Revue de Physique Appliquée

A Comprehensive Error Analysis of the Neutron Elliptical Cylindrical Mirror with High Gain

Weichen Gu, Jun Yu, Pengfeng Sheng, Fengrui Tang, Qiya Zhang, Peng Chen, Qiaoyu Wu, Wentao Song, Zhangran Cao, Zhengxiang Shen, Zhong Zhang and Zhanshan Wang
Photonics 12 (6) 580 (2025)
https://doi.org/10.3390/photonics12060580

On the Variation in Surface State of Nominally Identical Fused Silica Optics Surfaces

Sebastian Seeling, Robert Köhler, Daniel Tasche and Christoph Gerhard
Surface and Interface Analysis 57 (2) 111 (2025)
https://doi.org/10.1002/sia.7369

Optical design of reflective Bragg mirrors for EUV photolithography

Yu-Yen Tsai and Ting-Wei Chen
Journal of Optics 26 (4) 045803 (2024)
https://doi.org/10.1088/2040-8986/ad2e20

Depth-Resolved Profile of the Interfacial Ferromagnetism in CaMnO3/CaRuO3 Superlattices

Jay R. Paudel, Aria Mansouri Tehrani, Michael Terilli, Mikhail Kareev, Joseph Grassi, Raj K. Sah, Liang Wu, Vladimir N. Strocov, Christoph Klewe, Padraic Shafer, Jak Chakhalian, Nicola A. Spaldin and Alexander X. Gray
Nano Letters 24 (48) 15195 (2024)
https://doi.org/10.1021/acs.nanolett.4c02087

On the trapping of neutrons in Fabry–Pérot nano-structures and potential applications for cold neutron lifetime Investigations

M. Maaza, B. Pardo, D. Hamidi, M. Akbari, R. Morad, M. Henini and A. Gibaud
Journal of Neutron Research 25 (1) 13 (2023)
https://doi.org/10.3233/JNR-220015

Application of X-ray diffraction and reflectometry methods for analysis of damaged layers on polar faces of ZnO after surface chemical-mechanical treatment

Kirill D. Shcherbachev and Marina I. Voronova
Modern Electronic Materials 8 (1) 43 (2022)
https://doi.org/10.3897/j.moem.8.1.84257

Application of X-ray diffraction and reflectometry methods for analysis of damaged layers on polar faces of ZnO after surface chemical-mechanical treatment

K. D. Shcherbachev and M. I. Voronova
Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 25 (1) 92 (2022)
https://doi.org/10.17073/1609-3577-2022-1-92-102

Nanoscale Structure of Langmuir–Blodgett Film of Bent-Core Molecules

Fabrizio Corrado Adamo, Federica Ciuchi, Maria Penelope De Santo, Paola Astolfi, Isabelle Warner, Eric Scharrer, Michela Pisani, Francesco Vita and Oriano Francescangeli
Nanomaterials 12 (13) 2285 (2022)
https://doi.org/10.3390/nano12132285

Effect of surface oxidation on soft x-ray optical properties of ion beam sputter deposited amorphous AlN thin film

Kiranjot and Mohammed H. Modi
Journal of Applied Physics 130 (19) (2021)
https://doi.org/10.1063/5.0059736

The anisotropy in the optical constants of quartz crystals for soft X-rays

A. Andrle, P. Hönicke, J. Vinson, et al.
Journal of Applied Crystallography 54 (2) 402 (2021)
https://doi.org/10.1107/S1600576720016325

Effect of water on the electroresponsive structuring and friction in dilute and concentrated ionic liquid lubricant mixtures

Georgia A. Pilkington, Rebecca Welbourn, Anna Oleshkevych, et al.
Physical Chemistry Chemical Physics 22 (48) 28191 (2020)
https://doi.org/10.1039/D0CP05110A

Interface asymmetry in AlN/Ni and Ni/AlN interfaces: A study using resonant soft X-ray reflectivity

Kiranjot, R. Dhawan, R.K. Gupta, P.K. Yadav and Mohammed H. Modi
Applied Surface Science 529 147199 (2020)
https://doi.org/10.1016/j.apsusc.2020.147199

Influence of spin orbit splitting and satellite transitions on nickel soft X-ray optical properties near its L 2,3 absorption edge region

Kiranjot, Mohammed H. Modi, Raj Kumar Gupta, Mangalika Sinha and Praveen Kumar Yadav
Journal of Synchrotron Radiation 27 (6) 1633 (2020)
https://doi.org/10.1107/S1600577520011960

Investigation of nonuniform surface properties of classically manufactured fused silica windows

Christoph Gerhard, Daniel Tasche, Olivier Uteza and Jörg Hermann
Applied Optics 56 (26) 7427 (2017)
https://doi.org/10.1364/AO.56.007427

Bio-deuterated cellulose thin films for enhanced contrast in neutron reflectometry

Vikram Singh Raghuwanshi, Jielong Su, Christopher J. Garvey, et al.
Cellulose 24 (1) 11 (2017)
https://doi.org/10.1007/s10570-016-1108-6

Interface morphology of Mo/Si multilayer systems with varying Mo layer thickness studied by EUV diffuse scattering

Anton Haase, Victor Soltwisch, Stefan Braun, Christian Laubis and Frank Scholze
Optics Express 25 (13) 15441 (2017)
https://doi.org/10.1364/OE.25.015441

A latent pigment strategy for robust active layers in solution-processed, complementary organic field-effect transistors

Isis Maqueira-Albo, Giorgio Ernesto Bonacchini, Giorgio Dell'Erba, et al.
Journal of Materials Chemistry C 5 (44) 11522 (2017)
https://doi.org/10.1039/C7TC03938G

Reference Module in Materials Science and Materials Engineering

P.N. Gibson
Reference Module in Materials Science and Materials Engineering (2016)
https://doi.org/10.1016/B978-0-12-803581-8.03318-X

Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements

Anton Haase, Saša Bajt, Philipp Hönicke, Victor Soltwisch and Frank Scholze
Journal of Applied Crystallography 49 (6) 2161 (2016)
https://doi.org/10.1107/S1600576716015776

Optical and Structural Properties of Ultra‐thin Gold Films

Anna Kossoy, Virginia Merk, Denis Simakov, et al.
Advanced Optical Materials 3 (1) 71 (2015)
https://doi.org/10.1002/adom.201400345

Method to control deposition rate instabilities—High power impulse magnetron sputtering deposition of TiO2

Anna Kossoy, Rögnvaldur L. Magnusson, Tryggvi K. Tryggvason, Kristjan Leosson and Sveinn Olafsson
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 33 (2) (2015)
https://doi.org/10.1116/1.4905737

Role of dynamic effects in the characterization of multilayers by means of power spectral density

Anton Haase, Victor Soltwisch, Christian Laubis and Frank Scholze
Applied Optics 53 (14) 3019 (2014)
https://doi.org/10.1364/AO.53.003019

Morphology and structure evolution of tin-doped indium oxide thin films deposited by radio-frequency magnetron sputtering: The role of the sputtering atmosphere

Man Nie, Tayfun Mete and Klaus Ellmer
Journal of Applied Physics 115 (15) (2014)
https://doi.org/10.1063/1.4871810

Determining surface coverage of ultra-thin gold films from X-ray reflectivity measurements

A. Kossoy, D. Simakov, S. Olafsson and K. Leosson
Thin Solid Films 536 50 (2013)
https://doi.org/10.1016/j.tsf.2013.03.057

Combined Analysis

Combined Analysis 441 (2013)
https://doi.org/10.1002/9781118622506.biblio

n-Type self-assembled monolayer field-effect transistors for flexible organic electronics

Andreas Ringk, W.S. Christian Roelofs, Edsger C.P. Smits, et al.
Organic Electronics 14 (5) 1297 (2013)
https://doi.org/10.1016/j.orgel.2013.02.016

X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold, Hannes Brandner, Simon J. Ausserlechner, et al.
Organic Electronics 14 (2) 479 (2013)
https://doi.org/10.1016/j.orgel.2012.11.016

Diffusion of Ag into Organic Semiconducting Materials: A Combined Analytical Study Using Transmission Electron Microscopy and X-ray Reflectivity

Stefanie Fladischer, Alfred Neuhold, Elke Kraker, et al.
ACS Applied Materials & Interfaces 4 (10) 5608 (2012)
https://doi.org/10.1021/am301504j

Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, et al.
Journal of Applied Physics 110 (11) (2011)
https://doi.org/10.1063/1.3667171

Surface and Thin Film Analysis

P. Neil Gibson
Surface and Thin Film Analysis 311 (2011)
https://doi.org/10.1002/9783527636921.ch19

Study of roughness evolution and layer stacking faults in short-period atomic layer deposited HfO2/Al2O3 multilayers

M. de Pauli, A. Malachias, H. Westfahl, et al.
Journal of Applied Physics 109 (6) (2011)
https://doi.org/10.1063/1.3555624

Applications of Compact Laser-Driven EUV/XUV Plasma Sources

Armin Bayer, Frank Barkusky, Stefan Döring, Peter Großmann and Klaus Mann
X-Ray Optics and Instrumentation 2010 1 (2010)
https://doi.org/10.1155/2010/687496

Feasibility of study magnetic proximity effects in bilayer “superconductor/ferromagnet” using waveguide-enhanced polarized neutron reflectometry

Yu. N. Khaydukov, Yu. V. Nikitenko, L. Bottyan, A. Rühm and V. L. Aksenov
Crystallography Reports 55 (7) 1235 (2010)
https://doi.org/10.1134/S1063774510070254

Dual-Emissive Photoluminescent Langmuir−Blodgett Films of Decatungstoeuropate and an Amphiphilic Iridium Complex

Miguel Clemente-León, Eugenio Coronado, Ángel López-Muñoz, et al.
Langmuir 26 (2) 1316 (2010)
https://doi.org/10.1021/la902513z

Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering

Gilles Renaud, Rémi Lazzari and Frédéric Leroy
Surface Science Reports 64 (8) 255 (2009)
https://doi.org/10.1016/j.surfrep.2009.07.002

X-ray tracing using Geant4

E.J. Buis and G. Vacanti
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 599 (2-3) 260 (2009)
https://doi.org/10.1016/j.nima.2008.11.002

X-ray and Neutron Reflectivity

J. Daillant, S. Mora and A. Sentenac
Lecture Notes in Physics, X-ray and Neutron Reflectivity 770 133 (2009)
https://doi.org/10.1007/978-3-540-88588-7_4

X-ray and Neutron Reflectivity

T. Baumbach and P. Mikulík
Lecture Notes in Physics, X-ray and Neutron Reflectivity 770 235 (2009)
https://doi.org/10.1007/978-3-540-88588-7_6

Optical Characterization of Ultra-Thin Iron and Iron Oxide Films

David Necas, Lenka Zajícková, Daniel Franta, et al.
e-Journal of Surface Science and Nanotechnology 7 486 (2009)
https://doi.org/10.1380/ejssnt.2009.486

Table-top reflectometer in the extreme ultraviolet for surface sensitive analysis

Matus Banyay and Larissa Juschkin
Applied Physics Letters 94 (6) (2009)
https://doi.org/10.1063/1.3079394

Nanoscale Assemblies of Gigantic Molecular {Mo154}-Rings: (Dimethyldioctadecylammonium)20[Mo154O462H8(H2O)70]

Tomoyuki Akutagawa, Reina Jin, Ryo Tunashima, et al.
Langmuir 24 (1) 231 (2008)
https://doi.org/10.1021/la701364k

Interdiffusion in SiGe alloys with Ge contents of 25% and 50% studied by X‐ray reflectivity

M. Medunˇa, J. Novák, G. Bauer, C. V. Falub and D. Grützmacher
physica status solidi (a) 205 (10) 2441 (2008)
https://doi.org/10.1002/pssa.200824085

Structural and optical properties of three-dimensional Si1−xGex/Si nanostructures

D J Lockwood, J-M Baribeau, B V Kamenev, E-K Lee and L Tsybeskov
Semiconductor Science and Technology 23 (6) 064003 (2008)
https://doi.org/10.1088/0268-1242/23/6/064003

Ètude des interfaces SiO2/TiO2 et TiO2/SiO2 dans la structure SiO2/TiO2/SiO2/c-Si préparée par pulvérisation cathodique radio fréquence

K Hafidi, M Azizan, Y Ijdiyaou and E L Ameziane
Canadian Journal of Physics 85 (7) 763 (2007)
https://doi.org/10.1139/p07-053

Langmuir−Blodgett Films of a Mo-Blue Nanoring [Mo142O429H10(H2O)49(CH3CO2)5(CH3CH2CO2)]30- (Mo142) by the Semiamphiphilic Method

Miguel Clemente-León, Takeru Ito, Hisashi Yashiro, Toshihiro Yamase and Eugenio Coronado
Langmuir 23 (7) 4042 (2007)
https://doi.org/10.1021/la0635146

Two-Dimensional Array of Polyoxomolybdate Nanoball Constructed by Langmuir−Blodgett Semiamphiphilic Method

Miguel Clemente-León, Takeru Ito, Hisashi Yashiro and Toshihiro Yamase
Chemistry of Materials 19 (10) 2589 (2007)
https://doi.org/10.1021/cm070436e

Compositional Redistribution in Coherent ${\rm Si}_{1\hbox{-}x}{\rm Ge}_{ x}$ Islands on Si(100)

David J. Lockwood, Xiaohua Wu and Jean-Marc Baribeau
IEEE Transactions on Nanotechnology 6 (2) 245 (2007)
https://doi.org/10.1109/TNANO.2007.891818

Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering

A. Gibaud, S. Dourdain and G. Vignaud
Applied Surface Science 253 (1) 3 (2006)
https://doi.org/10.1016/j.apsusc.2006.05.121

Two-Dimensional Photoluminescence Behavior of Langmuir-Blodgett Monolayers and Multilayers Composed of Decatungstoeuropate

Takeru Ito, Hisashi Yashiro and Toshihiro Yamase
Journal of Cluster Science 17 (2) 375 (2006)
https://doi.org/10.1007/s10876-006-0060-2

Regular Two-Dimensional Molecular Array of Photoluminescent Anderson-type Polyoxometalate Constructed by Langmuir−Blodgett Technique

Takeru Ito, Hisashi Yashiro and Toshihiro Yamase
Langmuir 22 (6) 2806 (2006)
https://doi.org/10.1021/la052972w

Si/Si1 − x Gex Superlattice Structure from X-ray-Scattering Data

S. N. Yakunin, E. M. Pashaev, A. A. Zaitsev, et al.
Russian Microelectronics 34 (4) 242 (2005)
https://doi.org/10.1007/s11180-005-0034-3

Structural properties of sputter-deposited CNx/TiN multilayer films

Z.-J. Liu, A. Vyas, Y.H. Lu and Y.G. Shen
Thin Solid Films 479 (1-2) 31 (2005)
https://doi.org/10.1016/j.tsf.2004.11.106

High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods

M Meduna, J Novák, C V Falub, et al.
Journal of Physics D: Applied Physics 38 (10A) A121 (2005)
https://doi.org/10.1088/0022-3727/38/10A/023

Intersubband absorption of strain-compensated Si1−xGex valence-band quantum wells with 0.7⩽x⩽0.85

T. Fromherz, M. Meduňa, G. Bauer, et al.
Journal of Applied Physics 98 (4) (2005)
https://doi.org/10.1063/1.1997292

X-ray waveguides based on Bragg scattering of multilayers

I. R. Prudnikov
Physical Review B 67 (23) (2003)
https://doi.org/10.1103/PhysRevB.67.233303

Optical absorption in an amorphous silicon superlattice grown by molecular beam epitaxy

D.J. Lockwood, J.-M. Baribeau, M. Noël, et al.
Solid State Communications 122 (5) 271 (2002)
https://doi.org/10.1016/S0038-1098(02)00122-9

Amorphous Silicon Films and Superlattices Grown by Molecular Beam Epitaxy: An Optical Analysis

D. J. Lockwood, J.-M. Baribeau, M. Noël, et al.
MRS Proceedings 715 (2002)
https://doi.org/10.1557/PROC-715-A19.1

Wavelet transform approach to the analysis of specular x-ray reflectivity curves

I. R. Prudnikov, R. J. Matyi and R. D. Deslattes
Journal of Applied Physics 90 (7) 3338 (2001)
https://doi.org/10.1063/1.1399022

Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy

B.J Fogal, S.K O'Leary, D.J Lockwood, et al.
Solid State Communications 120 (11) 429 (2001)
https://doi.org/10.1016/S0038-1098(01)00422-7

X-Ray Reflectivity Study of the Structural Properties of SiO[sub 2] and SiOF Thin Films

Giulio Ceriola, Fabio Iacona, Francesco La Via, et al.
Journal of The Electrochemical Society 148 (12) F221 (2001)
https://doi.org/10.1149/1.1417557

X-ray reflectivity spectra of ultrathin films and nanometric multilayers: Experiment and simulation

E. Bontempi, L. E. Depero, L. Sangaletti, F. Giorgis and C. F. Pirri
Journal of Materials Research 16 (9) 2556 (2001)
https://doi.org/10.1557/JMR.2001.0350

Encyclopedia of Materials: Science and Technology

P.N. Gibson
Encyclopedia of Materials: Science and Technology 9229 (2001)
https://doi.org/10.1016/B0-08-043152-6/01663-6

Optical dispersion relationships in amorphous silicon grown by molecular beam epitaxy

S.K. O'Leary, B.J. Fogal, D.J. Lockwood, et al.
Journal of Non-Crystalline Solids 290 (1) 57 (2001)
https://doi.org/10.1016/S0022-3093(01)00728-1

X-ray reflectivity and glancing-incidence diffraction from thin metallic Cr layers

Elza Bontempi, Laura E. Depero and Luigi Sanagaletti
Philosophical Magazine B 80 (4) 623 (2000)
https://doi.org/10.1080/13642810008209770

Molecular Beam Epitaxially Deposited Amorphous Silicon

D. J. Lockwood, J.-M. Baribeau, M. Noël, et al.
MRS Proceedings 609 (2000)
https://doi.org/10.1557/PROC-609-A5.1

Growth process analysis of a-Si1−xNx:H films probed by X-ray reflectivity

E Bontempi, L.E Depero, L Sangaletti, F Giorgis and C.F Pirri
Materials Chemistry and Physics 66 (2-3) 172 (2000)
https://doi.org/10.1016/S0254-0584(00)00338-2

Review on grazing incidence X-ray spectrometry and reflectometry

Krassimir N. Stoev and Kenji Sakurai
Spectrochimica Acta Part B: Atomic Spectroscopy 54 (1) 41 (1999)
https://doi.org/10.1016/S0584-8547(98)00160-8

X-ray and Neuron Reflectivity: Principles and Applications

Tilo Baumbach and Petr Mikulik
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 232 (1999)
https://doi.org/10.1007/3-540-48696-8_8

High-Resolution X-Ray Scattering from Thin Films and Multilayers

Springer Tracts in Modern Physics, High-Resolution X-Ray Scattering from Thin Films and Multilayers 149 221 (1999)
https://doi.org/10.1007/BFb0109396

X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering

P. Mikulík and T. Baumbach
Physical Review B 59 (11) 7632 (1999)
https://doi.org/10.1103/PhysRevB.59.7632

X-ray and Neuron Reflectivity: Principles and Applications

Jean Daillant and Anne Sentenac
Lecture Notes in Physics Monographs, X-ray and Neuron Reflectivity: Principles and Applications 58 121 (1999)
https://doi.org/10.1007/3-540-48696-8_4

X-ray scattering analysis of interface roughness and diffusion

J.-M. Baribeau
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 16 (3) 1568 (1998)
https://doi.org/10.1116/1.589941

Structural, magnetotransport, and optical properties of sputtered Co/Cu multilayers examined as a function of Co layer thickness at the second antiferromagnetic maximum

C. Christides, S. Logothetidis, M. Gioti, S. Stergioudis, S. Stavroyiannis and D. Niarchos
Journal of Applied Physics 83 (12) 7757 (1998)
https://doi.org/10.1063/1.367950

Amorphous Si/insulator multilayers grown by vacuum deposition and electron cyclotron resonance plasma treatment

J.-M Baribeau, D.J Lockwood, Z.H Lu, et al.
Journal of Luminescence 80 (1-4) 417 (1998)
https://doi.org/10.1016/S0022-2313(98)00140-9

X-ray diffuse scattering by multilayer waveguide structures

A. V. Andreev, Yu. V. Ponomarev, I. R. Prudnikov and N. N. Salashchenko
Physical Review B 57 (20) 13113 (1998)
https://doi.org/10.1103/PhysRevB.57.13113

X-Ray scattering investigation of the interfaces in Si/Si1−xGex superlattices on Si(001) grown by MBE and UHV-CVD

J.-M Baribeau and H Lafontaine
Thin Solid Films 321 (1-2) 141 (1998)
https://doi.org/10.1016/S0040-6090(98)00463-5

Glancing incidence X-ray analysis: more than just reflectivity!

A.J.G Leenaers, J.J.A.M Vrakking and D.K.G de Boer
Spectrochimica Acta Part B: Atomic Spectroscopy 52 (7) 805 (1997)
https://doi.org/10.1016/S0584-8547(96)01651-5

Characterization for morphology of thin deposited Fe, Fe2O3 and Cr2O3 films on silicon wafer using grazing incidence X-ray scattering

T Kosaka, S Suzuki, M Saito, et al.
Thin Solid Films 289 (1-2) 74 (1996)
https://doi.org/10.1016/S0040-6090(96)08922-5

Interfaces in Si/Ge atomic layer superlattices on (001)Si: Effect of growth temperature and wafer misorientation

J.-M. Baribeau, D. J. Lockwood and R. W. G. Syme
Journal of Applied Physics 80 (3) 1450 (1996)
https://doi.org/10.1063/1.363013

Visible light emitting superlattices

Z.H. Lu, D.J. Lockwood and J.-M. Baribeau
Solid-State Electronics 40 (1-8) 197 (1996)
https://doi.org/10.1016/0038-1101(95)00245-6

Atomic Hydrogen Assisted Growth of Si-Ge Heterostructures on (001) Si

J.-M. Baribeau, D.J. Lockwood, S.J. Rolfe, R.W.G. Syme and H.J. Labbé
MRS Proceedings 448 (1996)
https://doi.org/10.1557/PROC-448-113

Theory of X-ray scattering by rough surfaces without distorted wave approximation

A.V. Andreev
Physics Letters A 219 (5-6) 349 (1996)
https://doi.org/10.1016/0375-9601(96)00469-0

X-ray reflectivity: a new tool for the study of glass surfaces

J.M. Grimal, P. Chartier and P. Lehuédé
Journal of Non-Crystalline Solids 196 128 (1996)
https://doi.org/10.1016/0022-3093(95)00564-1

Nature and evolution of interfaces in Si/Si1-xGex superlattices

J. M. Baribeau, D. J. Lockwood and R. L. Headrick
Journal of Electronic Materials 24 (4) 341 (1995)
https://doi.org/10.1007/BF02659697

Residual stress/strain analysis in thin films by X-ray diffraction

I. C. Noyan, T. C. Huang and B. R. York
Critical Reviews in Solid State and Materials Sciences 20 (2) 125 (1995)
https://doi.org/10.1080/10408439508243733

The formation of sputtered Ta/a-Si and a-Si/Ta interfaces in a-Si/Ta/a-Si/c-Si structure

Y. Ijdiyaou, K. Hafidi, M. Azizan, et al.
Thin Solid Films 266 (2) 224 (1995)
https://doi.org/10.1016/0040-6090(95)06643-8

Fabrication and Structural and Optical Properties of Amorphous Si/SiO2 Superlattices on (100) Si

J.-M. Baribeau, D.J. Lockwood and Z.-H. Lu
MRS Proceedings 382 (1995)
https://doi.org/10.1557/PROC-382-259

X-ray reflection and transmission by rough surfaces

D. K. G. de Boer
Physical Review B 51 (8) 5297 (1995)
https://doi.org/10.1103/PhysRevB.51.5297

Glancing‐incidence x‐ray analysis of thin‐layered materials: A review

D. K. G. de Boer, A. J. G. Leenaers and W. W. van den Hoogenhof
X-Ray Spectrometry 24 (3) 91 (1995)
https://doi.org/10.1002/xrs.1300240304

Interfacial-roughness effects on giant magnetoresistance and interlayer coupling in Co/Cu superlattices

Z. J. Yang and M. R. Scheinfein
Physical Review B 52 (6) 4263 (1995)
https://doi.org/10.1103/PhysRevB.52.4263

Scanning tunneling microscopy characterization of the morphology of Fe/C multilayers grown on silicon substrates

L. Vázquez, J. M. Vara and E. Ziegler
Journal of Applied Physics 75 (1) 248 (1994)
https://doi.org/10.1063/1.355891

Influence of the roughness profile on the specular reflectivity of x rays and neutrons

D. K. G. de Boer
Physical Review B 49 (9) 5817 (1994)
https://doi.org/10.1103/PhysRevB.49.5817

The role of surfaces and interfaces in the behaviour of non-polarizing and polarizing supermirrors

O. Schärpf and I.S. Anderson
Physica B: Condensed Matter 198 (1-3) 203 (1994)
https://doi.org/10.1016/0921-4526(94)90161-9

Characterization of TiNxOy thin films on architectural glass by X-ray reflection and spectrophotometry

P. Polato, H. Franz, F. Rustichelli, M. Montecchi and A. Piegari
Thin Solid Films 248 (2) 184 (1994)
https://doi.org/10.1016/0040-6090(94)90009-4

Structure, Morphology and Evolution of Interfaces in Si/Si1-ϰGeϰ Superlattices

J.-M. Baribeau, D. J. Lockwood and R. L. Headrick
MRS Proceedings 355 (1994)
https://doi.org/10.1557/PROC-355-9

Investigation of some physical properties of thin films by x-ray reflectivity

J J Benattar and A Schalchli
Physica Scripta 50 (2) 188 (1994)
https://doi.org/10.1088/0031-8949/50/2/016

Investigation of Si-Ge heterostructures by X-ray reflectometry

J -M Baribeau
Journal of Physics D: Applied Physics 26 (4A) A156 (1993)
https://doi.org/10.1088/0022-3727/26/4A/033

REX — a least-squares fitting program for the simulation and analysis of X-ray reflectivity data

T.A. Crabb, P.N. Gibson and K.J. Roberts
Computer Physics Communications 77 (3) 441 (1993)
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Oxidation state of a buried interface: Near-edge x-ray fine structure of a crystal truncation rod

E. D. Specht and F. J. Walker
Physical Review B 47 (20) 13743 (1993)
https://doi.org/10.1103/PhysRevB.47.13743

Glancing-incidence X-ray analysis

W.W. Van Den Hoogenhof and D.K.G. De Boer
Spectrochimica Acta Part B: Atomic Spectroscopy 48 (2) 277 (1993)
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Étude des couches minces et des surfaces par réflexion rasante, spéculaire ou diffuse, de rayons X

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