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Dekker Encyclopedia of Nanoscience and Nanotechnology, Third Edition
Ece Isenbike Ozalp, Sungho Kim, Vignesh Sundar, Jian-Gang (Jimmy) Zhu and Jeffrey A. Weldon Dekker Encyclopedia of Nanoscience and Nanotechnology, Third Edition 1 (2014) https://doi.org/10.1081/E-ENN3-140000061
Preparation of a nanopatterned surface of bonded silicon wafers using electrochemical thinning and chemical etching: A scanning tunnel microscopy investigation
Analysis of Anodic Oxidation Current of Flattened p-Type Si(111) Surface in Aqueous Solution
F. Bensliman, A. Fukuda, N. Mizuta and M. Matsumura Journal of The Electrochemical Society 150(9) G527 (2003) https://doi.org/10.1149/1.1593047
Structural studies of 20 keV oxygen-implanted silicon
G.K. Gupta, A.D. Yadav, T.K. Gundu Rao and S.K. Dubey Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 168(4) 503 (2000) https://doi.org/10.1016/S0168-583X(00)00065-3
Effects of H and O passivation on photoluminescence from anodically oxidized porous Si
S. Shih, K. H. Jung, D. L. Kwong, M. Kovar and J. M. White Applied Physics Letters 62(15) 1780 (1993) https://doi.org/10.1063/1.109573
Anodic oxidation as a method for low temperature passivation of silicon radiation detectors
G. Mende, H. Flietner and M. Deutscher Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 326(1-2) 16 (1993) https://doi.org/10.1016/0168-9002(93)90327-E
Separation and Determination of the Interface and Oxide Trap Densities in MOS Structures by the Transient Current Technique
Phan Hong Khoi, Phan Ngoc Minh, Le Thi Thanh Binh, Hoang Anh Dung and Le Thi Trong Tuyen Physica Status Solidi (a) 135(2) K91 (1993) https://doi.org/10.1002/pssa.2211350243
Ionic processes through the interfacial oxide in the anodic dissolution of silicon
The passivation of InP by arsenic surface stabilization and Al2O3 deposition: Correlations between interface chemistry and capacitance measurements
G. Hollinger, R. Blanchet, M. Gendry, C. Santinelli, R. Skheyta and P. Viktorovitch Journal of Applied Physics 67(9) 4173 (1990) https://doi.org/10.1063/1.346054