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Cited article:

EBIC investigations of thick SOI layers

M. Kittler, B. Tillack, W. Hoppe, W. Seifert, R. Banisch, H.H. Richter, A. Rocher

Rev. Phys. Appl. (Paris), 23 3 (1988) 281-288

DOI: https://doi.org/10.1051/rphysap:01988002303028100

This article has been cited by the following article(s):

Low frequency noise investigations for evaluation of silicon-on-insulator films obtained by zone-melting recrystallization

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Materials Science and Engineering: B 18 (2) 181 (1993)
https://doi.org/10.1016/0921-5107(93)90130-F

Polycrystalline Semiconductors II

M. Kittler and W. Seifert
Springer Proceedings in Physics, Polycrystalline Semiconductors II 54 96 (1991)
https://doi.org/10.1007/978-3-642-76385-4_14

Defect Control in Semiconductors

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Generation and electrical characterization of thick SOI films

B. Tillack, R. Banisch, H.H. Richter and K. Hoeppner
Applied Surface Science 36 (1-4) 579 (1989)
https://doi.org/10.1016/0169-4332(89)90953-7

Structural and electrical properties of epitaxial Si on insulating substrates

G. A. Rozgonyi, Z. J. Radzimski, T. Higuchi, B. L. Jiang, D. M. Lee, T. Zhou, D. Schmidt and J. Blake
Applied Physics Letters 55 (6) 586 (1989)
https://doi.org/10.1063/1.101841