Revue de Physique Appliquée

Structural study of bismuth films and its consequences on their electrical properties

J. Buxo, M. Saleh, G. Sarrabayrouse, G. Dorville, J. Berty and M. Brieu

Rev. Phys. Appl. (Paris), 15 5 (1980) 961-972

DOI: 10.1051/rphysap:01980001505096100

J. Buxo

M. Saleh

G. Sarrabayrouse

G. Dorville

J. Berty

M. Brieu

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