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Identification of the dynamics of plasma-induced damage in a CuInSe2 thin film by fractal processing

H. Yücel Kurt, E. Kurt and B. G. Salamov
Crystal Research and Technology 41 (7) 698 (2006)
https://doi.org/10.1002/crat.200510651

Fractal processing for an analysis of the quality and resistivity of large semiconductor plates

H. Yücel Kurt, E. Kurt and B. G. Salamov
Crystal Research and Technology 39 (9) 743 (2004)
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Precipitate engineering in GaAs studied by laser scattering tomography

T. Steinegger, M. Naumann, M. Jurisch and J. Donecker
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Defects and radiation damage in semi-insulating GaAs radiation detectors

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Traps in GaAs detectors (before and after irradiation) and electric field redistribution in excited SI-GaAs

J. Vaitkus, J. Storasta, R. Kiliulis, et al.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 395 (1) 94 (1997)
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Spatial stabilization of Townsend and glow discharges with a semiconducting cathode

B G Salamov, S Ellialtioglu, B G Akinoglu, N N Lebedeva and L G Patriskii
Journal of Physics D: Applied Physics 29 (3) 628 (1996)
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Recording the resistance inhomogeneity in high-resistivity semiconductors plates

B.G. Salamov, K. Çolakoǧlu and Ş. Altindal
Infrared Physics & Technology 36 (3) 661 (1995)
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Visualization of electrical inhomogeneities in high-ohmic semiconductor plates by an ionization-type photographic system

N N Lebedeva, B G Salamov, B G Akinoglu and K R Allakhverdiev
Journal of Physics D: Applied Physics 27 (6) 1229 (1994)
https://doi.org/10.1088/0022-3727/27/6/021