Numéro
Rev. Phys. Appl. (Paris)
Volume 23, Numéro 4, avril 1988
Page(s) 681 - 681
DOI https://doi.org/10.1051/rphysap:01988002304068100
Rev. Phys. Appl. (Paris) 23, 681-681 (1988)
DOI: 10.1051/rphysap:01988002304068100

Structure and mechanical properties of a Σ= 51 [011] tilt boundary in germanium

W. Skrotzki, H. Wendt, C.B. Carter et D.L. Kohlstedt

Department of Material Science and Engineering, Cornell University, Ithaca, NY 14853 - 1501, USA

Without abstract


PACS
6170J - Etch pits, decoration, transmission electron microscopy and other direct observations of dislocations.
6170N - Grain and twin boundaries.
6848 - Solid solid interfaces.

Key words
creep -- crystal microstructure -- elemental semiconductors -- germanium -- tilt boundaries -- transmission electron microscope examination of materials -- semiconductor -- dislocations -- tilt boundary -- bicrystals -- creep deformation -- microstructure -- Ge

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