| Numéro |
Rev. Phys. Appl. (Paris)
Volume 22, Numéro 7, juillet 1987
|
|
|---|---|---|
| Page(s) | 511 - 511 | |
| DOI | https://doi.org/10.1051/rphysap:01987002207051100 | |
Rev. Phys. Appl. (Paris) 22, 511-511 (1987)
DOI: 10.1051/rphysap:01987002207051100
PACS
7240 - Photoconduction and photovoltaic effects.
Key words
Experimental study -- Crystallization -- Polycrystal -- Bicrystal -- Grain boundary -- Defect level -- Electrical properties -- Impurity -- Passivation -- Semiconductor materials -- Solar cell -- Photovoltaic effect -- Transmission electron microscopy -- Microstructure -- Deep level transient spectrometry -- Silicon -- Condensed matter physics -- Materials science -- Physics
DOI: 10.1051/rphysap:01987002207051100
Silicium polycristallin
Bernard Equer, Pierre Pinard, André Rocher et Michel RodotWithout abstract
PACS
7240 - Photoconduction and photovoltaic effects.
Key words
Experimental study -- Crystallization -- Polycrystal -- Bicrystal -- Grain boundary -- Defect level -- Electrical properties -- Impurity -- Passivation -- Semiconductor materials -- Solar cell -- Photovoltaic effect -- Transmission electron microscopy -- Microstructure -- Deep level transient spectrometry -- Silicon -- Condensed matter physics -- Materials science -- Physics
Première page de l'article
