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Simulation Study of the Instability Induced by the Variation of Grain Boundary Width and Trap Density in Gate-All-Around Polysilicon Transistor

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IEEE Transactions on Electron Devices 68 (4) 1969 (2021)
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Experimental and theoretical overview on bias dependent Debye relaxation and conduction mechanism of Cd 1-x Zn x S film and its significance in signal transport network

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