Residual impurities in MO-VPE GaAs epitaxial layers B. El Jani, J.C. Grenet, M. Leroux, M. Guittard, P. Gibart et J. Chevallier Rev. Phys. Appl. (Paris), 19 1 (1984) 7-15 DOI: 10.1051/rphysap:019840019010700