Physics: Condensed Matter 27 (13) 136001 (2015)
https://doi.org/10.1088/0953-8984/27/13/136001
Study and characterization of W/Si and W/B4C multilayer for applications in hard X-rays mirror
Chang Kyu Kim, Young Sei Park, Sei Jin Han, Jang yool Chae and Byung-Ki NaKorean Journal of Chemical Engineering 32 (10) 2124 (2015)
https://doi.org/10.1007/s11814-015-0068-0
Tuning the morphology of ZnO nanostructure by in doping and the associated variation in electrical and optical properties
M.A. Awad, A.M. Ahmed, V.O. Khavrus and E.M.M. IbrahimCeramics International 41 (8) 10116 (2015)
https://doi.org/10.1016/j.ceramint.2015.04.108
Surfactin at the Water/Air Interface and in Solution
Javier Iglesias-Fernández, Leonardo Darré, Axel Kohlmeyer, et al.Langmuir 31 (40) 11097 (2015)
https://doi.org/10.1021/acs.langmuir.5b02305
Generic Role of Polymer Supports in the Fine Adjustment of Interfacial Interactions between Solid Substrates and Model Cell Membranes
Fernanda F. Rossetti, Emanuel Schneck, Giovanna Fragneto, Oleg V. Konovalov and Motomu TanakaLangmuir 31 (15) 4473 (2015)
https://doi.org/10.1021/la504253p
The thickness of native oxides on aluminum alloys and single crystals
J. Evertsson, F. Bertram, F. Zhang, et al.Applied Surface Science 349 826 (2015)
https://doi.org/10.1016/j.apsusc.2015.05.043
Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
Marlene Mühlbacher, Anton S. Bochkarev, Francisca Mendez-Martin, et al.Journal of Applied Physics 118 (8) (2015)
https://doi.org/10.1063/1.4929446
Characterization of the semi-insulating properties of AlHfO3.5 for power devices
B S Alandia, D R Huanca, V Christiano and S G dos Santos FilhoIOP Conference Series: Materials Science and Engineering 76 012008 (2015)
https://doi.org/10.1088/1757-899X/76/1/012008
Thickness dependence of the porosity of PPy/DDS films
Allan Hallik, Kaspar Roosalu, Hugo Mändar, et al.European Polymer Journal 70 118 (2015)
https://doi.org/10.1016/j.eurpolymj.2015.07.002
Epitaxial growth and its mechanism of GaN films on nitrided LiGaO2(001) substrates by pulsed laser deposition
Weijia Yang, Wenliang Wang, Zuolian Liu, et al.CrystEngComm 17 (5) 1073 (2015)
https://doi.org/10.1039/C4CE01785D
Influence of structural disorder on soft x-ray optical behavior of NbC thin films
Amol Singh, Mohammed H. Modi, Parasmani Rajput, A. K. Sinha and G. S. LodhaJournal of Applied Physics 117 (17) (2015)
https://doi.org/10.1063/1.4919427
Thermal Stability and Molecular Ordering of Organic Semiconductor Monolayers: Effect of an Anchor Group
Andrew O. F. Jones, Philipp Knauer, Roland Resel, et al.ChemPhysChem 16 (8) 1712 (2015)
https://doi.org/10.1002/cphc.201500098
Molecular Interdiffusion between Stacked Layers by Solution and Thermal Annealing Processes in Organic Light Emitting Devices
Satoru Ohisa, Yong-Jin Pu, Norifumi L. Yamada, Go Matsuba and Junji KidoACS Applied Materials & Interfaces 7 (37) 20779 (2015)
https://doi.org/10.1021/acsami.5b05818
Measurement of molecular mixing at a conjugated polymer interface by specular and off-specular neutron scattering
David James, Anthony M. Higgins, Paul Rees, Mark Geoghegan, M. Rowan Brown, Shion-Seng Chang, Dyfrig Môn, Robert Cubitt, Robert Dalgliesh and Philipp GutfreundSoft Matter 11 (48) 9393 (2015)
https://doi.org/10.1039/C5SM02008E
Effect of oxygen ion beam bombardment on depth resolved hydrogen distribution in stoichiometric alumina thin films, deposited by e-beam evaporation
Arijeet Das, Chandrachur Mukherjee, Rajiv Kamparath, et al.Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 33 (5) (2015)
https://doi.org/10.1116/1.4929418
Adsorption of cationic polyacrylamide at the cellulose–liquid interface: A neutron reflectometry study
Jielong Su, Christopher J. Garvey, Stephen Holt, Rico F. Tabor, Bjorn Winther-Jensen, Warren Batchelor and Gil GarnierJournal of Colloid and Interface Science 448 88 (2015)
https://doi.org/10.1016/j.jcis.2015.02.008
Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity
Maheswar Nayak, P. C. Pradhan and G. S. LodhaJournal of Applied Crystallography 48 (3) 786 (2015)
https://doi.org/10.1107/S1600576715005877
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity
M Zwiebler, J E Hamann-Borrero, M Vafaee, et al.New Journal of Physics 17 (8) 083046 (2015)
https://doi.org/10.1088/1367-2630/17/8/083046
Method to control deposition rate instabilities—High power impulse magnetron sputtering deposition of TiO2
Anna Kossoy, Rögnvaldur L. Magnusson, Tryggvi K. Tryggvason, Kristjan Leosson and Sveinn OlafssonJournal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 33 (2) (2015)
https://doi.org/10.1116/1.4905737
Optical properties of zirconium carbide in 60–200 Å wavelength region using x-ray reflectivity technique
Amol Singh, Mohammed H. Modi and G. S. LodhaApplied Optics 54 (2) 253 (2015)
https://doi.org/10.1364/AO.54.000253
X-Ray Diffraction
Bridget MurphyX-Ray Diffraction 229 (2015)
https://doi.org/10.1201/b15674-10
Effect of increasing disorder on superconductivity of Mo/Nb superlattices
Juan Pereiro, Thomas Saerbeck and Ivan K SchullerSuperconductor Science and Technology 28 (8) 085001 (2015)
https://doi.org/10.1088/0953-2048/28/8/085001
1 (2014)
https://doi.org/10.1109/ICTON.2014.6876716
1 (2014)
https://doi.org/10.1109/SBMicro.2014.6940119
Improvement of X-ray reflectivity calculation on surface and interface roughness
Yoshikazu FujiiJapanese Journal of Applied Physics 53 (5S1) 05FH06 (2014)
https://doi.org/10.7567/JJAP.53.05FH06
Achieve 2-inch-diameter homogeneous GaN films on sapphire substrates by pulsed laser deposition
Wenliang Wang, Weijia Yang, Zuolian Liu, et al.Journal of Materials Science 49 (9) 3511 (2014)
https://doi.org/10.1007/s10853-014-8064-z
Investigation on the structural properties of GaN films grown on La0.3Sr1.7AlTaO6substrates
Wenliang Wang, Shizhong Zhou, Zuolian Liu, Weijia Yang, Yunhao Lin, Huirong Qian, Fangliang Gao and Guoqiang LiMaterials Research Express 1 (2) 025903 (2014)
https://doi.org/10.1088/2053-1591/1/2/025903
Improvement in crystallinity and electrical properties of TiN thin films deposited on ZnO underlayers
Kazuhiro Kato and Masaaki YonekuraJapanese Journal of Applied Physics 53 (7) 075501 (2014)
https://doi.org/10.7567/JJAP.53.075501
A facile method for the density determination of ceramic thin films using X-ray reflectivity
Sjoerd A. Veldhuis, Peter Brinks, Tomasz M. Stawski, Ole F. Göbel and Johan E. ten ElshofJournal of Sol-Gel Science and Technology (2014)
https://doi.org/10.1007/s10971-014-3336-2
Precise Evaluation of Angstrom‐Ordered Mixed Interfaces in Solution‐Processed OLEDs by Neutron Reflectometry
Satoru Ohisa, Go Matsuba, Norifumi L. Yamada, et al.Advanced Materials Interfaces 1 (9) (2014)
https://doi.org/10.1002/admi.201400097
Improvement of surface and interface roughness estimation on X-ray reflectivity
Y. FujiiPowder Diffraction 29 (3) 265 (2014)
https://doi.org/10.1017/S0885715614000359
Electrochemical Atomic Layer Deposition of CdS on Ag Single Crystals: Effects of Substrate Orientation on Film Structure
Francesco Carlà, Francesca Loglio, Andrea Resta, et al.The Journal of Physical Chemistry C 118 (12) 6132 (2014)
https://doi.org/10.1021/jp405637g
In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy
F. Bertram, F. Zhang, J. Evertsson, F. Carlà, J. Pan, M. E. Messing, A. Mikkelsen, J.-O. Nilsson and E. LundgrenJournal of Applied Physics 116 (3) (2014)
https://doi.org/10.1063/1.4890318
Theoretical Concepts of X-Ray Nanoscale Analysis
Andrei Benediktovitch, Ilya Feranchuk and Alexander UlyanenkovSpringer Series in Materials Science, Theoretical Concepts of X-Ray Nanoscale Analysis 183 71 (2014)
https://doi.org/10.1007/978-3-642-38177-5_3
Anticorrosive ultrathin film derived from bio-based urushiol–Ti by layer-by-layer self-assembly
Xuelin Zheng, Jiabao Weng, Shuiyan Li, Haiqing Liu, Binghuan Hu, Yihui Li, Xuefei Meng and Huirong RuanChemical Engineering Journal 245 265 (2014)
https://doi.org/10.1016/j.cej.2014.02.039
AlGaN/GaN heterostructure prepared on a Si (110) substrate via pulsed sputtering
T. Watanabe, J. Ohta, T. Kondo, et al.Applied Physics Letters 104 (18) (2014)
https://doi.org/10.1063/1.4876449
Neutron Reflectometry Studies of Aluminum - Saline Water Interface Under Hydrostatic Pressure
A. Junghans, R. Chellappa, P. Wang, et al.Corrosion Science (2014)
https://doi.org/10.1016/j.corsci.2014.10.001
Surface and interface roughness estimations by X‐ray reflectivity and RBS measurements
Y. Fujii, K. Nakajima, M. Suzuki and K. KimuraSurface and Interface Analysis 46 (12-13) 1208 (2014)
https://doi.org/10.1002/sia.5644
Ion polished Cr/Sc attosecond multilayer mirrors for high water window reflectivity
Alexander Guggenmos, Stefan Radünz, Roman Rauhut, Michael Hofstetter, Sriram Venkatesan, Angela Wochnik, Eric M. Gullikson, Stefan Fischer, Bert Nickel, Christina Scheu and Ulf KleinebergOptics Express 22 (22) 26526 (2014)
https://doi.org/10.1364/OE.22.026526