EBIC investigations of thick SOI layers

M. Kittler, B. Tillack, W. Hoppe, W. Seifert, R. Banisch, H.H. Richter and A. Rocher
Rev. Phys. Appl. (Paris), 23 3 (1988) 281-288
DOI: 10.1051/rphysap:01988002303028100

This search tool will display articles in Pubmed database database by authors of the selected article:

Select your author(s):


Search method: