Revue de Physique Appliquée

Electrical characterization of as-grown, annealed and indium-doped Hg1-xZnxTe for x near 0.15

S. Rolland, A. Lasbley, A. Seyni, R. Granger and R. Triboulet

Rev. Phys. Appl. (Paris), 24 8 (1989) 795-802

DOI: 10.1051/rphysap:01989002408079500

S. Rolland

A. Lasbley

A. Seyni

R. Granger

R. Triboulet

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