Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
Rev. Phys. Appl. (Paris), 15 3 (1980) 761-779
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Noncapillary-Wave Structure at the Water-Alkane Interface
Dragoslav M. Mitrinović, Aleksey M. Tikhonov, Ming Li, Zhengqing Huang and Mark L. SchlossmanPhysical Review Letters 85 (3) 582 (2000)
https://doi.org/10.1103/PhysRevLett.85.582
The fragile magnetic structures of Fe/CeH2−δ multilayers
W Lohstroh, O Schulte, W Felsch, F Klose, H Maletta, G.P Felcher and H LauterJournal of Magnetism and Magnetic Materials 210 (1-3) 357 (2000)
https://doi.org/10.1016/S0304-8853(99)00760-X
Using x-ray reflectivity to determine the structure of surfactant monolayers
B. B. Luokkala, S. Garoff and R. M. SuterPhysical Review E 62 (2) 2405 (2000)
https://doi.org/10.1103/PhysRevE.62.2405
Optical and structural characterization of Si/SiGe heterostructures grown by RTCVD
T Sidiki, S.H Christiansen, S Chabert, W.B de Boer, C Ferrari, H.P Strunk and C.M Sotomayor TorresThin Solid Films 369 (1-2) 431 (2000)
https://doi.org/10.1016/S0040-6090(00)00907-X
Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles
Anton Plech, Tim Salditt, Christian Münster and Johann PeislJournal of Colloid and Interface Science 223 (1) 74 (2000)
https://doi.org/10.1006/jcis.1999.6627
Investigation of Multi-wave X-Ray Reflectometry.
K. Usami, T. Hirano, N. Kobayashi, Y. Tajima and T. ImagawaJournal of the Magnetics Society of Japan 24 (4−2) 551 (2000)
https://doi.org/10.3379/jmsjmag.24.551
Superconductor/ferromagnet proximity effect in Fe/Pb/Fe trilayers
L. Lazar, K. Westerholt, H. Zabel, L. R. Tagirov, Yu. V. Goryunov, N. N. Garif’yanov and I. A. GarifullinPhysical Review B 61 (5) 3711 (2000)
https://doi.org/10.1103/PhysRevB.61.3711
Interdiffusion in amorphous Nb/Si multilayers
Zdeněk Bochnı́ček and Ivo VávraMaterials Letters 45 (2) 120 (2000)
https://doi.org/10.1016/S0167-577X(00)00089-6
Heat resistance of electron beam deposited Mo/C X-ray multilayers
N Suresh, M.H Modi, P Tripathi, et al.Thin Solid Films 368 (1) 80 (2000)
https://doi.org/10.1016/S0040-6090(00)00925-1
Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics
D. L. Windt, F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M. Jimenez-Garate, R. Kalyanaraman and P. H. MaoJournal of Applied Physics 88 (1) 460 (2000)
https://doi.org/10.1063/1.373681
Asymptotic form of the reciprocity theorem with applications in x-ray scattering
Ariel CatichaPhysical Review B 62 (6) 3639 (2000)
https://doi.org/10.1103/PhysRevB.62.3639
Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films
W.X Yu, S.F Cui, J.H Li, L.S Wu, Z.H Mai, B.T Liu, B.R Zhao, W.L Zheng and Q.J JiaPhysica C: Superconductivity 337 (1-4) 39 (2000)
https://doi.org/10.1016/S0921-4534(00)00052-6
271 (2000)
https://doi.org/10.1016/B978-012617560-8/50015-3
Surface adsorption layer of propylene on polyimide
T Miyazaki, A Shimazu and K IkedaPolymer 41 (22) 8167 (2000)
https://doi.org/10.1016/S0032-3861(00)00189-0
X-RAY REFLECTIVITY STUDY OF TETRAHEDRAL AMORPHOUS CARBON FILMS
B. K. Tay, X. Shi, S. P. Lau, Q. Zhang, H. C. Chua, J. R. Shi, E. C. Lim and H. Y. LeeInternational Journal of Modern Physics B 14 (02n03) 181 (2000)
https://doi.org/10.1142/S0217979200000170
Fabrication, performance, and figure metrology of epoxy-replicated aluminum foils for hard x-ray focusing multilayer-coated segmented conical optics
Mario A. Jimenez-GarateOptical Engineering 39 (11) 2982 (2000)
https://doi.org/10.1117/1.1315572
Impact of the SiGe/Si interface structure upon the low temperature photoluminescence of a Si/Si1−xGex multiple quantum well
T.P Sidiki, C Ferrari, S Christiansen, et al.Materials Science in Semiconductor Processing 3 (5-6) 389 (2000)
https://doi.org/10.1016/S1369-8001(00)00061-5
In situ growth study of NiMnSb films on MgO(001) and Si(001)
J.-P. Schlomka, M. Tolan and W. PressApplied Physics Letters 76 (15) 2005 (2000)
https://doi.org/10.1063/1.126236
High-resolution x-ray scattering measurements: I. Surfaces
J Daillant and M AlbaReports on Progress in Physics 63 (10) 1725 (2000)
https://doi.org/10.1088/0034-4885/63/10/203
Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods
A. A. Lomov, V. A. Bushuev and V. A. KaravanskiiCrystallography Reports 45 (5) 842 (2000)
https://doi.org/10.1134/1.1312933
X-Ray reflectivity study of polyimide thin films swollen by 1,3-butadiene andn-butane
Tsukasa Miyazaki, Akira Shimazu, Tomoko Matsushita and Ken-Ichi IkedaJournal of Applied Polymer Science 78 (10) 1818 (2000)
https://doi.org/10.1002/1097-4628(20001205)78:10<1818::AID-APP140>3.0.CO;2-L
Evolution of the surface roughness (dynamic scaling) and microstructure of sputter-deposited Ag75Co25granular films
R Mustafa Öksüzoglu, Ayhan Elmali, Thomas E Weirich, Hartmut Fuess and Horst HahnJournal of Physics: Condensed Matter 12 (44) 9237 (2000)
https://doi.org/10.1088/0953-8984/12/44/306
Interface Effects on Magnetic and Magneto-Optical Properties in TbFeCo/Pt Multilayers.
Yusuke Itoh, William Van Drent, Masahiro Birukawa, Katsuaki Sato and Takao SuzukiJournal of the Magnetics Society of Japan 24 (11) 1367 (2000)
https://doi.org/10.3379/jmsjmag.24.1367
Evaluation of polishing damage in alumina
I. Pape, C. W. Lawrence, P. D. Warren, S. G. Roberts, G. A. D. Briggs, O. V. Kolosov, A. W. Hey, C. F. Paines and B. K. TannerPhilosophical Magazine A 80 (8) 1913 (2000)
https://doi.org/10.1080/01418610008219094
Wetting transition of a binary liquid mixture at a solid boundary
A Plech, U Klemradt, M Huber and J PeislEurophysics Letters (EPL) 49 (5) 583 (2000)
https://doi.org/10.1209/epl/i2000-00190-3
Adsorption and Desorption Behavior of an Anionic Pyrene Chromophore in Sequentially Deposited Polyelectrolyte-Dye Thin Films
Concetta Tedeschi, Frank Caruso, Helmuth Möhwald and Stefan KirsteinJournal of the American Chemical Society 122 (24) 5841 (2000)
https://doi.org/10.1021/ja994029i
An X-ray Reflectivity Study of the Water-Docosane Interface
Aleksey M. Tikhonov, Dragoslav M. Mitrinovic, Ming Li, Zhengqing Huang and Mark L. SchlossmanThe Journal of Physical Chemistry B 104 (27) 6336 (2000)
https://doi.org/10.1021/jp001377u
Amphiphilic Phenylene−Ethynylene Oligomers in Langmuir−Blodgett Films. Self-Assembling Multilayers for Electroluminescent Devices
E. Arias-Marin, J. C. Arnault, D. Guillon, et al.Langmuir 16 (9) 4309 (2000)
https://doi.org/10.1021/la991313e
Structural and magnetic studies of exchange bias films of Ir(20)Mn(80)
S.-F. Cheng and P. LubitzJournal of Applied Physics 87 (9) 4927 (2000)
https://doi.org/10.1063/1.373205
Magnetotunneling in sputtered La0.7Ca0.3MnO3/Al2O3 multilayers
Y. Luo, A. Käufler and K. SamwerApplied Physics Letters 77 (10) 1508 (2000)
https://doi.org/10.1063/1.1290718
Electron density fluctuations at interfaces in Nb/Si bilayer, trilayer, and multilayer films: An x-ray reflectivity study
N. Suresh, D. M. Phase, Ajay Gupta and S. M. ChaudhariJournal of Applied Physics 87 (11) 7946 (2000)
https://doi.org/10.1063/1.373479
X-Ray Scattering from Liquid–Liquid Interfaces
Mark L Schlossman, Ming Li, Dragoslav M Mitrinovic and Aleksey M TikhonovHigh Performance Polymers 12 (4) 551 (2000)
https://doi.org/10.1088/0954-0083/12/4/310
Characterization of Tin Oxide Based Sol-Gel Coatings on Borosilicate Glasses by X-Ray Reflectivity
A.P. Rizzato, C.V. Santilli and S.H. PulcinelliJournal of Sol-Gel Science and Technology 19 (1-3) 811 (2000)
https://doi.org/10.1023/A:1008724503396
Enhanced reflectance X-ray absorption fine structure sensitivity using a whispering-gallery waveguide
V.A Chernov, S.K Kim, N.V Kovalenko and K.V ZolotarevNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 448 (1-2) 173 (2000)
https://doi.org/10.1016/S0168-9002(00)00216-3
Magnetic anisotropy and layer-selective magnetometry of Cu/Co/Ni/Cu/Si (001)
G. Lauhoff, J. Lee, J.A.C. Bland, S. Langridge and J. PenfoldJournal of Magnetism and Magnetic Materials 198-199 331 (1999)
https://doi.org/10.1016/S0304-8853(98)01131-7
Perpendicular magnetic anisotropy and the reorientation transition of the magnetization inCeH2/Femultilayers probed by x-ray magnetic circular dichroism
M. Arend, W. Felsch, G. Krill, A. Delobbe, F. Baudelet, E. Dartyge, J.-P. Kappler, M. Finazzi, A. San Miguel-Fuster, S. Pizzini and A. FontainePhysical Review B 59 (5) 3707 (1999)
https://doi.org/10.1103/PhysRevB.59.3707
Neutron polarizing Fe/Si mirrors at ILL
P Høghøj, I Anderson, R Siebrecht, W Graf and K Ben-SaidanePhysica B: Condensed Matter 267-268 355 (1999)
https://doi.org/10.1016/S0921-4526(99)00038-1
Advanced characterization tools for thin films in low- E systems
H Weis, T Müggenburg, P Grosse, L Herlitze, I Friedrich and M WuttigThin Solid Films 351 (1-2) 184 (1999)
https://doi.org/10.1016/S0040-6090(99)00306-5
X-ray and Neuron Reflectivity: Principles and Applications
Jean Daillant and Anne SentenacLecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 121 (1999)
https://doi.org/10.1007/3-540-48696-8_4
Photoisomerization of Polyionic Layer-by-Layer Films Containing Azobenzene
Silvia Dante, Rigoberto Advincula, Curtis W. Frank and Pieter StroeveLangmuir 15 (1) 193 (1999)
https://doi.org/10.1021/la980497e
Interdiffusion in nanometer-scale multilayers investigated byin situlow-angle x-ray diffraction
Wei-Hua Wang, Hai Yang Bai, Ming Zhang, J. H. Zhao, X. Y. Zhang and W. K. WangPhysical Review B 59 (16) 10811 (1999)
https://doi.org/10.1103/PhysRevB.59.10811
Properties of stacked dielectric films composed of SiO2/Si3N4/SiO2
S. Santucci, L. Lozzi, M. Passacantando, et al.Journal of Non-Crystalline Solids 245 (1-3) 224 (1999)
https://doi.org/10.1016/S0022-3093(98)00886-2
Interface investigations by infrared spectroscopy and X-ray reflectivity measurements of cubic boron nitride thin films
S. Ulrich, W. Donner, H. Dosch, H. Ehrhardt and J. SchwanSurface and Coatings Technology 116-119 274 (1999)
https://doi.org/10.1016/S0257-8972(99)00356-4
Strain relaxation of Al Ga1−N epitaxial layers on GaN and SiC substrates
J Domagala, M Leszczynski, P Prystawko, T Suski, R Langer, A Barski and M BremserJournal of Alloys and Compounds 286 (1-2) 284 (1999)
https://doi.org/10.1016/S0925-8388(98)01022-6
Perpendicular magnetic anisotropy of exchange coupled Co/Cu/Ni/Cu/Si(001) structures
G. Lauhoff, J. Lee, W. Y. Lee, A. Hirohata, A. Samad, J. A. C. Bland, S. Langridge and J. penfoldJournal of the Magnetics Society of Japan 23 (1_2) 572 (1999)
https://doi.org/10.3379/jmsjmag.23.572
Stratification in Monolayers of a Bidisperse Melt Polymer Brush As Revealed by Neutron Reflectivity
Werner A. Goedel, Clarisse Luap, Ralf Oeser, et al.Macromolecules 32 (22) 7599 (1999)
https://doi.org/10.1021/ma981900r
X-ray scattering from single liquid-liquid interfaces
Mark L. Schlossman, Dragoslav M. Mitrinovic, Zhongjian Zhang, Ming Li and Zhengqing HuangSynchrotron Radiation News 12 (2) 53 (1999)
https://doi.org/10.1080/08940889908260989
Diffuse x-ray reflection from multilayers with rough interfaces
V. Holy´Journal of Materials Science: Materials in Electronics 10 (3) 223 (1999)
https://doi.org/10.1023/A:1008904330449
Strain relaxation in AlN epitaxial layers grown on GaN single crystals
R Langer, A Barski, A Barbier, et al.Journal of Crystal Growth 205 (1-2) 31 (1999)
https://doi.org/10.1016/S0022-0248(99)00240-7
Growth and structural characterization of Pb/Fe layered system
L. Lazar, K. Westerholt, H. Zabel, Yu.V. Goryunov and I.A. GarifullinThin Solid Films 354 (1-2) 93 (1999)
https://doi.org/10.1016/S0040-6090(99)00568-4
https://doi.org/10.1007/BFb0109396
Roughness of free surfaces of bulk amorphous polymers as studied by x-ray surface scattering and atomic force microscopy
V. W. Stone, A. M. Jonas, B. Nysten and R. LegrasPhysical Review B 60 (8) 5883 (1999)
https://doi.org/10.1103/PhysRevB.60.5883
X-ray scattering from monolayers of F(CF2)10(CH2)2OH at the water–(hexane solution) and water–vapor interfaces
Zhongjian Zhang, Dragoslav M. Mitrinovic, Scott M. Williams, Zhengqing Huang and Mark L. SchlossmanThe Journal of Chemical Physics 110 (15) 7421 (1999)
https://doi.org/10.1063/1.478644
In situ synchrotron x-ray reflectivity study of the oligoclase feldspar mineral–fluid interface
Morag L. Farquhar, Roy A. Wogelius and Chiu C. TangGeochimica et Cosmochimica Acta 63 (10) 1587 (1999)
https://doi.org/10.1016/S0016-7037(99)00106-4
X-ray reflectivity of zirconia based sol–gel coatings on borosilicate glasses
A.P. Rizzato, C.V. Santilli and S.H. PulcinelliJournal of Non-Crystalline Solids 247 (1-3) 158 (1999)
https://doi.org/10.1016/S0022-3093(99)00057-5
Surface roughness of thin layers—a comparison of XRR and SFM measurements
O. Filies, O. Böling, K. Grewer, J. Lekki, M. Lekka, Z. Stachura and B. CleffApplied Surface Science 141 (3-4) 357 (1999)
https://doi.org/10.1016/S0169-4332(98)00524-8
X-ray and Neuron Reflectivity: Principles and Applications
Tilo Baumbach and Petr MikulikLecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 232 (1999)
https://doi.org/10.1007/3-540-48696-8_8
Optimization of graded multilayer designs for astronomical x-ray telescopes
Peter H. Mao, Fiona A. Harrison, David L. Windt and Finn E. ChristensenApplied Optics 38 (22) 4766 (1999)
https://doi.org/10.1364/AO.38.004766
Specular and non-specular x-ray scattering study of SiO2/Si structures
A Ulyanenkov, K Omote, R Matsuo, J Harada and S-Y MatsunoJournal of Physics D: Applied Physics 32 (12) 1313 (1999)
https://doi.org/10.1088/0022-3727/32/12/306
Refracted X-Ray Fluorescence (RXF) Applied to the Study of Thin Films and Thermally-Grown Oxide Scales
I. Koshelev, A. P. Paulikas and B. W. VealOxidation of Metals 51 (1-2) 23 (1999)
https://doi.org/10.1023/A:1018898018004
Surface effects of heat treatments in active atmosphere on structural, morphological and electrical characteristics of CuInS2thin films
M. Kanzari, M. Abaab, B. Rezig and M. BrunelThe European Physical Journal Applied Physics 6 (2) 141 (1999)
https://doi.org/10.1051/epjap:1999163
Structural assembly of Cd-arachidate molecules in multilayers
Satish Vitta, T. H. Metzger and S. S. MajorThe Journal of Chemical Physics 111 (24) 11088 (1999)
https://doi.org/10.1063/1.480467
The atomic form factor and the X-ray dispersion corrections as tensor quantities: comparisons between theory and experiment
D.C. CreaghRadiation Physics and Chemistry 56 (1-2) 61 (1999)
https://doi.org/10.1016/S0969-806X(99)00288-1
Characterization of structures from X-ray scattering data using genetic algorithms
D. K. Bowen, B. K. Tanner, Matthew Wormington, Charles Panaccione, Kevin M. Matney and D. Keith BowenPhilosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 357 (1761) 2827 (1999)
https://doi.org/10.1098/rsta.1999.0469
Long-term stability of a quasiperiodic Ta/Al multilayer: Disintegration at room temperature analyzed by grazing angle x-ray scattering and photoelectron spectroscopy
P. Yang, U. Klemradt, Y. Tao, J. Peisl, R. W. Peng, A. Hu and S. S. JiangJournal of Applied Physics 86 (1) 267 (1999)
https://doi.org/10.1063/1.370725
Study of hydrogenated diamond-like carbon films using x-ray reflectivity
Qing Zhang, S. F. Yoon, Rusli, J. Ahn, H. Yang and D. BahrJournal of Applied Physics 86 (1) 289 (1999)
https://doi.org/10.1063/1.370792
X-ray and Neuron Reflectivity: Principles and Applications
Jean-Marc Gay and Laurent LapenaLecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 217 (1999)
https://doi.org/10.1007/3-540-48696-8_7
Variational Approach to X-Ray Diffuse Scattering
S.S. Fanchenko and A.A. Nefedovphysica status solidi (b) 212 (1) R3 (1999)
https://doi.org/10.1002/(SICI)1521-3951(199903)212:1
In situspecular and diffuse x-ray reflectivity study of growth dynamics in quench-condensed xenon films
Ralf K. Heilmann and Robert M. SuterPhysical Review B 59 (4) 3075 (1999)
https://doi.org/10.1103/PhysRevB.59.3075
X-RAY SMALL-ANGLE REFLECTION AND HIGH-ANGLE DIFFRACTION STUDIES ON Co/Cu MAGNETIC MULTILAYERS
X. S. WU, Q. S. BIE, Z. S. LIN, et al.Modern Physics Letters B 13 (09n10) 325 (1999)
https://doi.org/10.1142/S0217984999000427
Instrumental aspects of x-ray microbeams in the range above 1 keV
P. Dhez, P. Chevallier, T. B. Lucatorto and C. TarrioReview of Scientific Instruments 70 (4) 1907 (1999)
https://doi.org/10.1063/1.1149733
X-ray Reflectivity Study of the Water−Hexane Interface
Dragoslav M. Mitrinovic, Zhongjian Zhang, Scott M. Williams, Zhengqing Huang and Mark L. SchlossmanThe Journal of Physical Chemistry B 103 (11) 1779 (1999)
https://doi.org/10.1021/jp984640o
Magnetic anisotropy, magnetic moments and coupling of Cu/Co/Cu/Ni/Cu(001) trilayer
G Lauhoff, A Hirohita, J A C Bland, J Lee, S Langridge and J PenfoldJournal of Physics: Condensed Matter 11 (35) 6707 (1999)
https://doi.org/10.1088/0953-8984/11/35/309
X-ray scattering from silicon surfaces: a useful tool for quality control
R Stömmer, A.R Martin, W Hub, H Göbel and U PietschMicroelectronic Engineering 45 (2-3) 257 (1999)
https://doi.org/10.1016/S0167-9317(99)00170-7
Light scattering by a two‐dimensional, rough penetrable medium: A mean‐field theory
O. Calvo‐Perez, A. Sentenac and J.‐J. GreffetRadio Science 34 (2) 311 (1999)
https://doi.org/10.1029/1998RS900027
Giant magnetoresistance dependence on the lateral correlation length of the interface roughness in magnetic superlattices
R. Schad, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, H. E. Fischer, S. Lefebvre and M. BessierePhysical Review B 59 (2) 1242 (1999)
https://doi.org/10.1103/PhysRevB.59.1242
Origin of the Co uniaxial volume anisotropy of the fcc Co/Ni/Cu(001) system
G. Lauhoff, J. A. C. Bland, J. Lee, S. Langridge and J. PenfoldPhysical Review B 60 (6) 4087 (1999)
https://doi.org/10.1103/PhysRevB.60.4087
Comment on ‘X-ray scattering from a randomly rough surface’
Dick K G de BoerWaves in Random Media 9 (3) 459 (1999)
https://doi.org/10.1088/0959-7174/9/3/401
Magnetic configurations in exchange-biased double superlattices
S. G. E. te Velthuis, G. P. Felcher, J. S. Jiang, A. Inomata, C. S. Nelson, A. Berger and S. D. BaderApplied Physics Letters 75 (26) 4174 (1999)
https://doi.org/10.1063/1.125573
Grazing incidence small angle x-ray scattering from free-standing nanostructures
Markus Rauscher, Rogerio Paniago, Hartmut Metzger, Zoltan Kovats, Jan Domke, Johann Peisl, Hans-Dieter Pfannes, Jörg Schulze and Ignaz EiseleJournal of Applied Physics 86 (12) 6763 (1999)
https://doi.org/10.1063/1.371724
Review on grazing incidence X-ray spectrometry and reflectometry
Krassimir N. Stoev and Kenji SakuraiSpectrochimica Acta Part B: Atomic Spectroscopy 54 (1) 41 (1999)
https://doi.org/10.1016/S0584-8547(98)00160-8
Coatings on Glass 1998
H. Weis, T. Müggenburg, P. Grosse, et al.Coatings on Glass 1998 277 (1999)
https://doi.org/10.1016/B978-044450247-6.50056-4
Theory of X-ray grazing incidence reflection in the presence of nuclear resonance excitation
R. RöhlsbergerHyperfine Interactions 123-124 (1-4) 301 (1999)
https://doi.org/10.1023/A:1017063605078
58 163 (1999)
https://doi.org/10.1007/3-540-48696-8_5
X-ray and Neuron Reflectivity: Principles and Applications
Alain GibaudLecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 87 (1999)
https://doi.org/10.1007/3-540-48696-8_3
High-density transition layer in oxynitride interfaces on Si(100)
J. Wang, D. R. Lee, C. Park, Y. H. Jeong, K.-B. Lee, Y. J. Park, S. B. Youn, J.-C. Park, H. M. Choi and Y.-J. HuhApplied Physics Letters 75 (24) 3775 (1999)
https://doi.org/10.1063/1.125452
Anomalous neutron reflectivity of H2O–D2O mixtures at the silicon/liquid interface
R.M.F Streffer, T Abdul Redah, J Bowers, et al.Physica B: Condensed Matter 266 (3) 198 (1999)
https://doi.org/10.1016/S0921-4526(98)01183-1
Charge-magnetic roughness correlations in an Fe/Gd multilayer
C. S. Nelson, G. Srajer, J. C. Lang, C. T. Venkataraman, S. K. Sinha, H. Hashizume, N. Ishimatsu and N. HosoitoPhysical Review B 60 (17) 12234 (1999)
https://doi.org/10.1103/PhysRevB.60.12234
Metal/Al 2 O 3 multilayers: Interface structure, thermal stability and reflectivities in the soft x-ray regime
M. Veldkamp, H. Zabel, F. Schäfers and H.-Ch. MertinsJournal of Applied Physics 84 (6) 3147 (1998)
https://doi.org/10.1063/1.368469
A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates
L. Méchin, A. Chabli, F. Bertin, M. Burdin, G. Rolland, C. Vannuffel and J.-C. VillégierJournal of Applied Physics 84 (9) 4935 (1998)
https://doi.org/10.1063/1.368738
Optical emission spectroscopy study of a radio-frequency magnetron discharge used for the fabrication of X-ray multilayer mirror
M. Cilia, A. Yakshin, H. Trambly, B. Vidal and J. BretagneThin Solid Films 312 (1-2) 320 (1998)
https://doi.org/10.1016/S0040-6090(97)00417-3
IMD—Software for modeling the optical properties of multilayer films
David L. WindtComputers in Physics 12 (4) 360 (1998)
https://doi.org/10.1063/1.168689
An analysis of Ag/Al2O3 angular selective films by X-ray reflectivity
S. Dligatch, R.W. Cheary and G.B. SmithThin Solid Films 312 (1-2) 4 (1998)
https://doi.org/10.1016/S0040-6090(97)00334-9
High-resolution x-ray scattering study of platinum thin films on sapphire
A Nefedov, A Abromeit, Ch Morawe and A StierleJournal of Physics: Condensed Matter 10 (4) 717 (1998)
https://doi.org/10.1088/0953-8984/10/4/002
Magnetic behavior of probe layers of57Fein thin Fe films observed by means of nuclear resonant scattering of synchrotron radiation
L. Niesen, A. Mugarza, M. F. Rosu, et al.Physical Review B 58 (13) 8590 (1998)
https://doi.org/10.1103/PhysRevB.58.8590
In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrate
Chih-Hao Lee, Hsin-Yi Lee, K.S. Liang and Tai-Bor WuPhysica B: Condensed Matter 248 (1-4) 109 (1998)
https://doi.org/10.1016/S0921-4526(98)00213-0
Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena
Masatoshi Saito,, Shigeo Sato, and Yoshio Waseda,High Temperature Materials and Processes 17 (1-2) 117 (1998)
https://doi.org/10.1515/HTMP.1998.17.1-2.117
Growth and thermal behavior of sputtered Mo/Al2O3 multilayers
M. Veldkamp, H. Zabel and Ch. MoraweJournal of Applied Physics 83 (1) 155 (1998)
https://doi.org/10.1063/1.366711
Pure nuclear resonant scattering of synchrotron radiation by a multilayer structure: Theoretical analysis for 169Tm
V. G. Kon, A. I. Chumakov and R. RüfferJournal of Experimental and Theoretical Physics 87 (1) 1 (1998)
https://doi.org/10.1134/1.558623
Metal bonding during sputter film deposition
T. Shimatsu, R. H. Mollema, D. Monsma, E. G. Keim and J. C. LodderJournal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (4) 2125 (1998)
https://doi.org/10.1116/1.581319