Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
Rev. Phys. Appl. (Paris), 15 3 (1980) 761-779
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Neutron reflection from the surfaces of liquid4He and a Dilute3He—4He solution
T R Charlton, R M Dalgliesh, A N Ganshin, O Kirichek, S Langridge and P V E McClintockJournal of Physics: Conference Series 150 (3) 032022 (2009)
https://doi.org/10.1088/1742-6596/150/3/032022
Epitaxial growth of AlN on single crystal Mo substrates
Koichiro Okamoto, Shigeru Inoue, Takayuki Nakano, Tae-Won Kim, Masaharu Oshima and Hiroshi FujiokaThin Solid Films 516 (15) 4809 (2008)
https://doi.org/10.1016/j.tsf.2007.08.122
Passivation of GaAs surface by atomic-layer-deposited titanium nitride
M. Bosund, A. Aierken, J. Tiilikainen, T. Hakkarainen and H. LipsanenApplied Surface Science 254 (17) 5385 (2008)
https://doi.org/10.1016/j.apsusc.2008.02.070
Comparative x-ray reflectometry and atomic force microscopy of surfaces with non-Gaussian roughness
V. L. Mironov, O. G. Udalov, B. A. Gribkov and A. A. FraermanJournal of Applied Physics 104 (6) (2008)
https://doi.org/10.1063/1.2977753
Neutron reflectometry to investigate the delivery of lipids and DNA to interfaces (Review)
Tommy Nylander, Richard A. Campbell, Pauline Vandoolaeghe, et al.Biointerphases 3 (2) FB64 (2008)
https://doi.org/10.1116/1.2976448
X-ray magnetic circular dichroism in reflection geometry: A tool for investigating surface magnetism in thin films
S. Valencia, A. Gaupp, W. Gudat, et al.Journal of Applied Physics 104 (2) (2008)
https://doi.org/10.1063/1.2956512
On determination of properties of ultrathin and very thin silicon oxide layers by FTIR and X - ray reflectivity
Martin Kopani, Matej Jergel, Hikaru Kobayashi, Masao Takahashi, Robert Brunner, Milan Mikula, Kentarou Imamura, Stanislav Jurecka and Emil PincikMRS Proceedings 1066 (2008)
https://doi.org/10.1557/PROC-1066-A07-03
A study of uranium-based multilayers: I. Fabrication and structural characterization
R Springell, S W Zochowski, R C C Ward, M R Wells, S D Brown, L Bouchenoire, F Wilhelm, S Langridge, W G Stirling and G H LanderJournal of Physics: Condensed Matter 20 (21) 215229 (2008)
https://doi.org/10.1088/0953-8984/20/21/215229
Modern Developments in X-Ray and Neutron Optics
Franz SchäfersSpringer Series in optical science, Modern Developments in X-Ray and Neutron Optics 137 9 (2008)
https://doi.org/10.1007/978-3-540-74561-7_2
Depth-resolved investigation of the lateral magnetic correlations in a gradient nanocrystalline multilayer
Emmanuel Kentzinger, Ulrich Rücker, Boris Toperverg, Frédéric Ott and Thomas BrückelPhysical Review B 77 (10) (2008)
https://doi.org/10.1103/PhysRevB.77.104435
Lateral length scales of latent image roughness as determined by off-specular neutron reflectivity
Kristopher A. Lavery, Vivek M. Prabhu, Eric K. Lin, et al.Applied Physics Letters 92 (6) (2008)
https://doi.org/10.1063/1.2841663
Synthesis of a Photosensitive Thiocyanate-Functionalized Trialkoxysilane and Its Application in Patterned Surface Modifications
Alexandra Lex, Peter Pacher, Oliver Werzer, et al.Chemistry of Materials 20 (5) 2009 (2008)
https://doi.org/10.1021/cm702758n
Temperature dependence surface structure of BaTiO3 thin films induced by ferroelectric phase transition
X. L. Li, H. B. Lu, Ming Li, Zhenhong Mai and Hyunjung KimJournal of Applied Physics 103 (5) (2008)
https://doi.org/10.1063/1.2894901
Room-temperature growth of AlN/TiN epitaxial multi-layer by laser molecular beam epitaxy
Wakana Hara, Jin Liu, Atsushi Sasaki, Sei Otaka, Norihiro Tateda, Keisuke Saito and Mamoru YoshimotoThin Solid Films 516 (10) 2889 (2008)
https://doi.org/10.1016/j.tsf.2007.05.070
Control of the perpendicular magnetic anisotropy of FePd films via Pd capping deposition
C. Clavero, J. R. Skuza, Y. Choi, et al.Applied Physics Letters 92 (16) (2008)
https://doi.org/10.1063/1.2916712
Neutron reflection from a liquid helium surface
T. R. Charlton, R. M. Dalgliesh, O. Kirichek, et al.Low Temperature Physics 34 (4) 316 (2008)
https://doi.org/10.1063/1.2908893
Antireflecting–passivating dielectric films on crystalline silicon solar cells for space applications
M. Barrera, J. Plá, C. Bocchi and A. MiglioriSolar Energy Materials and Solar Cells 92 (9) 1115 (2008)
https://doi.org/10.1016/j.solmat.2008.03.021
X-ray investigation of subsurface interstitial oxygen at Nb/oxide interfaces
M. Delheusy, A. Stierle, N. Kasper, et al.Applied Physics Letters 92 (10) (2008)
https://doi.org/10.1063/1.2889474
X-Ray Reflectivity Measurements of Layer-by-Layer Films at the Solid/Liquid Interface
Svetlana Erokhina, Tatiana Berzina, Luigi Cristofolini, et al.Langmuir 24 (21) 12093 (2008)
https://doi.org/10.1021/la802060e
Grazing incidence off-plane lamellar grating as a beam splitter for a 1-Å free electron laser
L. I. GorayJournal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 2 (5) 796 (2008)
https://doi.org/10.1134/S1027451008050248
Substrate effect on the optical response of thin palladium films exposed to hydrogen gas
R.J. Matelon, J.I. Avila, U.G. Volkmann, et al.Thin Solid Films 516 (21) 7797 (2008)
https://doi.org/10.1016/j.tsf.2008.03.034
137 233 (2008)
https://doi.org/10.1007/978-3-540-74561-7_16
High magnetization FeCo∕Pd multilayers
M. J. Walock, H. Ambaye, M. Chshiev, et al.Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 26 (4) 731 (2008)
https://doi.org/10.1116/1.2830631
Specular neutron reflectivity and beyond
Saibal BasuPramana 71 (4) 777 (2008)
https://doi.org/10.1007/s12043-008-0268-9
A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry
F. Benzi, I. Davoli, M. Rovezzi and F. d’AcapitoReview of Scientific Instruments 79 (10) (2008)
https://doi.org/10.1063/1.2991111
Characterization of ion beam sputter deposited W and Si films and W/Si interfaces by grazing incidence X-ray reflectivity, atomic force microscopy and spectroscopic ellipsometry
A. Biswas, A.K. Poswal, R.B. Tokas and D. BhattacharyyaApplied Surface Science 254 (11) 3347 (2008)
https://doi.org/10.1016/j.apsusc.2007.11.025
DNA adsorption at functionalized Si/buffer interfaces studied by x-ray reflectivity
C. Douarche, R. Cortès, C. Henry de Villeneuve, S. J. Roser and A. BraslauThe Journal of Chemical Physics 128 (22) (2008)
https://doi.org/10.1063/1.2927256
Reflectivity test of X-ray mirrors for deep X-ray lithography
V. Nazmov, E. Reznikova, A. Last, M. Boerner and J. MohrMicrosystem Technologies 14 (9-11) 1299 (2008)
https://doi.org/10.1007/s00542-008-0581-8
Novel method for error limit determination in x-ray reflectivity analysis
J Tiilikainen, M Mattila, T Hakkarainen and H LipsanenJournal of Physics D: Applied Physics 41 (11) 115302 (2008)
https://doi.org/10.1088/0022-3727/41/11/115302
Atmospheric pressure oxidation of Pt(111)
C Ellinger, A Stierle, I K Robinson, A Nefedov and H DoschJournal of Physics: Condensed Matter 20 (18) 184013 (2008)
https://doi.org/10.1088/0953-8984/20/18/184013
Structure and Depletion at Fluorocarbon and Hydrocarbon/Water Liquid/Liquid Interfaces
Kaoru Kashimoto, Jaesung Yoon, Binyang Hou, et al.Physical Review Letters 101 (7) (2008)
https://doi.org/10.1103/PhysRevLett.101.076102
Mixed SiO2–TiO2 (1:1) sol–gel films on mild steel substrates: Sol composition and thermal treatment effects
S. Vives and C. MeunierSurface and Coatings Technology 202 (11) 2374 (2008)
https://doi.org/10.1016/j.surfcoat.2007.08.070
Structure and magnetism of Ni/Ti multilayers on annealing
Surendra Singh, Saibal Basu and P. BhattPramana 71 (5) 1091 (2008)
https://doi.org/10.1007/s12043-008-0229-3
Asymmetric Structural Features in Single Supported Lipid Bilayers Containing Cholesterol and GM1 Resolved with Synchrotron X-Ray Reflectivity
Christian Reich, Margaret R. Horton, Bärbel Krause, Alice P. Gast, Joachim O. Rädler and Bert NickelBiophysical Journal 95 (2) 657 (2008)
https://doi.org/10.1529/biophysj.107.113068
Effect of anomalous transmittance in EUV multilayer optics
Igor Kozhevnikov, Sergiy Yulin, Torsten Feigl and Norbert KaiserOptics Communications 281 (11) 3025 (2008)
https://doi.org/10.1016/j.optcom.2008.01.057
Structures of Multilayered Thin Films of Long-Chain Molecules: X-ray Scattering Study
Ken Tanaka, Kiyoshi Ishikawa, Koji Nozaki, Naohito Urakami and Takashi YamamotoPolymer Journal 40 (10) 1017 (2008)
https://doi.org/10.1295/polymj.PJ2007230
The structure of DNA-containing complexes suggests the idea for a new adaptive sensor
Luigi Cristofolini, Tatiana Berzina, Victor Erokhin, Matteo Tenti, Marco P. Fontana, Svetlana Erokhina and Oleg KonovalovColloids and Surfaces A: Physicochemical and Engineering Aspects 321 (1-3) 158 (2008)
https://doi.org/10.1016/j.colsurfa.2007.12.040
Passivation of defect states in Si-based and GaAs structures
E. Pinčík, H. Kobayashi, R. Brunner, M. Takahashi, Yueh-Ling Liu, L. Ortega, K. Imamura, M. Jergel and J. RusnákApplied Surface Science 254 (24) 8059 (2008)
https://doi.org/10.1016/j.apsusc.2008.03.029
Time-resolved morphological study of organic thin film solar cells based on calcium/aluminium cathode material
B. Paci, A. Generosi, V. Rossi Albertini, P. Perfetti, R. de Bettignies and C. SenteinChemical Physics Letters 461 (1-3) 77 (2008)
https://doi.org/10.1016/j.cplett.2008.06.070
Molecular Ordering and Phase Behavior of Surfactants at Water-Oil Interfaces as Probed by X-Ray Surface Scattering
Mark L. Schlossman and Aleksey M. TikhonovAnnual Review of Physical Chemistry 59 (1) 153 (2008)
https://doi.org/10.1146/annurev.physchem.59.032607.093822
Advanced nanometer-size structures
Eva Majkova, Matej Jergel, Masaki Yamamoto, et al.Acta Physica Slovaca. Reviews and Tutorials 57 (6) 911 (2007)
https://doi.org/10.2478/v10155-010-0087-7
Genetic algorithm using independent component analysis in x-ray reflectivity curve fitting of periodic layer structures
J Tiilikainen, V Bosund, J-M Tilli, J Sormunen, M Mattila, T Hakkarainen and H LipsanenJournal of Physics D: Applied Physics 40 (19) 6000 (2007)
https://doi.org/10.1088/0022-3727/40/19/033
Low temperature epitaxial growth of GaN films on LiGaO2 substrates
Kento Sakurada, Atsushi Kobayashi, Yuji Kawaguchi, Jitsuo Ohta and Hiroshi FujiokaApplied Physics Letters 90 (21) (2007)
https://doi.org/10.1063/1.2737928
Self-consistent approach to x-ray reflection from rough surfaces
I. D. Feranchuk, S. I. Feranchuk and A. P. UlyanenkovPhysical Review B 75 (8) (2007)
https://doi.org/10.1103/PhysRevB.75.085414
Electrical resistivity and magnetic behavior ofPdNiandCuNithin films
G. Iannone, D. Zola, A. Angrisani Armenio, M. Polichetti and C. AttanasioPhysical Review B 75 (6) 064409 (2007)
https://doi.org/10.1103/PhysRevB.75.064409
Swift heavy ion induced modification in Ti/Si system studied with sub-nanometre resolution
Parasmani Rajput, Ajay Gupta, V R Reddy, Vasant Sathe and D K AvasthiJournal of Physics: Condensed Matter 19 (3) 036221 (2007)
https://doi.org/10.1088/0953-8984/19/3/036221
Upper critical fields and interface transparency in superconductor/ferromagnet bilayers
A. Angrisani Armenio, C. Cirillo, G. Iannone, S. L. Prischepa and C. AttanasioPhysical Review B 76 (2) (2007)
https://doi.org/10.1103/PhysRevB.76.024515
X-Ray Reflectometry Determination of Structural Information from Atomic Layer Deposition Nanometer-scale Hafnium Oxide Thin Films
Donald Windover, D. L. Gil, J. P. Cline, et al.MRS Proceedings 996 0996-H07-05 (2007)
https://doi.org/10.1557/PROC-0996-H07-05
Evolution with temperature of a single sol–gel TIO2 layer on sapphire (α-Al2O3) (0001)
S. Vives, C. Meunier, N. Boubekeur, Y. Kersale and V. GiordanoApplied Surface Science 253 (17) 7131 (2007)
https://doi.org/10.1016/j.apsusc.2007.02.188
Multilayer coatings for x-ray mirrors: extraction of stack parameters from x-ray reflectivity scans and comparison with transmission electron microscopy results
Daniele SpigaOptical Engineering 46 (8) 086501 (2007)
https://doi.org/10.1117/1.2769325
X-ray and ellipsometric study of strong critical adsorption
M. D. Brown, B. M. Law, L. Marchand, L. B. Lurio, I. Kuzmenko, T. Gog and W. A. HamiltonPhysical Review E 75 (6) (2007)
https://doi.org/10.1103/PhysRevE.75.061606
Light Scattering from Randomly Rough Surfaces
A.A. Maradudin and E.R. méndezScience Progress 90 (4) 161 (2007)
https://doi.org/10.3184/003685007X228711
Tuning the4fstate occupancy of Ce in highly correlatedCeSi∕Femultilayers: An x-ray absorption spectroscopy study
M. Münzenberg, W. Felsch and P. SchaafPhysical Review B 76 (1) (2007)
https://doi.org/10.1103/PhysRevB.76.014427
Surface morphology and the phase formation at Cr/Si system
Shivani Agarwal, Ankur Jain, Chhagan Lal, V. Ganesan and I.P. JainApplied Surface Science 253 (10) 4721 (2007)
https://doi.org/10.1016/j.apsusc.2006.10.063
Growth of InN films on spinel substrates by pulsed laser deposition
K. Mitamura, J. Ohta, H. Fujioka and M. Oshimaphysica status solidi (RRL) – Rapid Research Letters 1 (5) 211 (2007)
https://doi.org/10.1002/pssr.200701138
Structural Study of the DNA Dipalmitoylphosphatidylcholine Complex at the Air−Water Interface
Luigi Cristofolini, Tatiana Berzina, Svetlana Erokhina, Oleg Konovalov and Victor ErokhinBiomacromolecules 8 (7) 2270 (2007)
https://doi.org/10.1021/bm070322w
Density Depletion at Solid−Liquid Interfaces: a Neutron Reflectivity Study
M. Maccarini, R. Steitz, M. Himmelhaus, et al.Langmuir 23 (2) 598 (2007)
https://doi.org/10.1021/la061943y
Structure and Dynamics of Crystalline Protein Layers Bound to Supported Lipid Bilayers
Margaret R. Horton, Christian Reich, Alice P. Gast, Joachim O. Rädler and Bert NickelLangmuir 23 (11) 6263 (2007)
https://doi.org/10.1021/la063690e
Nonlinear fitness–space–structure adaptation and principal component analysis in genetic algorithms: an application to x-ray reflectivity analysis
J Tiilikainen, J-M Tilli, V Bosund, M Mattila, T Hakkarainen, V-M Airaksinen and H LipsanenJournal of Physics D: Applied Physics 40 (1) 215 (2007)
https://doi.org/10.1088/0022-3727/40/1/017
Experimental determination of optical constants in the vacuum ultra violet wavelength region between 80 and 140nm: A reflectance versus thickness method and its application to ZnSe
Françoise Bridou, Mireille Cuniot-Ponsard and Jean-Michel DesvignesOptics Communications 271 (2) 353 (2007)
https://doi.org/10.1016/j.optcom.2006.10.042
Interaction of DNA Oligomers with Cationic Lipidic Monolayers: Complexation and Splitting
Svetlana Erokhina, Tatiana Berzina, Luigi Cristofolini, et al.Langmuir 23 (8) 4414 (2007)
https://doi.org/10.1021/la070069l
Thermal stability of Co∕SiO2 multilayers for use in the soft x-ray region
Masahiko Ishino, Masato Koike, Mika Kanehira, et al.Journal of Applied Physics 102 (2) (2007)
https://doi.org/10.1063/1.2756741
Epitaxial growth of AlN films on single-crystalline Ta substrates
S. Hirata, K. Okamoto, S. Inoue, T-W. Kim, J. Ohta, H. Fujioka and M. OshimaJournal of Solid State Chemistry 180 (8) 2335 (2007)
https://doi.org/10.1016/j.jssc.2007.06.008
Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(001) epitaxial structures
C.A.F. Vaz, G. Lauhoff, J.A.C. Bland, et al.Journal of Magnetism and Magnetic Materials 313 (1) 89 (2007)
https://doi.org/10.1016/j.jmmm.2006.12.008
Investigation of interface magnetic moment of Fe∕Ge multilayer: A neutron reflectivity study
Surendra Singh, Saibal Basu, Mukul Gupta, Mahesh Vedpathakz and R. H. KodamaJournal of Applied Physics 101 (3) (2007)
https://doi.org/10.1063/1.2450680
Handbook of Magnetism and Advanced Magnetic Materials
Gisela Schütz, Eberhard Goering and Hermann StollHandbook of Magnetism and Advanced Magnetic Materials (2007)
https://doi.org/10.1002/9780470022184.hmm304
Accuracy in x-ray reflectivity analysis
J Tiilikainen, J-M Tilli, V Bosund, M Mattila, T Hakkarainen, J Sormunen and H LipsanenJournal of Physics D: Applied Physics 40 (23) 7497 (2007)
https://doi.org/10.1088/0022-3727/40/23/037
Oxidation and Reduction of Ultrathin Nanocrystalline Ru Films on Silicon: Model System for Ru-Capped Extreme Ultraviolet Lithography Optics
Y. B. He, A. Goriachko, C. Korte, et al.The Journal of Physical Chemistry C 111 (29) 10988 (2007)
https://doi.org/10.1021/jp071339b
Handbook of Magnetism and Advanced Magnetic Materials
Hartmut Zabel, Katharina Theis‐Bröhl and Boris P. TopervergHandbook of Magnetism and Advanced Magnetic Materials (2007)
https://doi.org/10.1002/9780470022184.hmm303
Structural properties of GaN grown on Zn-face ZnO at room temperature
Atsushi Kobayashi, Yuki Shirakura, Kazuo Miyamura, Jitsuo Ohta and Hiroshi FujiokaJournal of Crystal Growth 305 (1) 70 (2007)
https://doi.org/10.1016/j.jcrysgro.2007.04.027
Study of optical response near the absorption edge using vacuum ultra violet/soft X-ray reflectivity beamline on Indus-1
G S Lodha, M Nayak, M H Modi, A K Sinha and R V NandedkarJournal of Physics: Conference Series 80 012031 (2007)
https://doi.org/10.1088/1742-6596/80/1/012031
Characterization of nanostructured Cr2Nx/Cu multilayers deposited by reactive DC magnetron sputtering
K. Pagh Almtoft, M. Kristensen, J. Chevallier and J. BøttigerSurface and Coatings Technology 201 (8) 4767 (2007)
https://doi.org/10.1016/j.surfcoat.2006.10.016
Grazing incidence X-ray studies of ultra-thin Lumogen films
S.J. Keough, T.L. Hanley, A.B. Wedding and J.S. QuintonSurface Science 601 (24) 5744 (2007)
https://doi.org/10.1016/j.susc.2007.06.053
Correlation between x-ray reciprocal space maps and magnetic properties of current-induced magnetization switching pseudospin valve structures
P. Siffalovic, L. Chitu, Y. Halahovets, et al.Journal of Applied Physics 101 (3) (2007)
https://doi.org/10.1063/1.2435891
Structural study of nanoporous ultra low-k dielectrics using complementary techniques: Ellipsometric porosimetry, X-ray reflectivity and grazing incidence small-angle X-ray scattering
V. Jousseaume, G. Rolland, D. Babonneau and J.-P. SimonApplied Surface Science 254 (2) 473 (2007)
https://doi.org/10.1016/j.apsusc.2007.06.043
Fitness function and nonunique solutions in x-ray reflectivity curve fitting: crosserror between surface roughness and mass density
J Tiilikainen, V Bosund, M Mattila, et al.Journal of Physics D: Applied Physics 40 (14) 4259 (2007)
https://doi.org/10.1088/0022-3727/40/14/023
Properties of the roughness in NiFe/FeMn exchange-biased system
V.P. Nascimento, E.C. Passamani, A. Biondo, V.B. Nunes and E. Baggio SaitovitchApplied Surface Science 253 (14) 6248 (2007)
https://doi.org/10.1016/j.apsusc.2007.01.095
Determination of X-ray compression efficiency of a thin film X-ray waveguide structure using marker layer fluorescence
M.K. Tiwari, M. Nayak, G.S. Lodha and R.V. NandedkarSpectrochimica Acta Part B: Atomic Spectroscopy 62 (2) 137 (2007)
https://doi.org/10.1016/j.sab.2007.02.009
Epitaxial growth of nonpolar AlN films on ZnO substrates using room temperature grown GaN buffer layers
Kohei Ueno, Atsushi Kobayashi, Jitsuo Ohta, et al.Applied Physics Letters 91 (8) (2007)
https://doi.org/10.1063/1.2775035
Synchrotron x-ray scattering study of thin epitaxial Pr2O3 films on Si(001)
Xiangxin Guo, Wolfgang Braun, Bernd Jenichen, et al.Journal of Applied Physics 100 (2) (2006)
https://doi.org/10.1063/1.2216421
Reflection high-energy electron diffraction study of molecular beam epitaxy growth of Pr2O3 on Si(0 0 1)
Xiangxin Guo, Wolfgang Braun, Bernd Jenichen and Klaus H. PloogJournal of Crystal Growth 290 (1) 73 (2006)
https://doi.org/10.1016/j.jcrysgro.2005.12.083
Low temperature epitaxial growth of In0.25Ga0.75N on lattice-matched ZnO by pulsed laser deposition
Atsushi Kobayashi, Jitsuo Ohta and Hiroshi FujiokaJournal of Applied Physics 99 (12) (2006)
https://doi.org/10.1063/1.2206883
Structure of the Interface between Two Polar Liquids: Nitrobenzene and Water
Guangming Luo, Sarka Malkova, Sai Venkatesh Pingali, et al.The Journal of Physical Chemistry B 110 (10) 4527 (2006)
https://doi.org/10.1021/jp057103u
Novel methods and universal software for HRXRD, XRR and GISAXS data interpretation
A. UlyanenkovApplied Surface Science 253 (1) 106 (2006)
https://doi.org/10.1016/j.apsusc.2006.05.099
Room-Temperature Epitaxial Growth of GaN on Atomically Flat MgAl2O4 Substrates by Pulsed-Laser Deposition
Guoqiang Li, Jitsuo Ohta, Koichiro Okamoto, Atsushi Kobayashi and Hiroshi FujiokaJapanese Journal of Applied Physics 45 (5L) L457 (2006)
https://doi.org/10.1143/JJAP.45.L457
Transport properties of Nb/PdNi bilayers
C. Cirillo, S.L. Prischepa, M. Salvato and C. AttanasioJournal of Physics and Chemistry of Solids 67 (1-3) 412 (2006)
https://doi.org/10.1016/j.jpcs.2005.10.015
Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering
A. Gibaud, S. Dourdain and G. VignaudApplied Surface Science 253 (1) 3 (2006)
https://doi.org/10.1016/j.apsusc.2006.05.121
Interface magnetism and magnetic structure of GdN∕Fe multilayers studied by x-ray magnetic circular dichroism
F. Leuenberger, A. Parge, W. Felsch, T. Neisius and O. MathonJournal of Applied Physics 100 (3) 033905 (2006)
https://doi.org/10.1063/1.2227625
Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system
Florin Radu, Alexei Nefedov, Johannes Grabis, et al.Journal of Magnetism and Magnetic Materials 300 (1) 206 (2006)
https://doi.org/10.1016/j.jmmm.2005.10.064
Epitaxial growth of InN on nearly lattice-matched (Mn,Zn)Fe2O4
J. Ohta, K. Mitamura, A. Kobayashi, T. Honke, H. Fujioka and M. OshimaSolid State Communications 137 (4) 208 (2006)
https://doi.org/10.1016/j.ssc.2005.11.015
Structural and optical properties of direct current sputtered zinc aluminum oxides with a high Al concentration
S.H. Mohamed and R. DreseThin Solid Films 513 (1-2) 64 (2006)
https://doi.org/10.1016/j.tsf.2006.01.014
Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform
F. Bridou, J. Gautier, F. Delmotte, M.-F. Ravet, O. Durand and M. ModreanuApplied Surface Science 253 (1) 12 (2006)
https://doi.org/10.1016/j.apsusc.2006.05.122
Heteroepitaxial growth of GaN on atomically flat LiTaO3 (0001) using low-temperature AIN buffer layers
Y. Tsuchiya, A. Kobayashi, J. Ohta, H. Fujioka and M. OshimaJournal of Crystal Growth 293 (1) 22 (2006)
https://doi.org/10.1016/j.jcrysgro.2006.05.006
Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity
Maheswar Nayak, G. S. Lodha, A. K. Sinha, R. V. Nandedkar and S. A. ShivashankarApplied Physics Letters 89 (18) (2006)
https://doi.org/10.1063/1.2374865
Morphology of electrodeposited Ni/Cu multilayer: Specular and diffuse neutron reflectometry study
Saibal Basu, Surendra Singh and S.K. GhoshPhysica B: Condensed Matter 385-386 656 (2006)
https://doi.org/10.1016/j.physb.2006.06.101
The energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices
V Rossi Albertini, B Paci and A GenerosiJournal of Physics D: Applied Physics 39 (23) R461 (2006)
https://doi.org/10.1088/0022-3727/39/23/R01
Activation energy in La0.7Ca0.3MnO3/YBa2Cu3O7-δ / La0.7Ca0.3MnO3 superconducting trilayers
M. Salvato, F. Bobba, G. Calabrese, et al.The European Physical Journal B 51 (1) 79 (2006)
https://doi.org/10.1140/epjb/e2006-00200-4
Microscopic characterization of corrosion morphology: A study in specular and diffuse neutron reflectivity
Surendra Singh and Saibal BasuSurface Science 600 (2) 493 (2006)
https://doi.org/10.1016/j.susc.2005.10.060
Structure and magnetic properties of Fe/Ge multilayer by neutron reflectometry
Surendra Singh, Saibal Basu and Mukul GuptaPhysica B: Condensed Matter 385-386 653 (2006)
https://doi.org/10.1016/j.physb.2006.06.100
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing 110 (2006)https://doi.org/10.1201/9781420005653.ch8