Article cité par

La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).

Article cité :

Nitridation effect of the α-Al2O3 substrates on the quality of the GaN films grown by pulsed laser deposition

Wenliang Wang, Zuolian Liu, Weijia Yang, Yunhao Lin, Shizhong Zhou, Huirong Qian, Haiyan Wang, Zhiting Lin and Guoqiang Li
RSC Adv. 4 (75) 39651 (2014)
https://doi.org/10.1039/C4RA06070A

Epitaxial growth of high-quality AlN films on metallic nickel substrates by pulsed laser deposition

Wenliang Wang, Weijia Yang, Zuolian Liu, Yunhao Lin, Shizhong Zhou, Huirong Qian, Haiyan Wang, Zhiting Lin and Guoqiang Li
RSC Adv. 4 (52) 27399 (2014)
https://doi.org/10.1039/c4ra03581j

Depth-Dependent Structural Changes in PS-b-P2VP Thin Films Induced by Annealing

Jan Wernecke, Hiroshi Okuda, Hiroki Ogawa, Frank Siewert and Michael Krumrey
Macromolecules 47 (16) 5719 (2014)
https://doi.org/10.1021/ma500642d

Investigation on the structural properties of GaN films grown on La0.3Sr1.7AlTaO6substrates

Wenliang Wang, Shizhong Zhou, Zuolian Liu, Weijia Yang, Yunhao Lin, Huirong Qian, Fangliang Gao and Guoqiang Li
Materials Research Express 1 (2) 025903 (2014)
https://doi.org/10.1088/2053-1591/1/2/025903

Dissolution Testing of Hardly Soluble Materials by Surface Sensitive Techniques: Clotrimazole from an Insoluble Matrix

Heike M. A. Ehmann, Sascha Winter, Thomas Griesser, Roman Keimel, Simone Schrank, Andreas Zimmer and Oliver Werzer
Pharmaceutical Research 31 (10) 2708 (2014)
https://doi.org/10.1007/s11095-014-1368-5

Self-assembly of novel lipid-mimicking brush polymers in nanoscale thin films

Jungwoon Jung, Heesoo Kim and Moonhor Ree
Soft Matter 10 (5) 701 (2014)
https://doi.org/10.1039/c3sm52263f

Phase segregation of sulfonate groups in Nafion interface lamellae, quantified via neutron reflectometry fitting techniques for multi-layered structures

Steven C. DeCaluwe, Paul A. Kienzle, Pavan Bhargava, Andrew M. Baker and Joseph A. Dura
Soft Matter 10 (31) 5763 (2014)
https://doi.org/10.1039/C4SM00850B

Epitaxial growth of high-quality AlN films on metallic nickel substrates by pulsed laser deposition

Wenliang Wang, Weijia Yang, Zuolian Liu, et al.
RSC Adv. 4 (52) 27399 (2014)
https://doi.org/10.1039/C4RA03581J

Surface and interface roughness estimations by X‐ray reflectivity and RBS measurements

Y. Fujii, K. Nakajima, M. Suzuki and K. Kimura
Surface and Interface Analysis 46 (12-13) 1208 (2014)
https://doi.org/10.1002/sia.5644

Electrochemical Atomic Layer Deposition of CdS on Ag Single Crystals: Effects of Substrate Orientation on Film Structure

Francesco Carlà, Francesca Loglio, Andrea Resta, et al.
The Journal of Physical Chemistry C 118 (12) 6132 (2014)
https://doi.org/10.1021/jp405637g

Achieve 2-inch-diameter homogeneous GaN films on sapphire substrates by pulsed laser deposition

Wenliang Wang, Weijia Yang, Zuolian Liu, et al.
Journal of Materials Science 49 (9) 3511 (2014)
https://doi.org/10.1007/s10853-014-8064-z

Morphology and structure evolution of tin-doped indium oxide thin films deposited by radio-frequency magnetron sputtering: The role of the sputtering atmosphere

Man Nie, Tayfun Mete and Klaus Ellmer
Journal of Applied Physics 115 (15) (2014)
https://doi.org/10.1063/1.4871810

Theoretical Concepts of X-Ray Nanoscale Analysis

Andrei Benediktovitch, Ilya Feranchuk and Alexander Ulyanenkov
Springer Series in Materials Science, Theoretical Concepts of X-Ray Nanoscale Analysis 183 71 (2014)
https://doi.org/10.1007/978-3-642-38177-5_3

Structural stability of hydrogenated amorphous carbon overcoats used in heat-assisted magnetic recording investigated by rapid thermal annealing

N. Wang, K. Komvopoulos, F. Rose and B. Marchon
Journal of Applied Physics 113 (8) (2013)
https://doi.org/10.1063/1.4792521

Study on effective cleaning of gold layer from fused silica mirrors using nanosecond-pulsed Nd:YAG laser

Ambar Choubey, Amol Singh, M. H. Modi, et al.
Applied Optics 52 (31) 7540 (2013)
https://doi.org/10.1364/AO.52.007540

High-peak-power surface high-harmonic generation at extreme ultra-violet wavelengths from a tape

B. H. Shaw, J. van Tilborg, T. Sokollik, C. B. Schroeder, W. R. McKinney, N. A. Artemiev, V. V. Yashchuk, E. M. Gullikson and W. P. Leemans
Journal of Applied Physics 114 (4) (2013)
https://doi.org/10.1063/1.4816574

Development of in situ studies of spin coated polymer films

Daniel T. W. Toolan and Jonathan R. Howse
J. Mater. Chem. C 1 (4) 603 (2013)
https://doi.org/10.1039/C2TC00026A

Dynamics of Monolayer–Island Transitions in 2,7‐Dioctyl‐benzothienobenzthiophene Thin Films

Michael Dohr, Oliver Werzer, Quan Shen, et al.
ChemPhysChem 14 (11) 2554 (2013)
https://doi.org/10.1002/cphc.201300227

Depth profile investigation of the incorporated iron atoms during Kr+ ion beam sputtering on Si (001)

B. Khanbabaee, B. Arezki, A. Biermanns, et al.
Thin Solid Films 527 349 (2013)
https://doi.org/10.1016/j.tsf.2012.12.055

Approach to combine structural with chemical composition profiles using resonant X-ray scattering

Maheswar Nayak and Gyanendra S. Lodha
Journal of Applied Crystallography 46 (6) 1569 (2013)
https://doi.org/10.1107/S0021889813022905

Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction

B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer and U. Pietsch
Journal of Applied Crystallography 46 (2) 505 (2013)
https://doi.org/10.1107/S0021889813004597

Homogeneous epitaxial growth of AlN single-crystalline films on 2 inch-diameter Si (111) substrates by pulsed laser deposition

Hui Yang, Wenliang Wang, Zuolian Liu and Guoqiang Li
CrystEngComm 15 (36) 7171 (2013)
https://doi.org/10.1039/c3ce40886h

Cleaning of carbon layer from the gold films using a pulsed Nd:YAG laser

Amol Singh, Ambar Choubey, Mohammed H. Modi, B.N. Upadhyaya, S.M. Oak, G.S. Lodha and S.K. Deb
Applied Surface Science 283 612 (2013)
https://doi.org/10.1016/j.apsusc.2013.06.157

Interference effects in the UV(VUV)-excited luminescence spectroscopy of thin dielectric films

Evgeny Buntov and Anatoly Zatsepin
Journal of Synchrotron Radiation 20 (3) 509 (2013)
https://doi.org/10.1107/S0909049513002835

In situ X-ray reflectivity of indium supplied on GaN templates by metal organic vapor phase epitaxy

Guangxu Ju, Shingo Fuchi, Masao Tabuchi and Yoshikazu Takeda
Journal of Applied Physics 114 (12) (2013)
https://doi.org/10.1063/1.4823809

Study on effective laser cleaning method to remove carbon layer from a gold surface

Amol Singh, A K Choubey, Mohammed H Modi, B N Upadhyaya and G S Lodha
Journal of Physics: Conference Series 425 (15) 152020 (2013)
https://doi.org/10.1088/1742-6596/425/15/152020

Photophysics and morphology of a polyfluorene donor–acceptor triblock copolymer for solar cells

Chao Yan, Ashley J. Cadby, Andrew J. Parnell, et al.
Journal of Polymer Science Part B: Polymer Physics 51 (23) 1705 (2013)
https://doi.org/10.1002/polb.23386

Model approach to solving the inverse problem of X-ray reflectometry and its application to the study of the internal structure of hafnium oxide films

Yu. O. Volkov, I. V. Kozhevnikov, B. S. Roshchin, E. O. Filatova and V. E. Asadchikov
Crystallography Reports 58 (1) 160 (2013)
https://doi.org/10.1134/S1063774513010148

Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity

Maheswar Nayak and G. S. Lodha
Journal of Applied Physics 114 (2) (2013)
https://doi.org/10.1063/1.4812245

Aperiodic CrSc multilayer mirrors for attosecond water window pulses

Alexander Guggenmos, Roman Rauhut, Michael Hofstetter, Samira Hertrich, Bert Nickel, Jürgen Schmidt, Eric M. Gullikson, Markus Seibald, Wolfgang Schnick and Ulf Kleineberg
Optics Express 21 (19) 21728 (2013)
https://doi.org/10.1364/OE.21.021728

In situ X-ray Reflectivity Measurements on Annealed InxGa1-xN Epilayer Grown by Metalorganic Vapor Phase Epitaxy

Guangxu Ju, Shingo Fuchi, Masao Tabuchi and Yoshikazu Takeda
Japanese Journal of Applied Physics 52 (8S) 08JB12 (2013)
https://doi.org/10.7567/JJAP.52.08JB12

Development of in situ studies of spin coated polymer films

Daniel T. W. Toolan and Jonathan R. Howse
J. Mater. Chem. C 1 (4) 603 (2013)
https://doi.org/10.1039/c2tc00026a

Measurement of the effect of lattice strain on magnetic interactions and orbital splitting in CaCuO2using resonant inelastic x-ray scattering

M. Minola, L. Hozoi, D. Di Castro, R. Felici, M. Moretti Sala, A. Tebano, G. Balestrino, G. Ghiringhelli, Jeroen van den Brink and L. Braicovich
Physical Review B 87 (8) (2013)
https://doi.org/10.1103/PhysRevB.87.085124

Stability and normal incidence reflectivity of W/B4C multilayer mirror near the boron K absorption edge

P. N. Rao, S. K. Rai, M. Nayak and G. S. Lodha
Applied Optics 52 (25) 6126 (2013)
https://doi.org/10.1364/AO.52.006126

Altered magnetism and new electronic length scales in magneto-electric La2/3Sr1/3MnO3–BiFeO3heterointerface

S K Mishra, D Mazumdar, K Tarafdar, et al.
New Journal of Physics 15 (11) 113042 (2013)
https://doi.org/10.1088/1367-2630/15/11/113042

Achieve high-quality GaN films on La0.3Sr1.7AlTaO6 (LSAT) substrates by low-temperature molecular beam epitaxy

Wenliang Wang, Hui Yang and Guoqiang Li
CrystEngComm 15 (14) 2669 (2013)
https://doi.org/10.1039/c3ce27090d

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Yoshikazu Fujii
Journal of Materials 2013 1 (2013)
https://doi.org/10.1155/2013/678361

Model-Independent X-ray Reflectivity Fitting for Structure Analysis of Poly(3-hexylthiophene) Films

O. Werzer and R. Resel
Macromolecules 46 (9) 3529 (2013)
https://doi.org/10.1021/ma400147g

Magnetic properties of double exchange biased diluted magnetic alloy/ferromagnet/antiferromagnet trilayers

Carla Cirillo, Antoni García-Santiago, Joan Manel Hernandez, Carmine Attanasio and Javier Tejada
Journal of Physics: Condensed Matter 25 (17) 176001 (2013)
https://doi.org/10.1088/0953-8984/25/17/176001

Problems in measurements of parameters of elements and structures in modern micro- and nanoelectronics considering TiN/Ti diffusion barrier structures as an example

D. I. Smirnov, R. M. Giniyatyllin, I. Yu. Zyul’kov, N. A. Medetov and N. N. Gerasimenko
Technical Physics Letters 39 (7) 640 (2013)
https://doi.org/10.1134/S1063785013070249

Grazing incidence X-ray diffraction for the study of polycrystalline layers

David Simeone, Gianguido Baldinozzi, Dominique Gosset, Sophie Le Caer and Jean-François Bérar
Thin Solid Films 530 9 (2013)
https://doi.org/10.1016/j.tsf.2012.07.068

Determining surface coverage of ultra-thin gold films from X-ray reflectivity measurements

A. Kossoy, D. Simakov, S. Olafsson and K. Leosson
Thin Solid Films 536 50 (2013)
https://doi.org/10.1016/j.tsf.2013.03.057

Epitaxial growth of 2 inch diameter homogeneous AlN single-crystalline films by pulsed laser deposition

Hui Yang, Wenliang Wang, Zuolian Liu and Guoqiang Li
Journal of Physics D: Applied Physics 46 (10) 105101 (2013)
https://doi.org/10.1088/0022-3727/46/10/105101

Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

Hiroki Ogawa, Hiroyasu Masunaga, Sono Sasaki, Shunji Goto, Takashi Tanaka, Takamitsu Seike, Sunao Takahashi, Kunikazu Takeshita, Nobuteru Nariyama, Haruhiko Ohashi, Toru Ohata, Yukito Furukawa, Tomohiro Matsushita, Yasuhide Ishizawa, Naoto Yagi, Masaki Takata, Hideo Kitamura, Atsushi Takahara, Kazuo Sakurai, Kohji Tashiro, Toshiji Kanaya, Yoshiyuki Amemiya, Kazuyuki Horie, Mikihito Takenaka, Hiroshi Jinnai, et al.
Polymer Journal 45 (1) 109 (2013)
https://doi.org/10.1038/pj.2012.194

Structure and morphology of magnetron sputtered W films studied by x-ray methods

K Salamon, O Milat, N Radić, P Dubček, M Jerčinović and S Bernstorff
Journal of Physics D: Applied Physics 46 (9) 095304 (2013)
https://doi.org/10.1088/0022-3727/46/9/095304

X‐Ray Reflectometry Characterization of Plasma Polymer Films Synthesized from Triallylamine: Density and Swelling in Water

Mauricio Schieda, Fethi Salah, Stéphanie Roualdès, et al.
Plasma Processes and Polymers 10 (6) 517 (2013)
https://doi.org/10.1002/ppap.201200126

Tuning the density profile of surface-grafted hyaluronan and the effect of counter-ions

Ida Berts, Giovanna Fragneto, Jöns Hilborn and Adrian R. Rennie
The European Physical Journal E 36 (7) (2013)
https://doi.org/10.1140/epje/i2013-13070-7

High‐k Gate Dielectrics for CMOS Technology

Elena O. Filatova, Andrey A. Sokolov and Igor V. Kozhevnikov
High‐k Gate Dielectrics for CMOS Technology 225 (2012)
https://doi.org/10.1002/9783527646340.ch7

Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer

Mohammed H. Modi, R. K. Gupta, Amol Singh and G. S. Lodha
Applied Optics 51 (16) 3552 (2012)
https://doi.org/10.1364/AO.51.003552

Adsorption of non-ionic surfactants to the sapphire/solution interface – Effects of temperature and pH

Ningning Li, Robert K. Thomas and Adrian R. Rennie
Journal of Colloid and Interface Science 369 (1) 287 (2012)
https://doi.org/10.1016/j.jcis.2011.12.002

Design and fabrication of SiO2/Si3N4 dielectric distributed Bragg reflectors for ultraviolet optoelectronic applications

Li Zhi-Cheng, Liu Bin, Zhang Rong, et al.
Acta Physica Sinica 61 (8) 087802 (2012)
https://doi.org/10.7498/aps.61.087802

Structural and superconducting properties of ion beam sputtered Nb thin films and Nb/Cu bilayers

S.K. Nath, R. Dhawan, S. Rai, G.S. Lodha and K.J.S. Sokhey
Physica C: Superconductivity 472 (1) 21 (2012)
https://doi.org/10.1016/j.physc.2011.09.016

Symmetric magnetization reversal in polycrystalline exchange coupled systems via simultaneous processes of coherent rotation and domain nucleation

Amitesh Paul, C. Schmidt, N. Paul, A. Ehresmann, Stefan Mattauch and Peter Böni
Physical Review B 86 (9) (2012)
https://doi.org/10.1103/PhysRevB.86.094420

X-ray resonant magnetic reflectivity of stratified magnetic structures: Eigenwave formalism and application to a W/Fe/W trilayer

M. Elzo, E. Jal, O. Bunau, S. Grenier, Y. Joly, A.Y. Ramos, H.C.N. Tolentino, J.M. Tonnerre and N. Jaouen
Journal of Magnetism and Magnetic Materials 324 (2) 105 (2012)
https://doi.org/10.1016/j.jmmm.2011.07.019

Mimicking the receptor-aided binding of HIV-1 TAT protein transduction domains to phospholipid monolayers at the air–water interface

Daehyun Hong, Kwanwoo Shin, Michael James and Giyoong Tae
Soft Matter 8 (33) 8616 (2012)
https://doi.org/10.1039/c2sm25885d

NbC/Si multilayer mirror for next generation EUV light sources

Mohammed H. Modi, S. K. Rai, Mourad Idir, F. Schaefers and G. S. Lodha
Optics Express 20 (14) 15114 (2012)
https://doi.org/10.1364/OE.20.015114

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks

Elena O Filatova, Igor V Kozhevnikov, Andrey A Sokolov, Evgeniy V Ubyivovk, Sergey Yulin, Mihaela Gorgoi and Franz Schäfers
Science and Technology of Advanced Materials 13 (1) 015001 (2012)
https://doi.org/10.1088/1468-6996/13/1/015001

Kramers-Kronig constrained modeling of soft x-ray reflectivity spectra: Obtaining depth resolution of electronic and chemical structure

Kevin H. Stone, S. Manuel Valvidares and Jeffrey B. Kortright
Physical Review B 86 (2) (2012)
https://doi.org/10.1103/PhysRevB.86.024102

Effect of pH, surface charge and counter-ions on the adsorption of sodium dodecyl sulfate to the sapphire/solution interface

Ningning Li, Robert K. Thomas and Adrian R. Rennie
Journal of Colloid and Interface Science 378 (1) 152 (2012)
https://doi.org/10.1016/j.jcis.2012.04.026

Determination of thickness and optical constants of solgel derived polyvinylpyrrolidone/ZrO2films from transmission spectra using different dispersion models

Hongbao Jia, Jinghua Sun, Yao Xu and Dong Wu
Applied Optics 51 (29) 6937 (2012)
https://doi.org/10.1364/AO.51.006937

X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(0 0 1)

F Bertram, C Deiter, O Hoefert, et al.
Journal of Physics D: Applied Physics 45 (39) 395302 (2012)
https://doi.org/10.1088/0022-3727/45/39/395302

Correlation between surface rumpling and structural phase transformation in SrTiO3

Surendra Singh, Te-Yu Chien, J. R. Guest and M. R. Fitzsimmons
Physical Review B 85 (11) (2012)
https://doi.org/10.1103/PhysRevB.85.115450

Asymmetric Distribution of Anionic Phospholipids in Supported Lipid Bilayers

S. Stanglmaier, S. Hertrich, K. Fritz, et al.
Langmuir 28 (29) 10818 (2012)
https://doi.org/10.1021/la3019887

Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials

B.J. Kirby, P.A. Kienzle, B.B. Maranville, et al.
Current Opinion in Colloid & Interface Science 17 (1) 44 (2012)
https://doi.org/10.1016/j.cocis.2011.11.001

Neutron reflection from the surface of a liquid4He-3He mixture

O Kirichek, N D Vasilev, T R Charlton, C J Kinane, R M Dalgliesh, A Ganshin, S Langridge and P V E McClintock
Journal of Physics: Conference Series 400 (1) 012033 (2012)
https://doi.org/10.1088/1742-6596/400/1/012033

Structure of [C4mpyr][NTf2] Room-Temperature Ionic Liquid at Charged Gold Interfaces

Yansen Lauw, Michael D. Horne, Theo Rodopoulos, et al.
Langmuir 28 (19) 7374 (2012)
https://doi.org/10.1021/la3005757

Monochromatization of femtosecond X-ray free-electron laser pulses by means of quasi-forbidden bragg reflections from periodic multilayer structures

V. A. Bushuev and L. Samoylova
Bulletin of the Russian Academy of Sciences: Physics 76 (2) 153 (2012)
https://doi.org/10.3103/S1062873812020062

Fine structures in refractive index of sapphire at the LII,III absorption edge of aluminum determined by soft x-ray resonant reflectivity

Arijeet Das, Rajkumar K. Gupta, Mohammed H. Modi, Chandrachur Mukherjee, Sanjay K. Rai, Aniruddha Bose, Tapas Ganguli, Satish C. Joshi, Gyan S. Lodha and Sudip K. Deb
Applied Optics 51 (30) 7402 (2012)
https://doi.org/10.1364/AO.51.007402

Ultra-thin high-quality silicon nitride films on Si(111)

J. Falta, Th. Schmidt, S. Gangopadhyay, T. Clausen, O. Brunke, J. I. Flege, S. Heun, S. Bernstorff, L. Gregoratti and M. Kiskinova
EPL (Europhysics Letters) 94 (1) 16003 (2011)
https://doi.org/10.1209/0295-5075/94/16003

Generic and Specific Roles of Saccharides at Cell and Bacteria Surfaces

Emanuel Schneck and Motomu Tanaka
Generic and Specific Roles of Saccharides at Cell and Bacteria Surfaces 9 (2011)
https://doi.org/10.1007/978-3-642-15450-8_2

Particulars of studying the roughness of substrates for multilayer X-ray optics using small-angle X-ray reflectometry, atomic-force, and interference microscopy

M. M. Barysheva, Yu. A. Vainer, B. A. Gribkov, M. V. Zorina, A. E. Pestov, D. N. Rogachev, N. N. Salashchenko and N. I. Chkhalo
Bulletin of the Russian Academy of Sciences: Physics 75 (1) 67 (2011)
https://doi.org/10.3103/S1062873811010059

On the theory of X-ray coherent reflection from a rough surface

S. V. Salikhov, F. N. Chukhovskii and A. M. Polyakov
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 5 (5) 887 (2011)
https://doi.org/10.1134/S102745101109014X

Comparison of Surface Roughness Estimations by X-ray Reflectivity Measurements and TEM observations

Yoshikazu Fujii
IOP Conference Series: Materials Science and Engineering 24 012008 (2011)
https://doi.org/10.1088/1757-899X/24/1/012008

Magnetism studied with circularly polarized X-rays

Gisela Schütz, Eberhard Goering and Hermann Stoll
International Journal of Materials Research 102 (7) 773 (2011)
https://doi.org/10.3139/146.110536

Resonant x-ray reflectivity study of perovskite oxide superlattices

N. Kemik, M. Gu, F. Yang, et al.
Applied Physics Letters 99 (20) (2011)
https://doi.org/10.1063/1.3660719

Structural characterization of supported nanocrystalline ZnO thin films prepared by dip-coating

J.R. Casanova, E.A. Heredia, C.D. Bojorge, H.R. Cánepa, G. Kellermann and A.F. Craievich
Applied Surface Science 257 (23) 10045 (2011)
https://doi.org/10.1016/j.apsusc.2011.06.136

Multiple order parameter configurations in superconductor/ferromagnet multilayers

V. N. Kushnir, S. L. Prischepa, C. Cirillo, A. Vecchione, C. Attanasio, M. Yu. Kupriyanov and J. Aarts
Physical Review B 84 (21) (2011)
https://doi.org/10.1103/PhysRevB.84.214512

Microstructure and Phase Behavior of a Quinquethiophene-Based Self-Assembled Monolayer as a Function of Temperature

Heinz-Georg Flesch, Simon G. J. Mathijssen, Fatemeh Gholamrezaie, et al.
The Journal of Physical Chemistry C 115 (46) 22925 (2011)
https://doi.org/10.1021/jp206033x

Application of quasi-forbidden multilayer Bragg reflection for monochromatization of hard X-ray FEL SASE pulses

Vladimir Bushuev and Liubov Samoylova
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 635 (1) S19 (2011)
https://doi.org/10.1016/j.nima.2010.10.036

Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods

Vivek M. Prabhu, Shuhui Kang, David L. VanderHart, et al.
Advanced Materials 23 (3) 388 (2011)
https://doi.org/10.1002/adma.201001762