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Article cité :

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Analytical and Bioanalytical Chemistry 393 (2) 623 (2009)
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A combined X‐ray, ellipsometry and atomic force microscopy study on thin parylene‐C films

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physica status solidi (a) 206 (8) 1727 (2009)
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Novel method for error limit determination in x-ray reflectivity analysis

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Journal of Physics D: Applied Physics 41 (11) 115302 (2008)
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Comparative x-ray reflectometry and atomic force microscopy of surfaces with non-Gaussian roughness

V. L. Mironov, O. G. Udalov, B. A. Gribkov and A. A. Fraerman
Journal of Applied Physics 104 (6) (2008)
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Passivation of GaAs surface by atomic-layer-deposited titanium nitride

M. Bosund, A. Aierken, J. Tiilikainen, T. Hakkarainen and H. Lipsanen
Applied Surface Science 254 (17) 5385 (2008)
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Neutron reflection from a liquid helium surface

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Control of the perpendicular magnetic anisotropy of FePd films via Pd capping deposition

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