Revue de Physique Appliquée

Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system

Florin Radu, Alexei Nefedov, Johannes Grabis, et al.
Journal of Magnetism and Magnetic Materials 300 (1) 206 (2006)
https://doi.org/10.1016/j.jmmm.2005.10.064

Microscopic characterization of corrosion morphology: A study in specular and diffuse neutron reflectivity

Surendra Singh and Saibal Basu
Surface Science 600 (2) 493 (2006)
https://doi.org/10.1016/j.susc.2005.10.060

Characteristics of GaN/ZrB2 Heterointerfaces Prepared by Pulsed Laser Deposition

Yuji Kawaguchi, Atsushi Kobayashi, Jitsuo Ohta and Hiroshi Fujioka
Japanese Journal of Applied Physics 45 (9R) 6893 (2006)
https://doi.org/10.1143/JJAP.45.6893

Wolter type I x-ray focusing mirror using multilayer coatings

Kwon Su Chon, Yoshiharu Namba and Kwon-Ha Yoon
Applied Optics 45 (19) 4609 (2006)
https://doi.org/10.1364/AO.45.004609

Epitaxial growth of AlN on single-crystal Ni(111) substrates

Tae-Won Kim, N. Matsuki, J. Ohta and H. Fujioka
Applied Physics Letters 88 (12) (2006)
https://doi.org/10.1063/1.2186391

Room-temperature epitaxial growth of AlN on atomically flat MgAl2O4 substrates

Guoqiang Li, Jitsuo Ohta, Atsushi Kobayashi and Hiroshi Fujioka
Applied Physics Letters 89 (18) (2006)
https://doi.org/10.1063/1.2372685

Growth temperature dependence of structural properties for single crystalline GaN films on MgAl2O4substrates by pulsed laser deposition

Guoqiang Li, Jitsuo Ohta, Atsushi Kobayashi and Hiroshi Fujioka
Semiconductor Science and Technology 21 (8) 1026 (2006)
https://doi.org/10.1088/0268-1242/21/8/007

Morphology of electrodeposited Ni/Cu multilayer: Specular and diffuse neutron reflectometry study

Saibal Basu, Surendra Singh and S.K. Ghosh
Physica B: Condensed Matter 385-386 656 (2006)
https://doi.org/10.1016/j.physb.2006.06.101

Characteristics of AlN/Ni(111) Heterostructures and their Application to Epitaxial Growth of GaN

Tae-Won Kim, Nobuyuki Matsuki, Jitsuo Ohta and Hiroshi Fujioka
Japanese Journal of Applied Physics 45 (4L) L396 (2006)
https://doi.org/10.1143/JJAP.45.L396

High-order laser harmonics and synchrotron study of transition metalsM2,3edges

R. Berlasso, C. Dallera, F. Borgatti, et al.
Physical Review B 73 (11) 115101 (2006)
https://doi.org/10.1103/PhysRevB.73.115101

Room-Temperature Epitaxial Growth of GaN on Atomically Flat MgAl2O4 Substrates by Pulsed-Laser Deposition

Guoqiang Li, Jitsuo Ohta, Koichiro Okamoto, Atsushi Kobayashi and Hiroshi Fujioka
Japanese Journal of Applied Physics 45 (5L) L457 (2006)
https://doi.org/10.1143/JJAP.45.L457

Transport properties of Nb/PdNi bilayers

C. Cirillo, S.L. Prischepa, M. Salvato and C. Attanasio
Journal of Physics and Chemistry of Solids 67 (1-3) 412 (2006)
https://doi.org/10.1016/j.jpcs.2005.10.015

Epitaxial growth of InN on nearly lattice-matched (Mn,Zn)Fe2O4

J. Ohta, K. Mitamura, A. Kobayashi, T. Honke, H. Fujioka and M. Oshima
Solid State Communications 137 (4) 208 (2006)
https://doi.org/10.1016/j.ssc.2005.11.015

The energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices

V Rossi Albertini, B Paci and A Generosi
Journal of Physics D: Applied Physics 39 (23) R461 (2006)
https://doi.org/10.1088/0022-3727/39/23/R01

Ultrathin Magnetic Structures III

J. A. C. Bland and C. A. F. Vaz
Ultrathin Magnetic Structures III 233 (2005)
https://doi.org/10.1007/3-540-27163-5_7

Searching Ultimate Nanometrology for AlOx Thickness in Magnetic Tunnel Junction by Analytical Electron Microscopy and X-ray Reflectometry

Se Ahn Song, Tatsumi Hirano, Jong Bong Park, et al.
Microscopy and Microanalysis 11 (05) 431 (2005)
https://doi.org/10.1017/S1431927605050580

Physico-chemical and X-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing

P. Jonnard, I. Jarrige, R. Benbalagh, H. Maury, J.-M. André, Z. Dankházi and G. Rolland
Surface Science 589 (1-3) 164 (2005)
https://doi.org/10.1016/j.susc.2005.05.058

Nanostructure as seen by the SAXS

P. Dubček
Vacuum 80 (1-3) 92 (2005)
https://doi.org/10.1016/j.vacuum.2005.07.045

Light-induced molecular adsorption and reorientation at polyvinylcinnamate-fluorinated∕liquid-crystal interface

O. Francescangeli, L. Lucchetti, F. Simoni, V. Stanić and A. Mazzulla
Physical Review E 71 (1) (2005)
https://doi.org/10.1103/PhysRevE.71.011702

Microstructural analysis of the effects of incorporation of myelin basic protein in phospholipid layers

L. Cristofolini, M. P. Fontana, F. Serra, A. Fasano, P. Riccio and O. Konovalov
European Biophysics Journal 34 (8) 1041 (2005)
https://doi.org/10.1007/s00249-005-0489-5

Characterization of epitaxial germanium grown on (LaxY1−x)2O3∕Si(111) using different surfactants

E. J. Preisler and S. Guha
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 23 (3) 448 (2005)
https://doi.org/10.1116/1.1875253

Metal-insulator transition temperature enhancement in La0.7Ca0.3MnO3 thin films

M. Salvato, A. Vecchione, A. De Santis, F. Bobba and A. M. Cucolo
Journal of Applied Physics 97 (10) (2005)
https://doi.org/10.1063/1.1898451

GaN heteroepitaxial growth on LiNbO3(0001) step substrates with AlN buffer layers

Yousuke Tsuchiya, Atsushi Kobayashi, Jitsuo Ohta, Hiroshi Fujioka and Masaharu Oshima
physica status solidi (a) 202 (13) (2005)
https://doi.org/10.1002/pssa.200521226

Superconducting proximity effect and interface transparency inNb∕PdNibilayers

C. Cirillo, S. L. Prischepa, M. Salvato, C. Attanasio, M. Hesselberth and J. Aarts
Physical Review B 72 (14) (2005)
https://doi.org/10.1103/PhysRevB.72.144511

Interface transparency and proximity effect in Nb/Cu triple layers realized by sputtering and molecular beam epitaxy

A Tesauro, A Aurigemma, C Cirillo, S L Prischepa, M Salvato and C Attanasio
Superconductor Science and Technology 18 (1) 1 (2005)
https://doi.org/10.1088/0953-2048/18/1/001

Element-specific characterization of the interface magnetism in[Co2MnGe∕Au]nmultilayers by x-ray resonant magnetic scattering

J. Grabis, A. Bergmann, A. Nefedov, K. Westerholt and H. Zabel
Physical Review B 72 (2) (2005)
https://doi.org/10.1103/PhysRevB.72.024438

Kinetic interface roughening and magneto resistance of sputter-deposited Fe/Ni75B25 multilayers

R. Mustafa Öksüzoglu, Gerhard Miehe and Hartmut Fuess
Applied Surface Science 240 (1-4) 405 (2005)
https://doi.org/10.1016/j.apsusc.2004.07.009

X-ray scattering from liquid–liquid interfaces

Mark L. Schlossman
Physica B: Condensed Matter 357 (1-2) 98 (2005)
https://doi.org/10.1016/j.physb.2004.11.034

Foreword

Sunil K. Sinha
Physica B: Condensed Matter 357 (1-2) vii (2005)
https://doi.org/10.1016/j.physb.2004.11.006

In situhigh-energy x-ray reflectivity studies of hydrophobic polyelectrolytes at the solid/liquid interface

D Baigl, M Sferrazza, M-A Guedeau-Boudeville, et al.
Journal of Physics: Condensed Matter 17 (41) 6329 (2005)
https://doi.org/10.1088/0953-8984/17/41/004

Nuclear resonant spectroscopy at Bragg reflections from periodic multilayers: Basic effects and applications

M. A. Andreeva and B. Lindgren
Physical Review B 72 (12) 125422 (2005)
https://doi.org/10.1103/PhysRevB.72.125422

Grazing incidence XAFS under non-specular conditions

Patrick Keil, Dirk Lützenkirchen-Hecht and Ronald Frahm
Physica B: Condensed Matter 357 (1-2) 1 (2005)
https://doi.org/10.1016/j.physb.2004.11.007

Characterization of nanostructure in Si1−xGex epilayers using x-ray reflectivity and fluorescence techniques

S. Kim, G. Kioseoglou, S. Huang, et al.
Journal of Applied Physics 98 (7) (2005)
https://doi.org/10.1063/1.2073976

An interfacial instability in a transient wetting layer leads to lateral phase separation in thin spin-cast polymer-blend films

Sasha Y. Heriot and Richard A. L. Jones
Nature Materials 4 (10) 782 (2005)
https://doi.org/10.1038/nmat1476

Determination of wafer bonding mechanisms for plasma activated SiN films with x-ray reflectivity

S Hayashi, R Sandhu, M Wojtowicz, Y Sun, R Hicks and M S Goorsky
Journal of Physics D: Applied Physics 38 (10A) A174 (2005)
https://doi.org/10.1088/0022-3727/38/10A/033

Compact extreme ultraviolet reflectometer for the characterization of grazing incidence optics based on a gas discharge light source

Klaus Bergmann, Oliver Rosier and Christof Metzmacher
Review of Scientific Instruments 76 (4) (2005)
https://doi.org/10.1063/1.1884387

Microscopic Structure of Crystalline Langmuir Monolayers of Hydroxystearic Acids by X-ray Reflectivity and GID: OH Group Position and Dimensionality Effect

Luigi Cristofolini, Marco P. Fontana, Carla Boga and Oleg Konovalov
Langmuir 21 (24) 11213 (2005)
https://doi.org/10.1021/la0514213

Unpolarized and polarized neutron reflectometry for magnetic structure of nickel–copper multilayer film

Surendra Singh, Saibal Basu, A.K. Poswal and Mukul Gupta
Solid State Communications 136 (7) 400 (2005)
https://doi.org/10.1016/j.ssc.2005.08.027

Nonuniform and sequential magnetization reversal via domain structure formation for multilayered system with grain size induced enhanced exchange bias

A. Paul, E. Kentzinger, U. Rücker, D. E. Bürgler and P. Grünberg
The European Physical Journal B 45 (2) 249 (2005)
https://doi.org/10.1140/epjb/e2005-00056-0

Si/Si1 − x Gex Superlattice Structure from X-ray-Scattering Data

S. N. Yakunin, E. M. Pashaev, A. A. Zaitsev, I. A. Subbotin, M. M. Rzaev and R. M. Imamov
Russian Microelectronics 34 (4) 242 (2005)
https://doi.org/10.1007/s11180-005-0034-3

Specular reflection of neutrons from potentials with smooth boundaries

D.A. Korneev, V.K. Ignatovich, S.P. Yaradaykin and V.I. Bodnarchuk
Physica B: Condensed Matter 364 (1-4) 99 (2005)
https://doi.org/10.1016/j.physb.2005.03.041

Room-temperature epitaxial growth of GaN on lattice-matched ZrB2 substrates by pulsed-laser deposition

Y. Kawaguchi, J. Ohta, A. Kobayashi and H. Fujioka
Applied Physics Letters 87 (22) (2005)
https://doi.org/10.1063/1.2137876

Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

Amitesh Paul, Daniel E. Bürgler and Peter Grünberg
Journal of Magnetism and Magnetic Materials 286 216 (2005)
https://doi.org/10.1016/j.jmmm.2004.09.054

A microfluidic setup for studies of solid-liquid interfaces using x-ray reflectivity and fluorescence microscopy

Christian Reich, Marion B. Hochrein, Bärbel Krause and Bert Nickel
Review of Scientific Instruments 76 (9) (2005)
https://doi.org/10.1063/1.2040187

Matthew Wormington, Kevin M. Matney and D. Keith Bowen
463 (2005)
https://doi.org/10.1007/3-540-31306-0_16

Modern Techniques for Characterizing Magnetic Materials

Modern Techniques for Characterizing Magnetic Materials 107 (2005)
https://doi.org/10.1007/0-387-23395-4_3

P. Zaumseil
497 (2005)
https://doi.org/10.1007/1-84628-235-7_40

The width of the water/2-heptanone liquid–liquid interface

Guangming Luo, Sarka Malkova, Sai Venkatesh Pingali, David G. Schultz, Binhua Lin, Mati Meron, Timothy J. Graber, Jeffrey Gebhardt, Petr Vanysek and Mark L. Schlossman
Electrochemistry Communications 7 (6) 627 (2005)
https://doi.org/10.1016/j.elecom.2005.04.012

Selective study of atoms in rough surfaces by means of off-specular grazing incidence XAFS

P Keil, D Lützenkirchen-Hecht and R Frahm
Europhysics Letters (EPL) 71 (1) 77 (2005)
https://doi.org/10.1209/epl/i2005-10055-9

Smoothening of internal phase boundaries by ion bombardment

J. Petersen and S. G. Mayr
Journal of Applied Physics 98 (3) (2005)
https://doi.org/10.1063/1.1994937

In Situ Investigations on Organic Foam Films Using Neutron and Synchrotron Radiation

Janine Etrillard, Monique A. V. Axelos, Isabelle Cantat, et al.
Langmuir 21 (6) 2229 (2005)
https://doi.org/10.1021/la0477338

Neutron Reflectometry and Spectroscopic Ellipsometry Studies of Cross-Linked Poly(dimethylsiloxane) after Irradiation at 172 nm

Vera-Maria Graubner, Daniel Clemens, Thomas Gutberlet, et al.
Langmuir 21 (19) 8940 (2005)
https://doi.org/10.1021/la051086i

X-ray Reflectivity and Interfacial Tension Study of the Structure and Phase Behavior of the Interface between Water and Mixed Surfactant Solutions of CH3(CH2)19OH and CF3(CF2)7(CH2)2OH in Hexane

Sai Venkatesh Pingali, Takanori Takiue, Guangming Luo, et al.
The Journal of Physical Chemistry B 109 (3) 1210 (2005)
https://doi.org/10.1021/jp045887q

Nuclear Resonant Reflectivity Investigations of a Thin Magnetic 57Fe Layer Adjacent to a Superconducting V Layer

M. A. Andreeva, L. Häggström, B. Lindgren, B. Kalska, A.-M. Blixt, S. Kamali, O. Leupold and R. Rüffer
Hyperfine Interactions 156-157 (1-4) 607 (2004)
https://doi.org/10.1023/B:HYPE.0000043282.96294.40

Magnetization reversal in an obliquely oriented metal evaporated tape

S Srinath, P Vavassori, M.Th Rekveldt, R.E Cook and G.P Felcher
Journal of Magnetism and Magnetic Materials 279 (2-3) 440 (2004)
https://doi.org/10.1016/j.jmmm.2004.02.014

LB Films of Rodlike Phthalocyanine Aggregates: Specular X-ray Reflectivity Studies of the Effect of Interface Modification on Coherence and Microstructure

Wei Xia, Britt A. Minch, Michael D. Carducci and Neal R. Armstrong
Langmuir 20 (19) 7998 (2004)
https://doi.org/10.1021/la048736n

Magnetic degradation of anFeCo∕GaAsinterface

S. Park, M. R. Fitzsimmons, X. Y. Dong, B. D. Schultz and C. J. Palmstrøm
Physical Review B 70 (10) (2004)
https://doi.org/10.1103/PhysRevB.70.104406

X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materials

S. Ferrari, M. Modreanu, G. Scarel and M. Fanciulli
Thin Solid Films 450 (1) 124 (2004)
https://doi.org/10.1016/j.tsf.2003.10.051

Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique

S. Banerjee, S. Ferrari, D. Chateigner and A. Gibaud
Thin Solid Films 450 (1) 23 (2004)
https://doi.org/10.1016/j.tsf.2003.10.042

Superconducting∕ferromagnetic proximity effect mediated byCrspacer layers

I. A. Garifullin, D. A. Tikhonov, N. N. Garif’yanov, M. Z. Fattakhov, L. R. Tagirov, K. Theis-Bröhl, K. Westerholt and H. Zabel
Physical Review B 70 (5) (2004)
https://doi.org/10.1103/PhysRevB.70.054505

Parameter detection of thin films from their X-ray reflectivity by support vector machines

Daniel J. Strauß, Gabriele Steidl and Udo Welzel
Applied Numerical Mathematics 48 (2) 223 (2004)
https://doi.org/10.1016/j.apnum.2003.07.002

Magnetism of uranium/iron multilayers: I. Fabrication and characterization

A M Beesley, M F Thomas, A D F Herring, et al.
Journal of Physics: Condensed Matter 16 (47) 8491 (2004)
https://doi.org/10.1088/0953-8984/16/47/004

ICAME 2003

M. A. Andreeva, L. Häggström, B. Lindgren, et al.
ICAME 2003 607 (2004)
https://doi.org/10.1007/978-1-4020-2852-6_86

Structural characterization of epitaxial Y2O3 on Si (0 0 1) and of the Y2O3/Si interface

S Spiga, C Wiemer, G Tallarida, M Fanciulli, M Malvestuto, F Boscherini, F D’Acapito, A Dimoulas, G Vellianitis and G Mavrou
Materials Science and Engineering: B 109 (1-3) 47 (2004)
https://doi.org/10.1016/j.mseb.2003.10.025

Neutron Reflectivity as Method to Study in‐Situ Adsorption of Phospholipid Layers to Solid‐Liquid Interfaces

T. Gutberlet, B. Klösgen, R. Krastev and R. Steitz
Advanced Engineering Materials 6 (10) 832 (2004)
https://doi.org/10.1002/adem.200400093

Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

S. Kim, Y. L. Soo, G. Kioseoglou, Y. H. Kao and A. D. Compaan
Journal of Applied Physics 96 (2) 1007 (2004)
https://doi.org/10.1063/1.1755852

Determining the density profile of confined polymer brushes with neutron reflectivity

W. A. Hamilton, G. S. Smith, N. A. Alcantar, et al.
Journal of Polymer Science Part B: Polymer Physics 42 (17) 3290 (2004)
https://doi.org/10.1002/polb.20170

Investigations of different trajectories of X-rays in capillaries

R. Mroczka, G. Żukociński and A. Kuczumow
Journal of Alloys and Compounds 362 (1-2) 88 (2004)
https://doi.org/10.1016/S0925-8388(03)00567-X

X-ray Nanoscale Profiling of Layer-by-Layer Assembled Metal/Organophosphonate Films

Joseph A. Libera, Richard W. Gurney, SonBinh T. Nguyen, et al.
Langmuir 20 (19) 8022 (2004)
https://doi.org/10.1021/la048904b

Structural characterization of SiGe and SiGe:C heterostructures using a combination of X-ray scattering methods

J. F. Woitok
Powder Diffraction 19 (1) 49 (2004)
https://doi.org/10.1154/1.1649320

pH and Down Load Effects on Silicon Dioxide Dielectric CMP

Wonseop Choi, Seung-Mahn Lee and Rajiv K. Singh
Electrochemical and Solid-State Letters 7 (7) G141 (2004)
https://doi.org/10.1149/1.1738472

Anisotropic Thermal Expansion Behavior of Thin Films of Polymethylsilsesquioxane, a Spin-on-Glass Dielectric for High-Performance Integrated Circuits

Weontae Oh and Moonhor Ree
Langmuir 20 (16) 6932 (2004)
https://doi.org/10.1021/la049581m

Orientational Tuning of Monolayers of Amphiphilic Ruthenium(II) Complexes for Optimizing Chirality Distinction Capability

Kenji Tamura, Hisako Sato, Satoko Yamashita, Akihiko Yamagishi and Hirohisa Yamada
The Journal of Physical Chemistry B 108 (24) 8287 (2004)
https://doi.org/10.1021/jp049349p

Annealing studies of high Ge composition Si/SiGe multilayers

Mojmír Meduňa, Jiří Novák, Günther Bauer, et al.
Zeitschrift für Kristallographie - Crystalline Materials 219 (4) 195 (2004)
https://doi.org/10.1524/zkri.219.4.195.30440

Temperature evolution of theGdmagnetization profile in strongly coupledGd∕Femultilayers

Y. Choi, D. Haskel, R. E. Camley, D. R. Lee, J. C. Lang, G. Srajer, J. S. Jiang and S. D. Bader
Physical Review B 70 (13) (2004)
https://doi.org/10.1103/PhysRevB.70.134420

Swelling Behavior of Self-Assembled Monolayers of Alkanethiol-Terminated Poly(ethylene glycol): A Neutron Reflectometry Study

J. Fick, R. Steitz, V. Leiner, et al.
Langmuir 20 (10) 3848 (2004)
https://doi.org/10.1021/la049526d

Molecular ordering and phase transitions in alkanol monolayers at the water–hexane interface

Aleksey M. Tikhonov, Sai Venkatesh Pingali and Mark L. Schlossman
The Journal of Chemical Physics 120 (24) 11822 (2004)
https://doi.org/10.1063/1.1752888

Structural Characterization of Organic Multilayers on Silicon(111) Formed by Immobilization of Molecular Films on Functionalized Si−C Linked Monolayers

Till Böcking, Michael James, Hans G. L. Coster, Terry C. Chilcott and Kevin D. Barrow
Langmuir 20 (21) 9227 (2004)
https://doi.org/10.1021/la048474p

Application of X-ray scattering methods to the analysis of Si-based heterostructures

J.F. Woitok
Thin Solid Films 450 (1) 138 (2004)
https://doi.org/10.1016/j.tsf.2003.10.058

Structural evolution of nanocrystalline/amorphous Fe/Ni75B25 multilayers: temperature dependence of electrical resistivity

R Mustafa Öksüzoglu
Solid State Communications 131 (1) 11 (2004)
https://doi.org/10.1016/j.ssc.2004.04.024

Oscillations of the critical temperature in superconducting Nb/Ni bilayers

A.S. Sidorenko, V.I. Zdravkov, A.A. Prepelitsa, et al.
Annalen der Physik 515 (1-2) 37 (2003)
https://doi.org/10.1002/andp.200351501-203

Characterization of MOVPE grown AlN/GaN heterointerfaces by grazing incidence X‐ray reflectivity. Alloy formation at heterointerfaces

Masanobu Hiroki and Naoki Kobayashi
physica status solidi (c) (7) 2051 (2003)
https://doi.org/10.1002/pssc.200303287

Effects of annealing temperature and surface preparation on the formation of cobalt silicide interconnects

C Wiemer, G Tallarida, E Bonera, E Ricci, M Fanciulli, G.F Mastracchio, G Pavia and S Marangon
Microelectronic Engineering 70 (2-4) 233 (2003)
https://doi.org/10.1016/S0167-9317(03)00429-5

X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. I. Specular reflectivity

D. R. Lee, S. K. Sinha, D. Haskel, Y. Choi, J. C. Lang, S. A. Stepanov and G. Srajer
Physical Review B 68 (22) (2003)
https://doi.org/10.1103/PhysRevB.68.224409

Influence of defects on the formation of thin porous GaP(001) films

V. A. Karavanskii, A. A. Lomov, A. G. Sutyrin, R. M. Imamov, V. I. Dravin, N. N. Mel’nik and T. N. Zavaritskaya
Crystallography Reports 48 (5) 851 (2003)
https://doi.org/10.1134/1.1612605

Early growth stages of sputter deposited Ag on native SiO2

S Banerjee and S Kundu
Surface Science 537 (1-3) 153 (2003)
https://doi.org/10.1016/S0039-6028(03)00612-5

Correlation of magnetotransport and structure in sputtered Co/Cu multilayers

Amitesh Paul, Thorsten Damm, Daniel E B rgler, Simon Stein, Hermann Kohlstedt and Peter Gr nberg
Journal of Physics: Condensed Matter 15 (17) 2471 (2003)
https://doi.org/10.1088/0953-8984/15/17/304

Structural study of self-assembled Co nanoparticles

Y. Chushkin, M. Ulmeanu, S. Luby, E. Majkova, I. Kostic, P. Klang, V. Holý, Z. Bochnı́ček, M. Giersig, M. Hilgendorff and T. H. Metzger
Journal of Applied Physics 94 (12) 7743 (2003)
https://doi.org/10.1063/1.1627953

Analysis of InGaN/GaN single quantum wells by X‐ray scattering and transmission electron microscopy

T. M. Smeeton, M. J. Kappers, J. S. Barnard, M. E. Vickers and C. J. Humphreys
physica status solidi (b) 240 (2) 297 (2003)
https://doi.org/10.1002/pssb.200303262

Analytical ansatz for self-consistent calculations of x-ray transmission and reflection coefficients at graded interfaces

I. D. Feranchuk, S. I. Feranchuk, L. Komarov, S. Sytova and A. Ulyanenkov
Physical Review B 67 (23) (2003)
https://doi.org/10.1103/PhysRevB.67.235417

In Situ Study of the Surface Oxidation of FeCr Alloys Using Grazing Incidence X‐ray Absorption Spectroscopy (GIXAS)

Joachim Janssen, Holger Rumpf, Hartwig Modrow, et al.
Zeitschrift für anorganische und allgemeine Chemie 629 (10) 1701 (2003)
https://doi.org/10.1002/zaac.200300134

Length-scale dependent variation of the first nucleated phase in nickel–silicon multilayers

Jacob M. Jensen, Xavier J. Kyablue, Sochetra Ly and David C. Johnson
Journal of Applied Physics 94 (2) 1252 (2003)
https://doi.org/10.1063/1.1586465

Nondestructive Characterization of Nanostructure in Layered Materials Using Synchrotron Radiation

Y. H. Kao, S. Kim and Y. L. Soo
International Journal of Nanoscience 02 (01n02) 85 (2003)
https://doi.org/10.1142/S0219581X03001115

Ultra-thin titanium oxide film with a rutile-type structure

Masahiko Hiratani, Masaru Kadoshima, Tatsumi Hirano, Yasuhiro Shimamoto, Yuichi Matsui, Toshihide Nabatame, Kazuyoshi Torii and Shinichiro Kimura
Applied Surface Science 207 (1-4) 13 (2003)
https://doi.org/10.1016/S0169-4332(02)01228-X

Characterization of molybdenum/silicon X-ray multilayers

M. Nayak, M.H. Modi, G.S. Lodha, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 199 128 (2003)
https://doi.org/10.1016/S0168-583X(02)01547-1

Self-Assembly of Amphiphilic Poly(paraphenylene)s: Thermotropic Phases, Solution Behavior, and Monolayer Films

Tobias Fütterer, Thomas Hellweg, Gerhard H. Findenegg, et al.
Langmuir 19 (16) 6537 (2003)
https://doi.org/10.1021/la026409e

High-throughput, high-resolution Kirkpatrick–Baez microscope for advanced streaked imaging of ICF experiments on OMEGA

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