| Numéro |
Rev. Phys. Appl. (Paris)
Volume 20, Numéro 9, septembre 1985
|
|
|---|---|---|
| Page(s) | 679 - 679 | |
| DOI | https://doi.org/10.1051/rphysap:01985002009067900 | |
Rev. Phys. Appl. (Paris) 20, 679-679 (1985)
DOI: 10.1051/rphysap:01985002009067900
PACS
0130V - Book reviews.
0778 - Electron, positron, and ion microscopes; electron diffractometers.
0750Q - Signal processing electronics.
Key words
Electron microscopy -- Fourier transformation -- Book review -- Signal processing -- Digital filtering
DOI: 10.1051/rphysap:01985002009067900
Revue de Livres
Without abstract
PACS
0130V - Book reviews.
0778 - Electron, positron, and ion microscopes; electron diffractometers.
0750Q - Signal processing electronics.
Key words
Electron microscopy -- Fourier transformation -- Book review -- Signal processing -- Digital filtering
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