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Cited article:

A Semi-Classical Model for Simulating Inversion Carrier Transport in Si MOS Devices

Chu Hao, J. Zimmermann, M. Charef, R. Fauquembergue and E. Constant
Physica Status Solidi (a) 81 (2) 569 (1984)
https://doi.org/10.1002/pssa.2210810220