| Numéro |
Rev. Phys. Appl. (Paris)
Volume 10, Numéro 3, mai 1975
|
|
|---|---|---|
| Page(s) | 177 - 178 | |
| DOI | https://doi.org/10.1051/rphysap:01975001003017700 | |
Rev. Phys. Appl. (Paris) 10, 177-178 (1975)
DOI: 10.1051/rphysap:01975001003017700
Istituto di Fisica, Università di Cagliari, Italie
0720M - Cryogenics.
0720 - Thermal instruments and techniques.
0750 - Electrical instruments and techniques.
6670 - Nonelectronic thermal conduction and heat pulse propagation in nonmetallic solids.
7220P - Thermoelectric effects semiconductors/insulators.
Key words
crystals -- electrical conductivity of solid semiconductors and insulators -- thermal conductivity of solids -- thermoelectricity -- thermoelectric figure of merit -- semiconductors -- thermoelectric properties
DOI: 10.1051/rphysap:01975001003017700
A new method of measuring the thermoelectric figure of merit
G. Pegna et A. CongiuIstituto di Fisica, Università di Cagliari, Italie
Abstract
A new experimental method for the determination of the figure of merit of semiconductors is described. This method allows a fast classification of the thermoelectric properties of new materials.
Résumé
On décrit ici une nouvelle méthode expérimentale pour la détermination de la figure de mérite des solides semiconducteurs. Cette méthode permit une rapide classification des propriétés thermo-électriques des nouveaux matériaux.
0720M - Cryogenics.
0720 - Thermal instruments and techniques.
0750 - Electrical instruments and techniques.
6670 - Nonelectronic thermal conduction and heat pulse propagation in nonmetallic solids.
7220P - Thermoelectric effects semiconductors/insulators.
Key words
crystals -- electrical conductivity of solid semiconductors and insulators -- thermal conductivity of solids -- thermoelectricity -- thermoelectric figure of merit -- semiconductors -- thermoelectric properties