Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
Rev. Phys. Appl. (Paris), 15 3 (1980) 761-779
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Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods
Vivek M. Prabhu, Shuhui Kang, David L. VanderHart, Sushil K. Satija, Eric K. Lin and Wen‐li WuAdvanced Materials 23 (3) 388 (2011)
https://doi.org/10.1002/adma.201001762
On the theory of X-ray coherent reflection from a rough surface
S. V. Salikhov, F. N. Chukhovskii and A. M. PolyakovJournal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 5 (5) 887 (2011)
https://doi.org/10.1134/S102745101109014X
Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity
Maheswar Nayak and Gyanendra S. LodhaJournal of Atomic, Molecular, and Optical Physics 2011 1 (2011)
https://doi.org/10.1155/2011/649153
Microstructure and Phase Behavior of a Quinquethiophene-Based Self-Assembled Monolayer as a Function of Temperature
Heinz-Georg Flesch, Simon G. J. Mathijssen, Fatemeh Gholamrezaie, et al.The Journal of Physical Chemistry C 115 (46) 22925 (2011)
https://doi.org/10.1021/jp206033x