| Numéro |
Rev. Phys. Appl. (Paris)
Volume 23, Numéro 4, avril 1988
|
|
|---|---|---|
| Page(s) | 696 - 696 | |
| DOI | https://doi.org/10.1051/rphysap:01988002304069600 | |
Rev. Phys. Appl. (Paris) 23, 696-696 (1988)
DOI: 10.1051/rphysap:01988002304069600
LPMTM, Université PARIS-NORD - Av. J.B. Clément 93430 - VILLETANEUSE
PACS
6170P - Stacking faults, stacking fault tetrahedra and other planar or extended defects.
Key words
copper -- crystallographic shear -- plasticity -- shear bands -- single crystals -- polycrystals -- rolling -- tensile load
DOI: 10.1051/rphysap:01988002304069600
Crystallographical analysis of shear bands initiation and propagation in pure metals
Ph. Dubois et C. ReyLPMTM, Université PARIS-NORD - Av. J.B. Clément 93430 - VILLETANEUSE
Without abstract
PACS
6170P - Stacking faults, stacking fault tetrahedra and other planar or extended defects.
Key words
copper -- crystallographic shear -- plasticity -- shear bands -- single crystals -- polycrystals -- rolling -- tensile load
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