Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
Rev. Phys. Appl. (Paris), 15 3 (1980) 761-779
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https://doi.org/10.1021/acs.energyfuels.9b03831
2265 030196 (2020)
https://doi.org/10.1063/5.0017405
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https://doi.org/10.3390/nano10040752
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https://doi.org/10.1038/s41598-020-68326-2
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https://doi.org/10.2351/7.0000160
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https://doi.org/10.1103/PhysRevMaterials.4.064404
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https://doi.org/10.1103/PhysRevAccelBeams.23.083101