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Cited article:

Méthodes physiques de détermination des imperfections dans les couches hétéroépitaxiques de silicium sur substrat alumine-α

J. Mercier

Rev. Phys. Appl. (Paris), 4 3 (1969) 345-351

DOI: https://doi.org/10.1051/rphysap:0196900403034500

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References

This article has been cited by the following article(s):

Zur Herstellung und Untersuchung einkristalliner isolierender Substrate für mikroelektronische Zwecke

J. Herberger, F. Richter, H. Leistner and W. Prescher
Kristall und Technik 8 (12) 1439 (1973)
https://doi.org/10.1002/crat.19730081212