Analysis of boundary conditions and transient signal treatment in diffusivity measurements by laser pulse method p. 1 L. Pawlowski, P. Fauchais and C. Martin DOI: https://doi.org/10.1051/rphysap:019850020010100 AbstractPDF (1.503 MB)References
Interaction onde électromagnétique/flux de porteurs dans une structure mixte ferrite-semiconducteur p. 13 M. Baribaud and D. Rauly DOI: https://doi.org/10.1051/rphysap:0198500200101300 AbstractPDF (1.329 MB)References
Intégration d'un processeur cellulaire pour une architecture pyramidale de traitement d'image p. 23 F. Devos, A. Mérigot and B. Zavidovique DOI: https://doi.org/10.1051/rphysap:0198500200102300 AbstractPDF (792.6 KB)References
Defects left after regrowth of amorphous silicon on crystalline Si : C (V) and DLTS studies p. 29 J. Castaing and T. Cass DOI: https://doi.org/10.1051/rphysap:0198500200102900 AbstractPDF (1.132 MB)References
Electronic properties of Al-SiO2-(n or p) Si MIS tunnel diodes p. 37 J. Vuillod and G. Pananakakis DOI: https://doi.org/10.1051/rphysap:0198500200103700 AbstractPDF (1.118 MB)References
High pressure sensor for low temperature use p. 45 D. Fabre and M. M. Thiéry DOI: https://doi.org/10.1051/rphysap:0198500200104500 AbstractPDF (463.2 KB)References
