| Numéro |
Rev. Phys. Appl. (Paris)
Volume 9, Numéro 2, mars 1974
|
|
|---|---|---|
| Page(s) | 385 - 388 | |
| DOI | https://doi.org/10.1051/rphysap:0197400902038500 | |
Rev. Phys. Appl. (Paris) 9, 385-388 (1974)
DOI: 10.1051/rphysap:0197400902038500
1 Department of Physics, Polytechnic Institute of Brooklyn, N. Y. 11201, U. S. A.
2 JEOL Ltd., Tokyo, Japan
3 Department of Applied Physics, Waseda University, Shinjukuku-ku, Tokyo, Japan
6116D - Electron microscopy determinations of structures.
6170 - Defects in crystals.
6820 - Solid surface structure.
Key words
dislocations -- electron microscope examination of materials -- molybdenum compounds -- surface structure -- dislocation images -- high resolution scanning electron microscopy -- back scattering modes -- conventional filament -- topology contrast -- surface steps -- imperfections -- transmission modes -- thin crystals -- MoS sub 2 -- thick crystals
DOI: 10.1051/rphysap:0197400902038500
Dislocation images in high resolution scanning electron microscopy
R.M. Stern1, S. Takashima2, H. Hashimoto2, S. Kimoto2 et T. Ichinokawa31 Department of Physics, Polytechnic Institute of Brooklyn, N. Y. 11201, U. S. A.
2 JEOL Ltd., Tokyo, Japan
3 Department of Applied Physics, Waseda University, Shinjukuku-ku, Tokyo, Japan
Abstract
Dislocation images in the high resolution scanning electron microscope with conventional filament have been obtained in transmission and back scattering modes from thin molybdenite crystals. Thick crystals show overwhelming topology contrast from surface steps and imperfections.
Résumé
Des images de dislocations dans des échantillons minces de molybdénite ont été obtenues avec un microscope électronique à balayage, équipé d'un filament conventionnel, suivant les deux modes : électrons transmis, électrons rétrodiffusés. Sur des cristaux épais on n'observe par contre que le contraste des marches et autres imperfections superficielles.
6116D - Electron microscopy determinations of structures.
6170 - Defects in crystals.
6820 - Solid surface structure.
Key words
dislocations -- electron microscope examination of materials -- molybdenum compounds -- surface structure -- dislocation images -- high resolution scanning electron microscopy -- back scattering modes -- conventional filament -- topology contrast -- surface steps -- imperfections -- transmission modes -- thin crystals -- MoS sub 2 -- thick crystals