| Numéro |
Rev. Phys. Appl. (Paris)
Volume 12, Numéro 10, octobre 1977
|
|
|---|---|---|
| Page(s) | 1586 - 1586 | |
| DOI | https://doi.org/10.1051/rphysap:0197700120100158600 | |
Rev. Phys. Appl. (Paris) 12, 1586-1586 (1977)
DOI: 10.1051/rphysap:0197700120100158600
General Ionex Corporation, Ipswich, Massachusetts 01938, U.S.A.
0790 - Other topics in instruments, apparatus, and components common to several branches of physics and astronomy.
Key words
Tandem accelerators -- Analyzer
DOI: 10.1051/rphysap:0197700120100158600
A new tandem surface analyser
K.H. PurserGeneral Ionex Corporation, Ipswich, Massachusetts 01938, U.S.A.
Abstract
A new surface analyser based on the tandem principle will be discussed.
Résumé
On discute d'un nouveau type d'analyseur de surface basé sur le principe du tandem.
0790 - Other topics in instruments, apparatus, and components common to several branches of physics and astronomy.
Key words
Tandem accelerators -- Analyzer