Revue de Physique Appliquée

Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films

W.X Yu, S.F Cui, J.H Li, L.S Wu, Z.H Mai, B.T Liu, B.R Zhao, W.L Zheng and Q.J Jia
Physica C: Superconductivity 337 (1-4) 39 (2000)
https://doi.org/10.1016/S0921-4534(00)00052-6

X-Ray reflectivity study of polyimide thin films swollen by 1,3-butadiene andn-butane

Tsukasa Miyazaki, Akira Shimazu, Tomoko Matsushita and Ken-Ichi Ikeda
Journal of Applied Polymer Science 78 (10) 1818 (2000)
https://doi.org/10.1002/1097-4628(20001205)78:10<1818::AID-APP140>3.0.CO;2-L

Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods

A. A. Lomov, V. A. Bushuev and V. A. Karavanskii
Crystallography Reports 45 (5) 842 (2000)
https://doi.org/10.1134/1.1312933

Interdiffusion in amorphous Nb/Si multilayers

Zdeněk Bochnı́ček and Ivo Vávra
Materials Letters 45 (2) 120 (2000)
https://doi.org/10.1016/S0167-577X(00)00089-6

Asymptotic form of the reciprocity theorem with applications in x-ray scattering

Ariel Caticha
Physical Review B 62 (6) 3639 (2000)
https://doi.org/10.1103/PhysRevB.62.3639

Temperature-dependent spin-wave behavior in Co/CoO bilayers studied by Brillouin light scattering

A. Ercole, W. Lew, G. Lauhoff, et al.
Physical Review B 62 (10) 6429 (2000)
https://doi.org/10.1103/PhysRevB.62.6429

The fragile magnetic structures of Fe/CeH2−δ multilayers

W Lohstroh, O Schulte, W Felsch, F Klose, H Maletta, G.P Felcher and H Lauter
Journal of Magnetism and Magnetic Materials 210 (1-3) 357 (2000)
https://doi.org/10.1016/S0304-8853(99)00760-X

High-resolution x-ray scattering measurements: I. Surfaces

J Daillant and M Alba
Reports on Progress in Physics 63 (10) 1725 (2000)
https://doi.org/10.1088/0034-4885/63/10/203

Electron density fluctuations at interfaces in Nb/Si bilayer, trilayer, and multilayer films: An x-ray reflectivity study

N. Suresh, D. M. Phase, Ajay Gupta and S. M. Chaudhari
Journal of Applied Physics 87 (11) 7946 (2000)
https://doi.org/10.1063/1.373479

X-Ray Scattering from Liquid–Liquid Interfaces

Mark L Schlossman, Ming Li, Dragoslav M Mitrinovic and Aleksey M Tikhonov
High Performance Polymers 12 (4) 551 (2000)
https://doi.org/10.1088/0954-0083/12/4/310

Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles

Anton Plech, Tim Salditt, Christian Münster and Johann Peisl
Journal of Colloid and Interface Science 223 (1) 74 (2000)
https://doi.org/10.1006/jcis.1999.6627

X-ray reflectivity study on TiN/Ti/Si structures before and after annealing

S. Santucci, P. Giuliani, P. Picozzi, et al.
Thin Solid Films 360 (1-2) 89 (2000)
https://doi.org/10.1016/S0040-6090(99)00891-3

Noncapillary-Wave Structure at the Water-Alkane Interface

Dragoslav M. Mitrinović, Aleksey M. Tikhonov, Ming Li, Zhengqing Huang and Mark L. Schlossman
Physical Review Letters 85 (3) 582 (2000)
https://doi.org/10.1103/PhysRevLett.85.582

Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

D. L. Windt, F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M. Jimenez-Garate, R. Kalyanaraman and P. H. Mao
Journal of Applied Physics 88 (1) 460 (2000)
https://doi.org/10.1063/1.373681

Superconductor/ferromagnet proximity effect in Fe/Pb/Fe trilayers

L. Lazar, K. Westerholt, H. Zabel, L. R. Tagirov, Yu. V. Goryunov, N. N. Garif’yanov and I. A. Garifullin
Physical Review B 61 (5) 3711 (2000)
https://doi.org/10.1103/PhysRevB.61.3711

Investigation of Multi-wave X-Ray Reflectometry.

K. Usami, T. Hirano, N. Kobayashi, Y. Tajima and T. Imagawa
Journal of the Magnetics Society of Japan 24 (4−2) 551 (2000)
https://doi.org/10.3379/jmsjmag.24.551

Amphiphilic Phenylene−Ethynylene Oligomers in Langmuir−Blodgett Films. Self-Assembling Multilayers for Electroluminescent Devices

E. Arias-Marin, J. C. Arnault, D. Guillon, et al.
Langmuir 16 (9) 4309 (2000)
https://doi.org/10.1021/la991313e

Structural and magnetic studies of exchange bias films of Ir(20)Mn(80)

S.-F. Cheng and P. Lubitz
Journal of Applied Physics 87 (9) 4927 (2000)
https://doi.org/10.1063/1.373205

Anomalous neutron reflectivity at the quartz/H2O–D2O interface

T Abdul-Redah, C Daub, F Streffer and C.A Chatzidimitriou-Dreismann
Physica B: Condensed Matter 291 (3-4) 314 (2000)
https://doi.org/10.1016/S0921-4526(00)00284-2

Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

D.M Solina, R.W Cheary, P.D Swift, S Dligatch, G.M McCredie, B Gong and P Lynch
Thin Solid Films 372 (1-2) 94 (2000)
https://doi.org/10.1016/S0040-6090(00)01044-0

An X-ray Reflectivity Study of the Water-Docosane Interface

Aleksey M. Tikhonov, Dragoslav M. Mitrinovic, Ming Li, Zhengqing Huang and Mark L. Schlossman
The Journal of Physical Chemistry B 104 (27) 6336 (2000)
https://doi.org/10.1021/jp001377u

Fabrication, performance, and figure metrology of epoxy-replicated aluminum foils for hard x-ray focusing multilayer-coated segmented conical optics

Mario A. Jimenez-Garate
Optical Engineering 39 (11) 2982 (2000)
https://doi.org/10.1117/1.1315572

Visualization of the surface roughness by x-ray scanning

V. V. Protopopov and V. V. Danilov
Journal of Visualization 3 (1) 63 (2000)
https://doi.org/10.1007/BF03182441

Adsorption and Desorption Behavior of an Anionic Pyrene Chromophore in Sequentially Deposited Polyelectrolyte-Dye Thin Films

Concetta Tedeschi, Frank Caruso, Helmuth Möhwald and Stefan Kirstein
Journal of the American Chemical Society 122 (24) 5841 (2000)
https://doi.org/10.1021/ja994029i

X-ray scattering from silicon surfaces: a useful tool for quality control

R Stömmer, A.R Martin, W Hub, H Göbel and U Pietsch
Microelectronic Engineering 45 (2-3) 257 (1999)
https://doi.org/10.1016/S0167-9317(99)00170-7

Advanced characterization tools for thin films in low- E systems

H Weis, T Müggenburg, P Grosse, L Herlitze, I Friedrich and M Wuttig
Thin Solid Films 351 (1-2) 184 (1999)
https://doi.org/10.1016/S0040-6090(99)00306-5

Neutron polarizing Fe/Si mirrors at ILL

P Høghøj, I Anderson, R Siebrecht, W Graf and K Ben-Saidane
Physica B: Condensed Matter 267-268 355 (1999)
https://doi.org/10.1016/S0921-4526(99)00038-1

Coatings on Glass 1998

H. Weis, T. Müggenburg, P. Grosse, et al.
Coatings on Glass 1998 277 (1999)
https://doi.org/10.1016/B978-044450247-6.50056-4

Charge-magnetic roughness correlations in an Fe/Gd multilayer

C. S. Nelson, G. Srajer, J. C. Lang, C. T. Venkataraman, S. K. Sinha, H. Hashizume, N. Ishimatsu and N. Hosoito
Physical Review B 60 (17) 12234 (1999)
https://doi.org/10.1103/PhysRevB.60.12234

Properties of stacked dielectric films composed of SiO2/Si3N4/SiO2

S. Santucci, L. Lozzi, M. Passacantando, et al.
Journal of Non-Crystalline Solids 245 (1-3) 224 (1999)
https://doi.org/10.1016/S0022-3093(98)00886-2

In situspecular and diffuse x-ray reflectivity study of growth dynamics in quench-condensed xenon films

Ralf K. Heilmann and Robert M. Suter
Physical Review B 59 (4) 3075 (1999)
https://doi.org/10.1103/PhysRevB.59.3075

Perpendicular magnetic anisotropy and the reorientation transition of the magnetization inCeH2/Femultilayers probed by x-ray magnetic circular dichroism

M. Arend, W. Felsch, G. Krill, A. Delobbe, F. Baudelet, E. Dartyge, J.-P. Kappler, M. Finazzi, A. San Miguel-Fuster, S. Pizzini and A. Fontaine
Physical Review B 59 (5) 3707 (1999)
https://doi.org/10.1103/PhysRevB.59.3707

Giant magnetoresistance dependence on the lateral correlation length of the interface roughness in magnetic superlattices

R. Schad, P. Beliën, G. Verbanck, V. V. Moshchalkov, Y. Bruynseraede, H. E. Fischer, S. Lefebvre and M. Bessiere
Physical Review B 59 (2) 1242 (1999)
https://doi.org/10.1103/PhysRevB.59.1242

Interface investigations by infrared spectroscopy and X-ray reflectivity measurements of cubic boron nitride thin films

S. Ulrich, W. Donner, H. Dosch, H. Ehrhardt and J. Schwan
Surface and Coatings Technology 116-119 274 (1999)
https://doi.org/10.1016/S0257-8972(99)00356-4

The atomic form factor and the X-ray dispersion corrections as tensor quantities: comparisons between theory and experiment

D.C. Creagh
Radiation Physics and Chemistry 56 (1-2) 61 (1999)
https://doi.org/10.1016/S0969-806X(99)00288-1

X-ray Reflectivity Study of the Water−Hexane Interface

Dragoslav M. Mitrinovic, Zhongjian Zhang, Scott M. Williams, Zhengqing Huang and Mark L. Schlossman
The Journal of Physical Chemistry B 103 (11) 1779 (1999)
https://doi.org/10.1021/jp984640o

Roughness of free surfaces of bulk amorphous polymers as studied by x-ray surface scattering and atomic force microscopy

V. W. Stone, A. M. Jonas, B. Nysten and R. Legras
Physical Review B 60 (8) 5883 (1999)
https://doi.org/10.1103/PhysRevB.60.5883

Diffuse x-ray reflection from multilayers with rough interfaces

V. Holy´
Journal of Materials Science: Materials in Electronics 10 (3) 223 (1999)
https://doi.org/10.1023/A:1008904330449

Claude Fermon, Frédéric Ott and Alain Menelle
58 163 (1999)
https://doi.org/10.1007/3-540-48696-8_5

X-RAY SMALL-ANGLE REFLECTION AND HIGH-ANGLE DIFFRACTION STUDIES ON Co/Cu MAGNETIC MULTILAYERS

X. S. WU, Q. S. BIE, Z. S. LIN, et al.
Modern Physics Letters B 13 (09n10) 325 (1999)
https://doi.org/10.1142/S0217984999000427

Strain relaxation in AlN epitaxial layers grown on GaN single crystals

R Langer, A Barski, A Barbier, et al.
Journal of Crystal Growth 205 (1-2) 31 (1999)
https://doi.org/10.1016/S0022-0248(99)00240-7

Stratification in Monolayers of a Bidisperse Melt Polymer Brush As Revealed by Neutron Reflectivity

Werner A. Goedel, Clarisse Luap, Ralf Oeser, et al.
Macromolecules 32 (22) 7599 (1999)
https://doi.org/10.1021/ma981900r

Perpendicular magnetic anisotropy of exchange coupled Co/Cu/Ni/Cu/Si(001) structures

G. Lauhoff, J. Lee, W. Y. Lee, A. Hirohata, A. Samad, J. A. C. Bland, S. Langridge and J. penfold
Journal of the Magnetics Society of Japan 23 (1_2) 572 (1999)
https://doi.org/10.3379/jmsjmag.23.572

X-ray and Neuron Reflectivity: Principles and Applications

Jean-Marc Gay and Laurent Lapena
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 217 (1999)
https://doi.org/10.1007/3-540-48696-8_7

Comment on ‘X-ray scattering from a randomly rough surface’

Dick K G de Boer
Waves in Random Media 9 (3) 459 (1999)
https://doi.org/10.1088/0959-7174/9/3/401

Magnetic anisotropy and layer-selective magnetometry of Cu/Co/Ni/Cu/Si (001)

G. Lauhoff, J. Lee, J.A.C. Bland, S. Langridge and J. Penfold
Journal of Magnetism and Magnetic Materials 198-199 331 (1999)
https://doi.org/10.1016/S0304-8853(98)01131-7

Instrumental aspects of x-ray microbeams in the range above 1 keV

P. Dhez, P. Chevallier, T. B. Lucatorto and C. Tarrio
Review of Scientific Instruments 70 (4) 1907 (1999)
https://doi.org/10.1063/1.1149733

Surface roughness of thin layers—a comparison of XRR and SFM measurements

O. Filies, O. Böling, K. Grewer, J. Lekki, M. Lekka, Z. Stachura and B. Cleff
Applied Surface Science 141 (3-4) 357 (1999)
https://doi.org/10.1016/S0169-4332(98)00524-8

149 221 (1999)
https://doi.org/10.1007/BFb0109396

Optimization of graded multilayer designs for astronomical x-ray telescopes

Peter H. Mao, Fiona A. Harrison, David L. Windt and Finn E. Christensen
Applied Optics 38 (22) 4766 (1999)
https://doi.org/10.1364/AO.38.004766

X-ray and Neuron Reflectivity: Principles and Applications

Alain Gibaud
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 87 (1999)
https://doi.org/10.1007/3-540-48696-8_3

Specular and non-specular x-ray scattering study of SiO2/Si structures

A Ulyanenkov, K Omote, R Matsuo, J Harada and S-Y Matsuno
Journal of Physics D: Applied Physics 32 (12) 1313 (1999)
https://doi.org/10.1088/0022-3727/32/12/306

Photoisomerization of Polyionic Layer-by-Layer Films Containing Azobenzene

Silvia Dante, Rigoberto Advincula, Curtis W. Frank and Pieter Stroeve
Langmuir 15 (1) 193 (1999)
https://doi.org/10.1021/la980497e

Strain relaxation of Al Ga1−N epitaxial layers on GaN and SiC substrates

J Domagala, M Leszczynski, P Prystawko, et al.
Journal of Alloys and Compounds 286 (1-2) 284 (1999)
https://doi.org/10.1016/S0925-8388(98)01022-6

Surface effects of heat treatments in active atmosphere on structural, morphological and electrical characteristics of CuInS2thin films

M. Kanzari, M. Abaab, B. Rezig and M. Brunel
The European Physical Journal Applied Physics 6 (2) 141 (1999)
https://doi.org/10.1051/epjap:1999163

X-ray scattering from single liquid-liquid interfaces

Mark L. Schlossman, Dragoslav M. Mitrinovic, Zhongjian Zhang, Ming Li and Zhengqing Huang
Synchrotron Radiation News 12 (2) 53 (1999)
https://doi.org/10.1080/08940889908260989

Variational Approach to X-Ray Diffuse Scattering

S.S. Fanchenko and A.A. Nefedov
physica status solidi (b) 212 (1) R3 (1999)
https://doi.org/10.1002/(SICI)1521-3951(199903)212:13.0.CO;2-M

X-ray and Neuron Reflectivity: Principles and Applications

Tilo Baumbach and Petr Mikulik
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 232 (1999)
https://doi.org/10.1007/3-540-48696-8_8

Theory of X-ray grazing incidence reflection in the presence of nuclear resonance excitation

R. Röhlsberger
Hyperfine Interactions 123-124 (1-4) 301 (1999)
https://doi.org/10.1023/A:1017063605078

Magnetic configurations in exchange-biased double superlattices

S. G. E. te Velthuis, G. P. Felcher, J. S. Jiang, A. Inomata, C. S. Nelson, A. Berger and S. D. Bader
Applied Physics Letters 75 (26) 4174 (1999)
https://doi.org/10.1063/1.125573

Interdiffusion in nanometer-scale multilayers investigated byin situlow-angle x-ray diffraction

Wei-Hua Wang, Hai Yang Bai, Ming Zhang, J. H. Zhao, X. Y. Zhang and W. K. Wang
Physical Review B 59 (16) 10811 (1999)
https://doi.org/10.1103/PhysRevB.59.10811

Review on grazing incidence X-ray spectrometry and reflectometry

Krassimir N. Stoev and Kenji Sakurai
Spectrochimica Acta Part B: Atomic Spectroscopy 54 (1) 41 (1999)
https://doi.org/10.1016/S0584-8547(98)00160-8

In situ synchrotron x-ray reflectivity study of the oligoclase feldspar mineral–fluid interface

Morag L. Farquhar, Roy A. Wogelius and Chiu C. Tang
Geochimica et Cosmochimica Acta 63 (10) 1587 (1999)
https://doi.org/10.1016/S0016-7037(99)00106-4

X-ray reflectivity of zirconia based sol–gel coatings on borosilicate glasses

A.P. Rizzato, C.V. Santilli and S.H. Pulcinelli
Journal of Non-Crystalline Solids 247 (1-3) 158 (1999)
https://doi.org/10.1016/S0022-3093(99)00057-5

Study of hydrogenated diamond-like carbon films using x-ray reflectivity

Qing Zhang, S. F. Yoon, Rusli, J. Ahn, H. Yang and D. Bahr
Journal of Applied Physics 86 (1) 289 (1999)
https://doi.org/10.1063/1.370792

Long-term stability of a quasiperiodic Ta/Al multilayer: Disintegration at room temperature analyzed by grazing angle x-ray scattering and photoelectron spectroscopy

P. Yang, U. Klemradt, Y. Tao, J. Peisl, R. W. Peng, A. Hu and S. S. Jiang
Journal of Applied Physics 86 (1) 267 (1999)
https://doi.org/10.1063/1.370725

Structural assembly of Cd-arachidate molecules in multilayers

Satish Vitta, T. H. Metzger and S. S. Major
The Journal of Chemical Physics 111 (24) 11088 (1999)
https://doi.org/10.1063/1.480467

X-ray scattering from monolayers of F(CF2)10(CH2)2OH at the water–(hexane solution) and water–vapor interfaces

Zhongjian Zhang, Dragoslav M. Mitrinovic, Scott M. Williams, Zhengqing Huang and Mark L. Schlossman
The Journal of Chemical Physics 110 (15) 7421 (1999)
https://doi.org/10.1063/1.478644

High-density transition layer in oxynitride interfaces on Si(100)

J. Wang, D. R. Lee, C. Park, Y. H. Jeong, K.-B. Lee, Y. J. Park, S. B. Youn, J.-C. Park, H. M. Choi and Y.-J. Huh
Applied Physics Letters 75 (24) 3775 (1999)
https://doi.org/10.1063/1.125452

Origin of the Co uniaxial volume anisotropy of the fcc Co/Ni/Cu(001) system

G. Lauhoff, J. A. C. Bland, J. Lee, S. Langridge and J. Penfold
Physical Review B 60 (6) 4087 (1999)
https://doi.org/10.1103/PhysRevB.60.4087

Growth and structural characterization of Pb/Fe layered system

L. Lazar, K. Westerholt, H. Zabel, Yu.V. Goryunov and I.A. Garifullin
Thin Solid Films 354 (1-2) 93 (1999)
https://doi.org/10.1016/S0040-6090(99)00568-4

X-ray and Neuron Reflectivity: Principles and Applications

Jean Daillant and Anne Sentenac
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 121 (1999)
https://doi.org/10.1007/3-540-48696-8_4

Characterization of structures from X-ray scattering data using genetic algorithms

D. K. Bowen, B. K. Tanner, Matthew Wormington, Charles Panaccione, Kevin M. Matney and D. Keith Bowen
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 357 (1761) 2827 (1999)
https://doi.org/10.1098/rsta.1999.0469

Anomalous neutron reflectivity of H2O–D2O mixtures at the silicon/liquid interface

R.M.F Streffer, T Abdul Redah, J Bowers, et al.
Physica B: Condensed Matter 266 (3) 198 (1999)
https://doi.org/10.1016/S0921-4526(98)01183-1

Grazing incidence small angle x-ray scattering from free-standing nanostructures

Markus Rauscher, Rogerio Paniago, Hartmut Metzger, Zoltan Kovats, Jan Domke, Johann Peisl, Hans-Dieter Pfannes, Jörg Schulze and Ignaz Eisele
Journal of Applied Physics 86 (12) 6763 (1999)
https://doi.org/10.1063/1.371724

Light scattering by a two‐dimensional, rough penetrable medium: A mean‐field theory

O. Calvo‐Perez, A. Sentenac and J.‐J. Greffet
Radio Science 34 (2) 311 (1999)
https://doi.org/10.1029/1998RS900027

Magnetic anisotropy, magnetic moments and coupling of Cu/Co/Cu/Ni/Cu(001) trilayer

G Lauhoff, A Hirohita, J A C Bland, J Lee, S Langridge and J Penfold
Journal of Physics: Condensed Matter 11 (35) 6707 (1999)
https://doi.org/10.1088/0953-8984/11/35/309

A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates

L. Méchin, A. Chabli, F. Bertin, M. Burdin, G. Rolland, C. Vannuffel and J.-C. Villégier
Journal of Applied Physics 84 (9) 4935 (1998)
https://doi.org/10.1063/1.368738

Metal/Al 2 O 3 multilayers: Interface structure, thermal stability and reflectivities in the soft x-ray regime

M. Veldkamp, H. Zabel, F. Schäfers and H.-Ch. Mertins
Journal of Applied Physics 84 (6) 3147 (1998)
https://doi.org/10.1063/1.368469

Pure nuclear resonant scattering of synchrotron radiation by a multilayer structure: Theoretical analysis for 169Tm

V. G. Kon, A. I. Chumakov and R. Rüffer
Journal of Experimental and Theoretical Physics 87 (1) 1 (1998)
https://doi.org/10.1134/1.558623

In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrate

Chih-Hao Lee, Hsin-Yi Lee, K.S. Liang and Tai-Bor Wu
Physica B: Condensed Matter 248 (1-4) 109 (1998)
https://doi.org/10.1016/S0921-4526(98)00213-0

Magnetic behavior of probe layers of57Fein thin Fe films observed by means of nuclear resonant scattering of synchrotron radiation

L. Niesen, A. Mugarza, M. F. Rosu, et al.
Physical Review B 58 (13) 8590 (1998)
https://doi.org/10.1103/PhysRevB.58.8590

An analysis of Ag/Al2O3 angular selective films by X-ray reflectivity

S. Dligatch, R.W. Cheary and G.B. Smith
Thin Solid Films 312 (1-2) 4 (1998)
https://doi.org/10.1016/S0040-6090(97)00334-9

Nonspecular x-ray scattering in a multilayer-coated imaging system

D. G. Stearns, D. P. Gaines, D. W. Sweeney and E. M. Gullikson
Journal of Applied Physics 84 (2) 1003 (1998)
https://doi.org/10.1063/1.368098

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance

Gyanendra S. Lodha, Koujun Yamashita, Hideyo Kunieda, Yuzuru Tawara, Jin Yu, Yoshiharu Namba and Jean M. Bennett
Applied Optics 37 (22) 5239 (1998)
https://doi.org/10.1364/AO.37.005239

E.M. Gullikson
31 257 (1998)
https://doi.org/10.1016/S0076-695X(08)60047-2

IMD—Software for modeling the optical properties of multilayer films

David L. Windt
Computers in Physics 12 (4) 360 (1998)
https://doi.org/10.1063/1.168689

Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena

Masatoshi Saito,, Shigeo Sato, and Yoshio Waseda,
High Temperature Materials and Processes 17 (1-2) 117 (1998)
https://doi.org/10.1515/HTMP.1998.17.1-2.117

Cr/Sc multilayers for the soft-x-ray range

Franz Schäfers, Hans-Christoph Mertins, Frank Schmolla, et al.
Applied Optics 37 (4) 719 (1998)
https://doi.org/10.1364/AO.37.000719

In situx-ray reflectivity study of the oxidation kinetics of liquid gallium and the liquid alloy

Anton Plech, Uwe Klemradt, Hartmut Metzger and Johann Peisl
Journal of Physics: Condensed Matter 10 (5) 971 (1998)
https://doi.org/10.1088/0953-8984/10/5/007

4fand5dmagnetic moments in highly correlated [Ce/La/Fe] and [La/Ce/Fe] multilayers studied by x-ray magnetic circular dichroism

M. Arend, M. Finazzi, O. Schutte, M. Münzenberg, A.-M. Dias, F. Baudelet, Ch. Giorgetti, E. Dartyge, P. Schaaf, J.-P. Kappler, G. Krill and W. Felsch
Physical Review B 57 (4) 2174 (1998)
https://doi.org/10.1103/PhysRevB.57.2174

Surface effects in displacive phase transformations studied by X-ray specular reflectivity

U. Klemradt, M. Fromm, G. Landmesser, H. Amschler and J. Peisl
Physica B: Condensed Matter 248 (1-4) 83 (1998)
https://doi.org/10.1016/S0921-4526(98)00208-7

Optical constants of in situ-deposited films of important extreme-ultraviolet multilayer mirror materials

Charles Tarrio, Richard N. Watts, Thomas B. Lucatorto, Jon M. Slaughter and Charles M. Falco
Applied Optics 37 (19) 4100 (1998)
https://doi.org/10.1364/AO.37.004100

Metal bonding during sputter film deposition

T. Shimatsu, R. H. Mollema, D. Monsma, E. G. Keim and J. C. Lodder
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (4) 2125 (1998)
https://doi.org/10.1116/1.581319

X-Ray-Reflectivity-Based Structural Analysis of a Spin-Valve Film

Y. Kitade, Y. Hara, T. Uzumaki, M. Oshiki, Y. Shimizu, N. Awaji and S. Komiya
Journal of the Magnetics Society of Japan 22 (4_2) 513 (1998)
https://doi.org/10.3379/jmsjmag.22.513

The interface structure of thin liquid hexane films

A.K Doerr, M Tolan, T Seydel and W Press
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