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Cited article:

Modifications des caractéristiques électriques de contacts métal-silicium par bombardement d'ions argon de faible énergie

A. Chouiyakh, B. Lang

Rev. Phys. Appl. (Paris), 19 12 (1984) 971-978

DOI: https://doi.org/10.1051/rphysap:019840019012097100

This article has been cited by the following article(s):

Build-up and annealing of damage produced by low-energy argon ions at Si(lll) surface

A. Taoufik, A. Chouiyakh and B. Lang
Radiation Effects 104 (1-4) 117 (1987)
https://doi.org/10.1080/00337578708225342

Electrical properties of hydrogen bombarded silicon surfaces

A. Barhdadi, J.P. Ponpon, A. Grob, et al.
Vacuum 36 (10) 705 (1986)
https://doi.org/10.1016/0042-207X(86)90346-5

Critical energy for damage at silicon surfaces bombarded with low-energy argon ions

B. Lang and A. Taoufik
Applied Physics A Solids and Surfaces 39 (2) 95 (1986)
https://doi.org/10.1007/BF00616825