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Cited article:

Prediction of dielectric reliability from I–V characteristics: Poole–Frenkel conduction mechanism leading to √E model for silicon nitride MIM capacitor

K.-H. Allers
Microelectronics Reliability 44 (3) 411 (2004)
https://doi.org/10.1016/j.microrel.2003.12.007

The problem of deriving the field-induced thermal emission in Poole-Frenkel theories

R. Ongaro and A. Pillonnet
Radiation Effects and Defects in Solids 124 (3) 289 (1992)
https://doi.org/10.1080/10420159208220202