Rev. Phys. Appl. (Paris)
Volume 11, Numéro 1, janvier 1976
Page(s) 73 - 81
Rev. Phys. Appl. (Paris) 11, 73-81 (1976)
DOI: 10.1051/rphysap:0197600110107300

Application of X-ray diffuse scattering to structure determinations of point-defects

H.-G. Haubold

Institut für Festkörperforschung der Kernforschungsanlage Jülich 517 Jülich, Germany

A review is given on the use of diffuse X-ray scattering for the determination of point defect structures in crystalline solids. Diffuse scattering yields a direct method for obtaining detailed information on the displacement fields both near to and far away from the defects in addition to information on the particular position of the defect. Theoretical models involving the use of lattice statics can be used to evaluate measurements carried out with the aid of new, high power X-ray generators and multiple detector systems. Through the study of diffuse scattering between and close to Bragg reflections single defects such as interstitials and vacancies up to large point defect agglomerates that are visible in the electron microscope can be investigated.

6172J - Point defects (vacancies, interstitials, color centers, etc.) and defect clusters.
6172D - Experimental determination of defects by diffraction and scattering.

Key words
X-ray scattering -- Diffuse scattering -- Defect structure -- Point defects -- Vacancies -- Interstitials -- Defect clusters -- Investigation method -- Bragg reflection -- Experimental study