Improvement of electron diffusion lengths in polycrystalline silicon wafers by aluminium S. Martinuzzi, H. Poitevin, M. Zehaf et C. ZurlettoRev. Phys. Appl. (Paris), 22 7 (1987) 645-648DOI: https://doi.org/10.1051/rphysap:01987002207064500
